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Feedforward Control of Piezoactuators in Atomic Force Microscope SystemsLEANG, Kam K; QINGZE ZOU; DEVASIA, Santosh et al.IEEE control systems. 2009, Vol 29, Num 1, pp 70-82, issn 1066-033X, 13 p.Article

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Force microscopy utilizing tunnel junction controlKIM, H. S; BRYANT, P. J.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1992, Vol 10, Num 4, pp 641-644, issn 0734-2101, 1Conference Paper

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Ternary and senary representations using DNA double-crossover tilesBYEONGHOON KIM; SOOJIN JO; SUNG HA PARK et al.Nanotechnology (Bristol. Print). 2014, Vol 25, Num 10, issn 0957-4484, 105601.1-105601.5Article

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Atomic force microscopyTENDLER, Saul J. B; WILLIAMS, Philip M.Analytica chimica acta. 2003, Vol 479, Num 1, issn 0003-2670, 117 p.Serial Issue

Early detection of cytotoxic events between hepatic natural killer cells and colon carcinoma cells as probed with the atomic force microscopeBRAET, F; VERMIJLEN, D; BOSSUYT, V et al.Ultramicroscopy. 2001, Vol 89, Num 4, pp 265-273, issn 0304-3991Article

Scanned-cantilever atomic force microscopeBASELT, D. R; BALDESCHWIELER, J. D.Review of scientific instruments. 1993, Vol 64, Num 4, pp 908-911, issn 0034-6748Article