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Results 1 to 25 of 346

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Optimization of reactive ion etching processes using desirabilityBRABENDER, Stephan; KALLIS, Klaus T; KELLER, Lars O et al.Microelectronic engineering. 2010, Vol 87, Num 5-8, pp 1413-1415, issn 0167-9317, 3 p.Conference Paper

Preparation and characterization of La-doped Ba(1-x)SrxTiO3 powders and thin filmsHAO, Su-E; WANG, Chun-Yan; FU, Dong-Sheng et al.Thin solid films. 2010, Vol 518, Num 20, pp 5645-5648, issn 0040-6090, 4 p.Conference Paper

Particle modeling of non-collisional heating in inductively coupled argon plasmasTAKEKIDA, H; NANBU, K.Thin solid films. 2006, Vol 506-07, pp 729-733, issn 0040-6090, 5 p.Conference Paper

Surface properties of platinum thin films as a function of plasma treatment conditionsZHIYONG LI; BECK, Patricia; OHLBERG, Douglas A. A et al.Surface science. 2003, Vol 529, Num 3, pp 410-418, issn 0039-6028, 9 p.Article

Temperature dependence of the surface reactivity of SiH3 radicals and the surface silicon hydride composition during amorphous silicon growthKESSELS, W. M. M; HOEFNAGELS, J. P. M; VAN DEN OEVER, P. J et al.Surface science. 2003, Vol 547, Num 3, pp L865-L870, issn 0039-6028Article

Laser-induced fluorescence diagnosis of plasma processing sourcesMCWILLIAMS, R; EDRICH, D.Thin solid films. 2003, Vol 435, Num 1-2, pp 1-4, issn 0040-6090, 4 p.Conference Paper

The effect of humidity on the rolling resistance of silver coatings modified by plasma surface treatmentsSEUNG HO YANG; KONG, Hosung; CHOI, Sung-Chang et al.Wear. 2001, Vol 249, Num 9, pp 780-787, issn 0043-1648Article

Modeling of ion-bombardment damage on Si surfaces for in-line analysisMATSUDA, Asahiko; NAKAKUBO, Yoshinori; TAKAO, Yoshinori et al.Thin solid films. 2010, Vol 518, Num 13, pp 3481-3486, issn 0040-6090, 6 p.Conference Paper

Nanomanufacturing of random branching material architecturesDOUMANIDIS, Charalabos C.Microelectronic engineering. 2009, Vol 86, Num 4-6, pp 467-478, issn 0167-9317, 12 p.Conference Paper

Plasma processing of AISI 304 stainless steel using radio frequency hollow cathode dischargeTIAN, X. B; JIANG, H. F; YANG, S. Q et al.Surface & coatings technology. 2007, Vol 201, Num 19-20, pp 8650-8653, issn 0257-8972, 4 p.Conference Paper

Sputter-assisted plasma CVD of polymer-like amorphous : CNx:H films using supermagnetron plasmaKINOSHITA, Haruhisa; IKUTA, Ryo; SAKURAI, Katsutoshi et al.Thin solid films. 2007, Vol 515, Num 9, pp 4121-4124, issn 0040-6090, 4 p.Conference Paper

New biodegradable material based on RF plasma modified starchSZYMANOWSKI, Hieronim; KACZMAREK, Mariusz; GAZICKI-LIPMAN, Maciej et al.Surface & coatings technology. 2005, Vol 200, Num 1-4, pp 539-543, issn 0257-8972, 5 p.Conference Paper

Modeling of plasma assisted formation of precipitates in zirconium containing liquid precursor dropletsOZTURK, Alper; CETEGEN, Baki M.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2004, Vol 384, Num 1-2, pp 331-351, issn 0921-5093, 21 p.Article

Plasma assisted metal-organic chemical vapor deposition of hard chromium nitride thin film coatings using chromium(III) acetylacetonate as the precursorDASGUPTA, Arup; KUPPUSAMI, P; LAWRENCE, Falix et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2004, Vol 374, Num 1-2, pp 362-368, issn 0921-5093, 7 p.Article

Numerical analysis of oxygen induction thermal plasmas with chemically non-equilibrium assumption for dissociation and ionizationWATANABE, Takayuki; SUGIMOTO, Noriaki.Thin solid films. 2004, Vol 457, Num 1, pp 201-208, issn 0040-6090, 8 p.Conference Paper

Insights into sticking of radicals on surfaces for smart plasma nano-processingHORI, Masaru; GOTO, Toshio.Applied surface science. 2007, Vol 253, Num 16, pp 6657-6671, issn 0169-4332, 15 p.Article

Plasma treatment for crystallization of amorphous thin filmsOHSAKI, H; SHIBAYAMA, Y; NAKAJIM, A et al.Thin solid films. 2006, Vol 502, Num 1-2, pp 63-66, issn 0040-6090, 4 p.Conference Paper

Effect of in situ ultrasonic treatment on tungsten surface oxidationROMANYUK, Andriy; OELHAFEN, Peter; STEINER, Roland et al.Surface science. 2005, Vol 595, Num 1-3, pp 35-39, issn 0039-6028, 5 p.Article

Interaction of SiH3 radicals with deuterated (hydrogenated) amorphous silicon surfacesAGARWAL, Sumit; VALIPA, Mayur S; HOEX, Bram et al.Surface science. 2005, Vol 598, Num 1-3, pp 35-44, issn 0039-6028, 10 p.Article

Removal of self-assembled monolayers of alkanethiolates on gold by plasma cleaningRAIBER, Kevin; TERFORT, Andreas; BENNDORF, Carsten et al.Surface science. 2005, Vol 595, Num 1-3, pp 56-63, issn 0039-6028, 8 p.Article

Atomistic calculation of the SiH3 surface reactivity during plasma deposition of amorphous silicon thin filmsVALIPA, Mayur S; AYDIL, Eray S; MAROUDAS, Dimitrios et al.Surface science. 2004, Vol 572, Num 2-3, pp 103-111, issn 0039-6028, 9 p.Article

Reductions in interface defects, Dit, by post oxidation plasma-assisted nitridation of GaN-SiO2 interfaces in MOS devicesBAE, C; LUCOVSKY, G.Surface science. 2004, Vol 566-68, pp 356-360, issn 0039-6028, 5 p., 1Conference Paper

Instability of gold oxide Au2O3HUNGCHUN TSAI; HU, Emily; KUOGUANG PERNG et al.Surface science. 2003, Vol 537, Num 1-3, pp L447-L450, issn 0039-6028Article

Mechanism and energetics of dimerization of SiH2 radicals on H-terminated Si(001)-(2 x 1) surfacesSRIRAMAN, Saravanapriyan; MAHALINGAM, Pushpa; AYDIL, Eray S et al.Surface science. 2003, Vol 540, Num 2-3, pp L623-L630, issn 0039-6028Article

Studies on a supersonic thermal plasma expansion process for synthesis of titanium nitride nanoparticlesBORA, B; AOMOA, N; KAKATI, M et al.Powder technology. 2013, Vol 246, pp 413-418, issn 0032-5910, 6 p.Article

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