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Results 1 to 25 of 3165

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Refinement of GaAs powder diffraction dataRAZIK, N. A; AL-BARAKATI, G; AL-HENETI, S et al.Journal of materials science letters. 1989, Vol 8, Num 12, pp 1458-1460, issn 0261-8028, 3 p.Article

A qualitative account for anisotropic broadening in whole-powder-diffraction-pattern fitting by second-rank tensorsLE BAIL, A; JOUANNEAUX, A.Journal of applied crystallography. 1997, Vol 30, pp 265-271, issn 0021-8898, 3Article

A high-performance, compact X-ray diffraction systemRUSSELL, K. A.American laboratory (Fairfield). 1997, Vol 29, Num 21, pp 22-24, issn 0044-7749, 2 p.Article

Lattice parameter from powder diffraction pattern of a cubic crystal using the ratio method and separation of doublet componentsLUTTS, A.Zeitschrift für Kristallographie. 1984, Vol 169, Num 1-4, pp 1-11, issn 0044-2968Article

The use of fast powder diffraction methods to study transformationsANWAR, J; BARNES, P; CLARK, S. M et al.Journal of materials science letters. 1990, Vol 9, Num 4, pp 436-439, issn 0261-8028, 4 p.Article

An X-ray microdiffractometer for the analysis of small specimens, and its use in a forensic science laboratoryBANKS, R. C; RENDLE, D. F; RUSSELL, J. R et al.Journal of applied crystallography. 1984, Vol 17, Num 4, pp 294-296, issn 0021-8898Article

Assessment of parameter accuracies in profile analysis of white-beam neutron powder diffraction experimentsPÖYRY, H; TILLI, K. J.Journal of applied crystallography. 1983, Vol 16, Num 5, pp 479-485, issn 0021-8898Article

A comment on The peak in neutron powder diffraction by B. van Laar and W. B. YelonHOWARD, C. J.Journal of applied crystallography. 1984, Vol 17, Num 6, pp 482-483, issn 0021-8898Article

Crystal structure determination by powder neutron diffraction at the spallation neutron source, ISISCHEETHAM, A. K; DAVID, W. I. F; EDDY, M. M et al.Nature (London). 1986, Vol 320, Num 6057, pp 46-48, issn 0028-0836Article

New modification of 5PbO•àNb2O5YAMAGUCHI, O; MUKAIDA, Y.Journal of materials science letters. 1990, Vol 9, Num 1, pp 122-123, issn 0261-8028, 2 p.Article

Correction of intensities for preferred orientation in powder diffractometry: application of the March modelDOLLASE, W. A.Journal of applied crystallography. 1986, Vol 19, Num 4, pp 267-272, issn 0021-8898Article

ε-Scanning ― a method of evaluating the dimensional and orientational distribution of crystallites by X-ray powder diffractometerYUKINO, K; UNO, R.Japanese journal of applied physics. 1986, Vol 25, Num 5, pp 661-666, issn 0021-4922, 1Article

Ca-Mg triple-chain silicate derived from Na-Mg triple-chain silicate by, ion-exchange experiment and its structural model = Formation d'un silicate à chaînes triples de Ca-Mg à partir du silicate à chaînes triples Na-Mg par réactions d'échange d'ions et modèle de sa structureAKAI, J; SAITO, M.Bulletin de minéralogie. 1985, Vol 108, Num 1, pp 21-28, issn 0180-9210Article

Some aspects of the crystallography, flow and fracture of beryl (Be3Al2(SiO2)6) = Quelques aspects de la cristallographie, écoulement et fracture du bérylADEWOYE, O. O.Journal of materials science letters. 1984, Vol 3, Num 10, pp 855-858, issn 0261-8028Article

The variation of 2θ angles in powder diffraction patterns of one- and two-step K-rich feldspars = Variation des angles 2θ dans les diagrammes de poudre des feldspaths potassiques avec mise en ordre en une ou deux étapesBLASI, A.Bulletin de minéralogie. 1984, Vol 107, Num 3-4, pp 437-445, issn 0180-9210Article

A program for the calculation of the intensities of X-ray or neutron powder reflections. IIIFERGUSON, I. F; HARDY, A. D; MODI, M. U et al.Computer physics communications. 1984, Vol 32, Num 1, pp 83-94, issn 0010-4655Article

A new method for the determination of precise values for the lattice parameters from powder patterns of trigonal and tetragonal crystals = Une nouvelle méthode pour déterminer les valeurs précises des paramètres de réseau d'après des diagrammes de poudres de cristaux tricliniques et tétrahédriquesLUTTS, A.Zeitschrift für Kristallographie. 1982, Vol 159, Num 1-4, pp 191-202, issn 0044-2968Article

Structure determination of molecular materials from powder diffraction data : Molecular crystalsHARRIS, Kenneth D. M.Current opinion in solid state & materials science. 2002, Vol 6, Num 2, pp 125-130, issn 1359-0286Article

Use of a Hewlett-Packard ScanJet image digitizer as an X-ray powder photograph densitometerCALOS, N. J; KENNARD, C. H. L.Journal of applied crystallography. 1991, Vol 24, issn 0021-8898, p. 73, p.1Article

En Japonais = EXAFS and its application in mineralogyKOTO, K.Kobutsugaku Zasshi. 1990, Vol 19, Num 6, pp 357-360, issn 0454-1146Article

A neutron powder diffraction analysis of potassium-exchanged ferrieritePICKERING, I. J; MADDOX, P. J; THOMAS, J. M et al.Journal of catalysis (Print). 1989, Vol 119, Num 1, pp 261-265, issn 0021-9517, 5 p.Article

Whole-powder-pattern fitting without reference to a structural model: application to X-ray powder diffractometer dataTORAYA, H.Journal of applied crystallography. 1986, Vol 19, Num 6, pp 440-447, issn 0021-8898Article

Programme d'affinement des paramètres cristallins d'après les diagrammes de poudreZABOLOTNYJ, V. A; SOLOV'EVA, L. P.Kristallografiâ. 1985, Vol 30, Num 5, pp 999-1002, issn 0023-4761Article

Imaging crystallographic phases using time-of-flight neutron diffractionGUTMANN, Matthias; KOCKELMANN, Winfried; CHAPON, Laurent et al.Physica. B, Condensed matter. 2006, Vol 385-86, pp 1203-1205, issn 0921-4526, 3 p., 2Conference Paper

A simple attachment to Debye-Scherrer X-ray powder diffraction cameras to obtain powder patterns from single crystals = Simple accessoire pour les chambres de diffraction de poudres aux rayons-X afin d'obtenir des diagrammes de poudre à partir de monocristauxVERSCHURE, R. H; SCHREURS, A. W; MEULEMANS, A et al.Mineralogical Magazine. 1987, Vol 51, Num 363, pp 747-749, issn 0026-461XArticle

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