Simpson-type paradoxes, dependence, and ageingSCARSINI, M; SPIZZICHINO, F.Journal of applied probability. 1999, Vol 36, Num 1, pp 119-131, issn 0021-9002Article

Life test performance of thermionic cathodesDIEUMEGARD, D; TONNERRE, J. C; BRION, D et al.Applied surface science. 1997, Vol 111, pp 84-89, issn 0169-4332Conference Paper

Efficacité des essais fonctionnels d'une isolation électriqueBERNSHTEJN, L. M; OKNIN, N. S.Èlektričestvo. 1988, Num 1, pp 65-67, issn 0013-5380Article

Correlation of two accelerated corrosion test methods to the actual exposure of finished panelsSTRUEMPH, D. J; HILKO, J.IEEE transactions on power delivery. 1987, Vol 2, Num 3, pp 823-826, issn 0885-8977Conference Paper

Predicting cathode life expectancy and emission quality from PWFD measurementsCATTELINO, M; MIRAM, G.Applied surface science. 1997, Vol 111, pp 90-95, issn 0169-4332Conference Paper

Robustness of sequential gamma life testing proceduresSHARMA, K. K; RANA, R. S.Microelectronics and reliability. 1990, Vol 30, Num 6, pp 1145-1153, issn 0026-2714Article

Modeling and analysis of time-dependent stress accelerated life dataMETTAS, Adamantios; VASSILIOU, Pantelis.Proceedings. Annual Reliability and Maintainability Symposium. 2002, pp 343-348, issn 0149-144X, isbn 0-7803-7348-0, 6 p.Conference Paper

Cryocooler life estimation and its correlation with experimental dataKUO, D. T; LOC, A. S; LODY, T. D et al.Advances in cryogenic engineering. 2000, Vol 45, pp 267-273, issn 0065-2482, AConference Paper

Flight usage of microwave transitor life test samplesFIDLER, R.ESA SP (Print). 1997, pp 441-445, issn 0379-6566, isbn 92-9092-263-XConference Paper

Bayesian prediction of the jth order statistic with Burr distribution and a random sample sizeASHOUR, S. K; EL-WAKEEL, M. A. M. H.Microelectronics and reliability. 1993, Vol 33, Num 8, pp 1179-1188, issn 0026-2714Article

An explanation and criticism of minute accumulating analysisHAMADA, M.Journal of quality technology. 1992, Vol 24, Num 2, pp 70-77, issn 0022-4065Article

Robustness of sequential gamma life-testing procedures in respect of expected failure timesSHARMA, K. K; RANA, R. S.Microelectronics and reliability. 1991, Vol 31, Num 6, pp 1073-1076, issn 0026-2714Article

Reliability approach for vehicle safety componentsBRUNNER, F. J.Quality and reliability engineering international. 1989, Vol 5, Num 4, pp 291-297, issn 0748-8017Article

Storage properties of advanced C-size calcium-thionyl chloride batteriesELSTER, E; COHEN, R; BRAND, M et al.Journal of the Electrochemical Society. 1988, Vol 135, Num 5, pp 1307-1308, issn 0013-4651Article

Der Compliant Scroll = The compliant scrollGREDER, D; HENCHOZ, M.Die Kälte und Klimatechnik. 1994, Vol 47, Num 12, pp 967-973, issn 0343-2246, 6 p.Article

Best compromise test plans for Weibull distributions with different censoring timesGUANGBIN YANG; LING JIN.Quality and reliability engineering international. 1994, Vol 10, Num 5, pp 411-415, issn 0748-8017Article

Two characterizations of geometric distributionsYEHIA, A. Y; AHMED, A. N.Microelectronics and reliability. 1993, Vol 33, Num 6, pp 833-843, issn 0026-2714Article

A case study on the benefits of combining reliability stress testsSEAGER, J. D; FIESELMAN, C. D.Quality and reliability engineering international. 1991, Vol 7, Num 3, pp 181-188, issn 0748-8017Article

Multi-factor aging of insulation systems ― infinite sequential stressing method ―KAKO, Y.IEEE transactions on electrical insulation. 1986, Vol 21, Num 6, pp 913-917, issn 0018-9367Article

Influence of the photodegradation of transformer oil on measurements of its aging propertiesLAMARRE, C; CRINE, J.-P.IEEE transactions on electrical insulation. 1985, Vol 20, Num 3, pp 639-641, issn 0018-9367Article

Next generation long-life polyurea greasesNADASDI, T. Tim.NLGI spokesman. 2001, Vol 65, Num 8, pp 8-14, issn 0027-6782Conference Paper

Cryocooler reliability issues for space applicationsMARQUARDT, E. D.Cryogenics (Guildford). 2001, Vol 41, Num 11-12, pp 845-849, issn 0011-2275Conference Paper

Accelerated stress testing and environmental stress screeningMALEC, Henry A.Quality and reliability engineering international. 1998, Vol 14, Num 6, issn 0748-8017, 74 p.Serial Issue

Reliability assurance of NEC's space TWTsMIURA, S; KATAKAMI, K; AKIYAMA, Y et al.NEC research & development. 1996, Vol 37, Num 2, pp 249-259, issn 0547-051XArticle

A versatile failure time distributionMUKHERJEE, S. P; DILIP ROY.Microelectronics and reliability. 1993, Vol 33, Num 7, pp 1053-1056, issn 0026-2714Article