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Results 1 to 25 of 606

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Order-parameter profile at long distances in an adsorbed binary liquid mixture near criticalitySCHLOSSMAN, M; XIAO-LUN WU; FRANCK, C et al.Physical review. B, Condensed matter. 1985, Vol 31, Num 3, pp 1478-1485, issn 0163-1829Article

Back reflection effect at the fundamental edge of semiconductors in modulated reflectivity measurementsGAGNON, R; BERNIER, G; JANDL, S et al.Solid state communications. 1987, Vol 64, Num 3, pp 361-365, issn 0038-1098Article

Line shapes of field-induced blue-phase-III selective reflectionsKITZEROW, H.-S; CROOKER, P. P; HEPPKE, G et al.Physical review letters. 1991, Vol 67, Num 16, pp 2151-2154, issn 0031-9007Article

First optical observations of superfluid 3HeMANNINEN, A. J; PEKOLA, J. P; KIRA, G. M et al.Physical review letters. 1992, Vol 69, Num 16, pp 2392-2395, issn 0031-9007Article

Model for reduced stability of coloration in microcrystalline powders of alkali halidesDESHMUKH, B. T; BATRA, K. K; MOHARIL, S. V et al.Physical review. B, Condensed matter. 1984, Vol 29, Num 6, pp 3652-3660, issn 0163-1829Article

Quantization of excitonic polaritons in thin GaAs layersSCHULTHEIS, L; PLOOG, K.Physical review. B, Condensed matter. 1984, Vol 29, Num 12, pp 7058-7061, issn 0163-1829Article

Symmetry and the reflectivity of diffraction gratings at normal incidenceWEBER, M. G; MILLS, D. L.Physical review. B, Condensed matter. 1985, Vol 31, Num 4, pp 2510-2513, issn 0163-1829Article

Die spiegeloptische Formbestimmung der Augen-Oberfläche (Cornea-Photogrammetrie) = Photogrammétrie de la cornée avec un réseau reflété = Kornea photogrammetry by means of a reflected gridBURKHARDT, R.Bildmessung und Luftbildwesen. 1985, Vol 53, Num 5, pp 152-162, issn 0006-2421Article

Optical determination of the charge transfer in AsF3-graphite intercalation compoundsSAINT JEAN, M; NGUYEN HY HAU; RIGAUX, C et al.Solid state communications. 1983, Vol 46, Num 1, pp 55-58, issn 0038-1098Article

Practical expression for reflectances of GaPENDO, T; TANIGUCHI, S; YAMANAKA, T et al.Japanese journal of applied physics. 1986, Vol 25, Num 6, pp 920-921, issn 0021-4922, 1Article

Optical and photo-acoustic properties of semiconducting Ge-Sb-S glassesNIKOLIC, P. M; VUJATOVIC, S. S; TODOROVIC, D. M et al.Journal of physics. C. Solid state physics. 1986, Vol 19, Num 30, pp L717-L724, issn 0022-3719Article

Effects of different polishing methods on the reflectance of siliconPAULY, H.TMPM. Tschermaks mineralogische und petrographische Mitteilungen. 1986, Vol 35, Num 4, pp 261-273, issn 0041-3763Article

Properties of FeCl3-intercalated graphite film prepared by heat treatment of poly(p-phenylene vinylene) filmUENO, H; YOSHINO, K.Physical review. B, Condensed matter. 1987, Vol 36, Num 15, pp 8138-8141, issn 0163-1829Article

Long-range surface mode supported by very thin silver filmsYANG, F; BRADBERRY, G. W; SAMBLES, J. R et al.Physical review letters. 1991, Vol 66, Num 15, pp 2030-2032, issn 0031-9007, 3 p.Article

ETUDE DES SPECTRES DE REFLEXION ET CALCULS DES FONCTIONS OPTIQUES DE IN4SE3SOBOLEV VV; ALEKSEEVA SA; ZAGAJNOV EF et al.1980; IZV. AKAD. NAUK SSSR, NEORG. MATER.; ISSN 0002-337X; SUN; DA. 1980; VOL. 16; NO 3; PP. 407-413; BIBL. 11 REF.Article

Polarization dependent reflectivity of Si(111)-2X1: calculations and comparison with experimentDEL SOLE, R; SELLONI, A.Solid state communications. 1984, Vol 50, Num 9, pp 825-828, issn 0038-1098Article

Spectres de réflexion d'un monocristal de TlInS2ABUTALYBOV, G. I; ALIEV, A. A; LARIONKINA, L. S et al.Fizika tverdogo tela. 1984, Vol 26, Num 3, pp 846-848, issn 0367-3294Article

Dispersion relation of optical eigen modes in chiral smectic C by 4×4 matrix methodOUCHI, Y; SHINGU, T; TAKEZOE, H et al.Japanese journal of applied physics. 1984, Vol 23, Num 9, pp L660-L662, issn 0021-4922, 2Article

Optical absorption edge of Tl3VS4 and Tl3TaS4ĆERMÁK, K.Czechoslovak journal of physics. 1984, Vol 34, Num 1, pp 88-93, issn 0011-4626Article

Dynamical aspects of pulsed laser annealing of ion-implanted siliconKANEMITSU, Y; OKAMOTO, K; KURODA, H et al.Japanese journal of applied physics. 1984, Vol 23, Num 5, pp 612-617, issn 0021-4922, 1Article

Time-resolved reflectivity and melting depth measurements using pulsed ruby laser on siliconTOULEMONDE, M; UNAMUNO, S; HEDDACHE, R et al.Applied physics. A, Solids and surfaces. 1985, Vol 36, Num 1, pp 31-36, issn 0721-7250Article

Excitonic wavelength modulated reflectance of CdGa2Se4BACEWICZ, R.Physica status solidi. B. Basic research. 1984, Vol 122, Num 2, pp K155-K158, issn 0370-1972Article

REFLECTANCE AND THERMOREFLECTANCE OF GETEBALEVA M.1980; PHYS. STATUS SOLIDI (B), BASIC RES.; DDR; DA. 1980; VOL. 99; NO 1; PP. 341-346; ABS. RUS; BIBL. 7 REF.Article

TIME DEPENDENCE OF THE REFLECTIVITY OF SI AT 633 AND 488 NM DURING PULSED LASER ANNEALINGNATHAN MI; HODGSON RT; YOFFA EJ et al.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 36; NO 7; PP. 512-513; BIBL. 9 REF.Article

PROPRIETES OPTIQUES DE MATERIAUX IMPLANTES (MGO:NA): CONTRIBUTION A L'ETUDE DE SURFACES SELECTIVES SOLAIRES = OPTICAL PROPERTIES OF IMPLANTED MATERIALS (MGO:NA): CONTRIBUTION TO THE STUDY OF SOLAR SELECTIVE SURFACESDELMAS ALAIN.1980; ; FRA; DA. 1980; 121 P.; 30 CM; BIBL. 76 REF.; TH. DOCT.-ING./LYON 1/1980/75-2355Thesis

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