RELAXATION NON LINEAIRE DE LA PERMITTIVITE COMPLEXE D'UNE PIEZO-CERAMIQUE POLARISEE A COMPRESSION UNIAXESENCHENKOV IK; ANISIMOV VI; YAKOVLEV GA et al.1982; PRIKL. MEH. (KIEV); ISSN 0032-8243; UKR; DA. 1982; VOL. 18; NO 3; PP. 60-64; BIBL. 11 REF.Article

FEASIBILITY STUDY OF DENSITY-INDEPENDENT MOISTURE MEASUREMENT WITH MICROWAVESMEYER W; SCHILZ WM.1981; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1981; VOL. 29; NO 7; PP. 732-739; BIBL. 16 REF.Article

MICROWAVE MEASUREMENTS AND MODELLING OF THE PERMITTIVITY OF TROPICAL VEGETATION SAMPLESTAN HS.1981; APPL. PHYS.; ISSN 0340-3793; DEU; DA. 1981; VOL. 25; NO 3; PP. 351-355; BIBL. 13 REF.Article

COMPOSITE HOLE CONDITIONS ON COMPLEX PERMITTIVITY MEASUREMENTS USING MICROWAVE CAVITY PERTURBATION TECHNIQUESSHINE LI; BOSISIO RG.1982; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 1; PP. 100-103; BIBL. 8 REF.Article

IMPROVED ACCURACY FOR DIELECTRIC DATAPALAITH DE; CHANG SK.1983; JOURNAL OF PHYSICS E: SCIENTIFIC INSTRUMENTS; ISSN 0022-3735; GBR; DA. 1983; VOL. 16; NO 3; PP. 227-230; BIBL. 8 REF.Article

BESTIMMUNG DER KOMPLEXEN DIELEKTRIZITAETSKONSTANTEN IM MIKROWELLENGEBIET AUF QUASIOPTISCHEM WEGE. ZUR THEORETISCHEN KONZEPTION EINER NUEN MESSMETHODE = DETERMINATION DE LA CONSTANTE DIELECTRIQUE COMPLEXE DANS LA REGION MICROONDE PAR UNE METHODE QUASIOPTIQUE. CONCEPTION THEORIQUE D'UNE NOUVELLE METHODE DE MESUREGRUBER H.1981; EXPERIMENTELLE TECHNIK DER PHYSIK; ISSN 0014-4924; DDR; DA. 1981; VOL. 29; NO 5; PP. 497-511; ABS. ENG; BIBL. 25 REF.Article

PERMITTIVITY MEASUREMENTS OF LOSSY LIQUIDS AT MILLIMETER-WAVE FREQUENCIESZANFORLIN L.1983; IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES; ISSN 0018-9480; USA; DA. 1983; VOL. 31; NO 5; PP. 417-419; BIBL. 6 REF.Article

AN ALGORITHM FOR USE IN THE SOLUTION OF THE ROBERTS-HIPPEL RELATIONSHIPFREUNDLICH P; KOLODZIEJ HA.1982; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1982; VOL. 15; NO 9; PP. 897-899; BIBL. 5 REF.Article

HIGH FREQUENCY DIELECTRIC DATA ON SELECTED MOIST MATERIALSMEYER W; SCHILZ W.1982; J. MICROWAVE POWER; ISSN 0022-2739; CAN; DA. 1982; VOL. 17; NO 1; PP. 67-81; BIBL. 25 REF.Article

COMMENT ON THE COMPLEX-DIELECTRIC CONSTANT OF SEA ICE AT FREQUENCIES IN THE RANGE 0.1-40 GHZFARRELLY BA.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 2; PP. 1256-1257; BIBL. 2 REF.Article

CAN VELOCITY OVERSHOOT OR BALLISTIC TRANSPORT BE EFFICIENT IN SUBMICRON DEVICES1982; MICROELECTRONICS; ISSN 0026-2692; GBR; DA. 1982; VOL. 13; NO 6; PP. 18-22; BIBL. 7 REF.Article

INSTALLATION POUR L'ETUDE DES PROPRIETES DIELECTRIQUES DES GAZSHOTAPOV AA; METSNER EP.1982; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1982; NO 5; PP. 192-196; BIBL. 10 REF.Article

CONTRIBUTION A LA MESURE, EN HYPERFREQUENCE, DE PERMITTIVITES DE MATERIAUX DIELECTRIQUES = CONTRIBUTION TO THE MEASUREMENT IN HYPERFREQUENCY, OF PERMITTIVITIES OF DIELECTRIC MATERIALSBELKACEMI SLIMANE.1981; ; FRA; DA. 1981; 134 P.; 30 CM; BIBL. 26 REF.; TH. DOCT.-ING./TOULOUSE, I.N.P./1981/175Thesis

