Etude par spectroscopie ESCA d'organogallylazoles = Photoelectrons spectrometry of organoallylazolesBOYER, D; MAIRE, Y; GASPARINI, J.-P et al.Bulletin de la Société chimique de France. 1984, Num 1-2, pp 46-48, issn 0037-8968Article

Application of a sine transform method to experiments of single-photon-decay spectroscopy : single exponential decay signalsLÓPEZ, R. J; GONZÁLEZ, F; MORENO, F et al.Review of scientific instruments. 1992, Vol 63, Num 6, pp 3268-3273, issn 0034-6748Article

Fonction d'appareil théorique d'un spectromètre de rayonnement à photoionisationBUTIKOV, E. I; TUMARKIN, YA. N; OSIPOVA, E. A et al.Optika i spektroskopiâ. 1984, Vol 57, Num 2, pp 335-338, issn 0030-4034Article

Two-stage electron energy analyzer for angle-resolved photoemission spectroscopyROYER, W. A; SMITH, N. V.Review of scientific instruments. 1984, Vol 55, Num 6, pp 909-911, issn 0034-6748Article

Etude théorique du fonctionnement d'un spectromètre de rayonnement par photoionisationBUTIKOV, E. I; TUMARKIN, YA. N.Optika i spektroskopiâ. 1984, Vol 56, Num 3, pp 512-517, issn 0030-4034Article

Angle-resolving photoelectron energy analyzer: mode calculations, ray-tracing analysis and performance evaluationSTEVENS, H. A; DONOHO, A. W; TURNER, A. M et al.Journal of electron spectroscopy and related phenomena. 1983, Vol 32, Num 4, pp 327-341, issn 0368-2048Article

A simultaneous angle-resolved photoelectron spectrometerBOSCH, A; FEIL, H; SAWATZKY, G. A et al.Journal of physics. E. Scientific instruments. 1984, Vol 17, Num 12, pp 1187-1192, issn 0022-3735Article

Simple instrument for the measurement of photoelectron structure functionsBASANO, L; OTTONELLO, P.Review of scientific instruments. 1985, Vol 56, Num 11, pp 2070-2073, issn 0034-6748Article

Magnetoelectric, Raman, and XPS Properties of Pb_0.7Sr_0.3[(Fe_2/3Ce_1/3)_0.012Ti_0.988]O₃ and Pb_0.7Sr_0.3[(Fe_2/3La_1/3)_0.012Ti_0.988]O₃ NanopartidesVERMA, Kuldeep Chand; KUMAR, Manoj; KOTNALA, R. K et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2014, Vol 45, Num 3, pp 1409-1414, issn 1073-5623, 6 p.Article

Augmentation de la sensibilité de seuil d'un spectromètre de rayonnement de photoionisation par collisionsMISHCHENKO, E. D; REBO, I. L.Optika i spektroskopiâ. 1987, Vol 62, Num 2, pp 437-440, issn 0030-4034Article

Fast optical position-sensitive detector for McPherson ESCA-36BERTRAND, P. A; KALINOWSKI, W. J; TRIBBLE, L. E et al.Review of scientific instruments. 1983, Vol 54, Num 3, pp 387-389, issn 0034-6748Article

Some aspects of the charging effect in monochromatized focused XPSYU, X; HANTSCHE, H.Fresenius' journal of analytical chemistry. 1993, Vol 346, Num 1-3, pp 233-236, issn 0937-0633Conference Paper

Etude de l'oxydation du niobium par spectroscopie de photoélectrons = Study of niobium oxidation by photoelectron spectrometryDURAND BERTRAND, Christiane.1985, 6 p.Report

Spectroscopie de photoélectrons = Photoelectron spectroscopyPERTOSA, P.1982, 15 colReport

A novel soft X-ray source (hν = 151.6 eV) for core level and valence band photoemission spectroscopy with high surface sensitivityDUO, L; DE MICHELIS, B; FASANA, A et al.Journal of electron spectroscopy and related phenomena. 1993, Vol 62, Num 4, pp 309-316, issn 0368-2048Article

ESCA features of ligninsVARMA, A. J.Polymer testing. 1986, Vol 6, Num 1, pp 79-80, issn 0142-9418Article

Inexpensive and high-precision digital power supply and counting interface for UPS, XPS, and Auger spectrometersLICHTENBERGER, D. L; KELLOGG, G. E; KRISTOFZSKI, J. G et al.Review of scientific instruments. 1986, Vol 57, Num 9, issn 0034-6748, 2366Article

Film thicknesses determined by X-ray photoelectron spectrometryEBEL, M. F; ZUBA, G; EBEL, H et al.Spectrochimica acta. Part B : Atomic spectroscopy. 1984, Vol 39, Num 5, pp 637-647, issn 0584-8547Article

An X-ray photoelectron spectroscopic investigation of the oxidation of manganese = Etude par spectrométrie de photoélectron RX de l'oxydation du manganèseFOORD, J. S; JACKMAN, R. B; ALLEN, G. C et al.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1984, Vol 49, Num 5, pp 657-663, issn 0141-8610Article

Electron spectroscopy for chemical analysis studies on oxyligated holmium compoundsMILLIGAN, W. O; MULLICA, D. F; PERKINS, H. O et al.Journal of physical chemistry (1952). 1983, Vol 87, Num 26, pp 5411-5417, issn 0022-3654Article

Electronic structure of palladium = Structure électronique du palladiumBORDOLOI, A. K; AULUCK, S.Physical review. B, Condensed matter. 1983, Vol 27, Num 8, pp 5116-5118, issn 0163-1829Article

An appraisal of evaporated gold as an energy reference in X-ray photoelectron spectroscopyKOHIRI, S; OKI, K.Journal of electron spectroscopy and related phenomena. 1985, Vol 36, Num 1, pp 105-110, issn 0368-2048Article

Anodic iridium oxide films: XPS-studies of oxidation state changes and O₂-evolution = Etude par XPS de changement de l'état d'oxydation de films d'oxydes anodiques d'iridium et dégagement de O₂KOTZ, R; NEFF, H; STUCKI, S et al.Journal of the Electrochemical Society. 1984, Vol 131, Num 1, pp 72-77, issn 0013-4651Article

Detection of water soluble flux residues on printed wiring boards by ESCAROBERTS, R. F.Surface and interface analysis. 1985, Vol 7, Num 2, pp 88-92, issn 0142-2421Article

Signal-to-noise measurements in X-ray photoelectron spectroscopyKOENIG, M. F; GRANT, J. T.Surface and interface analysis. 1985, Vol 7, Num 5, pp 217-222, issn 0142-2421Article