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THE FABRICATION OF VERY NARROW SELF-ALIGNED GUARD RINGS AROUND SCHOTTKY-BARRIER DIODESLEVIN RM; KOENEKE CJ.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 3; PP. 247-249; BIBL. 8 REF.Article

THEORETICAL CONTRIBUTION TO THE DESIGN OF MILLIMETER-WAVE TEO'SFRISCOURT MR; ROLLAND PA; CAPPY A et al.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 3; PP. 223-229; BIBL. 29 REF.Article

A HIGH LUMINANCE HIGH-RESOLUTION CATHODE-RAY TUBE FOR SPECIAL PURPOSESVAN TOL MW; VAN ESDONK J.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 3; PP. 193-197; BIBL. 10 REF.Article

ENERGY BARRIER HEIGHT VARIATIONS OF PD-SI SCHOTTKY DIODES INDUCED BY DEUTERIUMDILIGENTI A; STAGI M; CIUTI V et al.1983; ELECTRON DEVICE LETTERS; ISSN 0193-8576; USA; DA. 1983; VOL. 4; NO 4; PP. 73-75; BIBL. 10 REF.Article

DETECTEURS PHOTOVOLTAIQUES AU SILICIUMO'BRIEN J; DANAHY E; SHUMAN A et al.1983; SPECTRA 2000; ISSN 0399-1172; FRA; DA. 1983; VOL. 11; NO 84; PP. 25-32Article

An explicit six-port calibration method using five standardsHUNTER, J. D; SOMLO, P. I.IEEE transactions on microwave theory and techniques. 1985, Vol 33, Num 1, pp 69-72, issn 0018-9480Article

Optimal use of redundant information in multiport reflectometers by statistical methodsHERSCHER, B. A; CARROLL, J. E.IEE proceedings. Part H. Microwaves, optics and antennas. 1984, Vol 131, Num 1, pp 25-30, issn 0143-7097Article

Relevance of complex normalisation in precision reflectometryWOODS, D.Electronics Letters. 1983, Vol 19, Num 15, pp 596-598, issn 0013-5194Article

The six-port reflectometer and its complete calibration by four standard terminationsGHANNOUCHI, F. M; BOSISIO, R. G.IEE proceedings. Part H. Microwaves, antennas and propagation. 1988, Vol 135, Num 4, pp 285-288, issn 0950-107XArticle

Seven-port millimetre-wave reflectometerCULLEN, A. L; BELFORT, A. J.Electronics Letters. 1985, Vol 21, Num 3, pp 120-121, issn 0013-5194Article

THE MEASUREMENT OF COMPLEX REFLECTION COEFFICIENT BY MEANS OF A FIVE-PORT REFLECTOMETERSHIHE LI; BOSISIO RG.1983; IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES; ISSN 0018-9480; USA; DA. 1983; VOL. 31; NO 4; PP. 321-326; BIBL. 11 REF.Article

Cell design for low-temperature time-domain reflectance measurementsBERBERIAN, J. G; COLE, R. H.Review of scientific instruments. 1992, Vol 63, Num 1, pp 99-103, issn 0034-6748Conference Paper

Simple derivation of six-port reflectometer equationsHUNTER, J. D; SOMLO, P. I.Electronics Letters. 1985, Vol 21, Num 9, pp 370-371, issn 0013-5194Article

Calibration of the six-port reflectometer using a minimum number of known loadsBIALKOWSKI, M. E; WOODS, G. S.AEU. Archiv für Elektronik und Übertragungstechnik. 1985, Vol 39, Num 5, pp 332-338, issn 0001-1096Article

A QUASI-OPTICAL NULLING METHOD FOR MATERIAL BIREFRINGENCE MEASUREMENTS AT NEAR-MILLIMETER WAVELENGTHSSIMONIS GJ.1983; IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES; ISSN 0018-9480; USA; DA. 1983; VOL. 31; NO 4; PP. 356-358; BIBL. 11 REF.Article

Experimental study of a swept reflectometer with a single antenna for plasma density profile measurementCALDERON, M. A. G; SIMONET, F.International journal of infrared and millimeter waves. 1985, Vol 6, Num 7, pp 605-628, issn 0195-9271Article

Calibration of a six-port reflectometer using projective geometry conceptsSUSMAN, L.Electronics Letters. 1984, Vol 20, Num 1, pp 9-11, issn 0013-5194Article

An alternative explicit six-port matrix calibration formalism using five standardsGHANNOUCHI, F. M; BOSISIO, R. G.IEEE transactions on microwave theory and techniques. 1988, Vol 36, Num 3, pp 494-498, issn 0018-9480Article

Entwicklundstendenzen der Betriebsanalysentechnik = Trends of development of in-plant analysis technologyFRECH, T.Automatisierungstechnische Praxis. 1990, Vol 32, Num 7, pp 338-342, issn 0178-2320, 5 p.Article

Accurate six-port operation with uncalibrated nonlinear diodesSOMLO, P. L; HUNTER, J. D; ARTHUR, D. C et al.IEEE transactions on microwave theory and techniques. 1985, Vol 33, Num 3, pp 281-282, issn 0018-9480Article

Microwave network analyser incorporating a single six-port reflectometerBIALKOWSKI, M. E.AEU. Archiv für Elektronik und Übertragungstechnik. 1986, Vol 40, Num 3, pp 197-199, issn 0001-1096Article

Six port reflectometer for the 75-105 GHz bandHILL, L. D.IEE proceedings. Part H. Microwaves, optics and antennas. 1985, Vol 132, Num 2, pp 141-143, issn 0143-7097Article

New application of a single six-port reflectometerSUN JIA.Electronics Letters. 1984, Vol 20, Num 22, pp 920-922, issn 0013-5194Article

Theory of symmetrical five-port junctionYEO, S. P; CULLEN, A. L.Electronics Letters. 1984, Vol 20, Num 1, pp 38-39, issn 0013-5194Article