ULTRA-PRECISION MACHINE AND DRIVE SYSTEMHASHIMOTO H.1982; BULL. JPN. SOC. PRECIS. ENG.; ISSN 0582-4206; JPN; DA. 1982; VOL. 16; NO 1; PP. 57-62; 7 P.; BIBL. 12 REF.Article

LSI AND COMMUNICATIONSREED P.1980; NEW ELECTRON.; ISSN 0047-9624; GBR; DA. 1980; VOL. 13; NO 22; PP. 42-50; 4 P.Article

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LOGICAL ENVIRONMENT COMPARISON TESTING HANDLES COMPLEX LSI DEVICESBLUESTONE A.1979; COMPUTER DESIGN; USA; DA. 1979; VOL. 18; NO 4; PP. 95-102; BIBL. 2 REF.Article

LSI COMPONENT TESTING: PROBLEMS UND SOLUTIONSLENNE W.1979; NEW ELECTRON.; GBR; DA. 1979; VOL. 12; NO 1; PP. 26-31; (3 P.)Article

INTELLIGENT STRATEGY WITH DISTRIBUTED DATABASE FOR HIGH-VOLUME LSI TESTINGCHI CS.1978; I.E.E.E. TRANS. INSTRUMENT. MEASUR.; USA; DA. 1978; VOL. 27; NO 2; PP. 172-178; BIBL. 12 REF.Article

SOME ACHIEVEMENTS IN POWER IC TECHNOLOGY.1978; AUSTRAL. ELECTRON. ENGNG; AUS; DA. 1978; VOL. 11; NO 8; PP. 60-64; (4 P.)Article

ADVANCED MASK TECHNOLOGY FOR SMALL DEVICES IN LSI CIRCUITS.PIRCHER G.1976; IN: SOLID STATE DEVICES. EUR. RES. CONF. 5; GRENOBLE; 1975; PARIS; J. PHYS.; DA. 1976; PP. 31-72; ABS. FR.; BIBL. 1 P. 1/2Conference Paper

LSI-TEST-SCHON BEIM IC-DESIGN BERUECKSICHTIGT = LE CONTROLE DES CIRCUITS A HAUTE INTEGRATION ENVISAGE DES LA CONCEPTION DES CIRCUITS INTEGRESPAINKE H.1980; ELEKTRONIK (MUENCH.); ISSN 0013-5658; DEU; DA. 1980; VOL. 29; NO 26; PP. 69-74; BIBL. 3 REF.Article

NEEDED: A MIRACLE SLICE FOR VLSI FABRICATIONHEILMEIER GH.1979; I.E.E.E. SPECTRUM; USA; DA. 1979; VOL. 16; NO 3; PP. 45Article

COMPRENDRE LES MICROPROCESSEURS.QUEYSSAC D.1976; MESURES REGUL. AUTOMAT.; FR.; DA. 1976; VOL. 41; NO 9; PP. 29-35Article

NEW AIRBORNE WEATHER RADAR SYSTEMSLUCCHI GA.1982; J. AIRCR.; ISSN 0021-8669; USA; DA. 1982; VOL. 19; NO 3; PP. 239-245; BIBL. 2 REF.Article

IN-CIRCUIT TESTING OF LSI COMPONENTSHUGHES J; BARNETT B.1981; ELECTRON. PACKAG. PROD.; ISSN 0013-4945; USA; DA. 1981; VOL. 21; NO 2; PP. 79-88; 7 P.Article

MANAGEMENT INFORMATION SYSTEMS STRUCTURE TYPES AND INTEGRATIONBARROS O.1981; INFORMATION SYSTEMS; ISSN 0306-4379; GBR; DA. 1981; VOL. 6; NO 4; PP. 243-254; BIBL. 28 REF.Article

GROWTH IN APPLICATION OF CHIP CARRIERSBAUER JA; KOLC RF.1980; ELECTRON. PACKAG. PRODUCT.; USA; DA. 1980; VOL. 20; NO 5; PP. 51-59; H.T. 4Article

IIL GATE ARRAYS MAKE CUSTOM ICS ECONOMICALLY FEASIBLEO'NEIL WD.1979; COMPUTER DESIGN; USA; DA. 1979; VOL. 18; NO 9; PP. 168-174; (4 P.)Article

PACKAGE AND SOCKET CONSIDERATIONS FOR LSI DEVICESWILLIAMS D; WEAVER B.1979; INSULAT. CIRCUITS; USA; DA. 1979; VOL. 25; NO 6; PP. 43-46Article

LSI-SCHALTKREISE UND IHRE ANWENDUNG IN DISPLAYS = LES CIRCUITS A HAUTE INTEGRATION DANS LES DISPOSITIFS D'AFFICHAGEHORWATH H.1979; NACHR.-TECH., ELEKTRON.; DDR; DA. 1979; VOL. 29; NO 6; PP. 258-261Article

DEDICATED MULTIPLIER ICS SPEED-UP PROCESSING IN FAST COMPUTER SYSTEMSWASER S.1978; ELECTRON. DESIGN; USA; DA. 1978; VOL. 26; NO 19; PP. 98-103; BIBL. 2 REF.Article

AN ANNOTATED BIBLIOGRAPHY ON THRESHOLD LOGIC.SRIVATSA SK; BISWAS NN.1977; J. INDIAN INST. SCI.; INDIA; DA. 1977; VOL. 59; NO 1; PP. 1-28; BIBL. 15 P. 1/2Article

ENGINEERING RELIABILITY MANAGEMENTDHILLON BS.1983; MICROELECTRONICS AND RELIABILITY; ISSN 0026-2714; GBR; DA. 1983; VOL. 23; NO 2; PP. 215-234; BIBL. 103 REF.Article

ULTRA-PRECISION SURFACE GRINDER SUSPENDED BY EXTERNALLY PRESSURIZED AIR BEARINGSKATO S.1982; BULL. JPN. SOC. PRECIS. ENG.; ISSN 0582-4206; JPN; DA. 1982; VOL. 16; NO 1; PP. 51-56; BIBL. 1 REF.Article

A THREE STAGE APPROACH TO LSI BOARD TESTING. IBRADLEY RS.1981; ELECTRON. ENG.; ISSN 0013-4902; GBR; DA. 1981; VOL. 53; NO 651; PP. 83-91; 6 P.Article

THREE LSI CIRCUITS SIMPLIFY DIGITAL-SWITCHING SYSTEMSWURZBURG H; KELLEY S.1980; ELECTRON. DES.; ISSN 0013-4872; USA; DA. 1980; VOL. 28; NO 22; PP. 163-171Article

CLOCK-RATE TESTING OF LSI BOARDS: A "SHOTGUN" APPROACH TO LOCATING POORLY UNDERSTOOD FAILURESSULMAN DL.1979; CIRCUITS MANUF.; USA; DA. 1979; VOL. 19; NO 5; PP. 58-68; (6 P.)Article