RIGOROUS BOUNDS FOR THE COMPLEX DIELECTRIC CONSTANT OF A TWO-COMPONENT COMPOSITEBERGMAN DJ.1982; ANN. PHYS.; ISSN 0003-4916; USA; DA. 1982; VOL. 138; NO 1; PP. 78-114; BIBL. 17 REF.Article

MILLIMETER AND SULMILLIMETER WAVE MEASUREMENTS OF COMPLEX OPTICAL AND DIELECTRIC PARAMETERS OF MATERIALS. II: 5 MM TO 0.66 MM FOR CORNING MACOR MACHINABLE GLASS CERAMIC AND CORNING 9616 GREEN GLASSAFSAR MN; BUTTON KJ.1982; INT. J. INFRARED MILLIM. WAVES; ISSN 0195-9271; USA; DA. 1982; VOL. 3; NO 3; PP. 319-329; BIBL. 7 REF.Article

A MEASURING DEVICE FOR THE DETERMINATION OF THE ELECTRIC PERMITTIVITY OF MATERIALS IN THE FREQUENCY RANGE 0.1-300 MHZBENADDA MD; CARRU JC; DRUON C et al.1982; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1982; VOL. 15; NO 1; PP. 132-136; BIBL. 14 REF.Article

PRECISE CALCULATIONS AND MEASUREMENTS ON THE COMPLEX DIELECTRIC CONSTANT OF LOSSY MATERIALS USING TM₀₁₀ CAVITY PERTURBATION TECHNIQUESSHILE LI; AKYEL C; BOSISIO RG et al.1981; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1981; VOL. 29; NO 10; PP. 1041-1048; BIBL. 15 REF.Article

CAVITY RESONATOR MEASUREMENTS OF THE COMPLEX PERMITTIVITY OF LOW-LOSS LIQUIDSROSENBERG CB; HERMIZ NA; COOK RJ et al.1982; IEE PROC., PART H; ISSN 0143-7097; GBR; DA. 1982; VOL. 129; NO 2; PP. 71-76; BIBL. 13 REF.Article

MISE AU POINT DE TECHNIQUES DE MESURE DE LA PERMITTIVITE COMPLEXE A TRES HAUTE FREQUENCE ET A LARGE BANDE = DEVELOPMENT OF TECHNIQUES FOR MEASURING COMPLEX PERMITTIVITY AT VERY HIGH FREQUENCY AND LARGE BANDWIDTHTONG CHING YING.1982; ; FRA; DA. 1982; 170 F.; 30 CM; BIBL. 48 REF.; TH. 3E CYCLE: ELECTRON./PARIS 6/1982Thesis

A WIDE-BAND BRIDGE FOR THE MEASUREMENT OF THE COMPLEX PERMITTIVITY OF POLYMERIC SOLIDS AND OTHER MATERIALSPRATT GJ; SMITH MJA.1982; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1982; VOL. 15; NO 9; PP. 927-933; BIBL. 29 REF.Article

AUTOMATIC MEASUREMENT OF COMPLEX PERMITTIVITY (FROM 2MHZ TO 8 GHZ) USING TIME DOMAIN SPECTROSCOPYBONED C; PEYRELASSE J.1982; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1982; VOL. 15; NO 5; PP. 534-538; BIBL. 18 REF.Article

AUTOMATIC PERMITTIVITY MEASUREMENTS IN A WIDE FREQUENCY RANGE: APPLICATION TO ANISOTROPIC FLUIDSPARNEIX JP; LEGRAND C; TOUTAIN S et al.1982; IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 11; PP. 2015-2017; BIBL. 4 REF.Article

PHOTO-ELECTRIC YIELD CALCULATION ON A ROUGH SURFACE FOR NORMALLY INCIDENT LIGHT IN THE SPECTRAL RANGE OF SURFACE PLASMON EXCITATION APPLICATION TO INDIUM FILMSBOISSOLES J.1981; OPT. COMMUN.; ISSN 0030-4018; NLD; DA. 1981; VOL. 37; NO 3; PP. 190-192; BIBL. 11 REF.Article

THE SAMPLING OSCILLOSCOPE IN DIELECTRIC FREQUENCY DOMAIN SPECTROSCOPYGESTBLOM B.1982; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1982; VOL. 15; NO 1; PP. 87-90; BIBL. 7 REF.Article

A TRANSMISSION LINE CELL FOR MEASURING THE PERMITTIVITY OF LIQUIDS OVER THE FREQUENCY RANGE 90 MHZ TO 2 GHZSZWARNOWSKI S.1982; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1982; VOL. 15; NO 10; PP. 1068-1072; BIBL. 17 REF.Article