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Robust palmprint verification using 2D and 3D featuresZHANG, David; KANHANGAD, Vivek; NAN LUO et al.Pattern recognition. 2010, Vol 43, Num 1, pp 358-368, issn 0031-3203, 11 p.Article

A coarse-to-fine framework to efficiently thwart plagiarismHAIJUN ZHANG; CHOW, Tommy W. S.Pattern recognition. 2011, Vol 44, Num 2, pp 471-487, issn 0031-3203, 17 p.Article

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