Ordering of the Si(553) surface with Pb atomsKOPCIUSZYNSKI, M; LUKASIK, P; ZDYB, R et al.Applied surface science. 2014, Vol 305, pp 139-142, issn 0169-4332, 4 p.Article

Reflection high-energy electron diffraction, RHEEDICHIMIYA, Ayahiko.Japanese journal of tribology. 2005, Vol 50, Num 5, pp 551-558, issn 1045-7828, 8 p.Article

Morphological and magnetic properties of Ge/Mn_xGe_1-x/ Ge(001)2 × 1 diluted magnetic semiconductorDE PADOVA, P; GENEROSI, A; LUCARI, F et al.Surface science. 2006, Vol 600, Num 18, pp 4190-4194, issn 0039-6028, 5 p.Conference Paper

RHEED wave functions and the effect of reconstruction on secondary electron emission from the Si(100) surfaceKAWAMURA, T; MAKSYM, P. A.Surface science. 2007, Vol 601, Num 3, pp 822-829, issn 0039-6028, 8 p.Article

Surface bismuth removal after Bi nanoline encapsulation in siliconYAGI, Shuhei; YASHIRO, Wataru; SAKAMOTO, Kunihiro et al.Surface science. 2005, Vol 595, Num 1-3, pp L311-L317, issn 0039-6028Article

SRPES investigation of tungsten oxide in different oxidation statesMASEK, K; LIBRA, J; SKALA, T et al.Surface science. 2006, Vol 600, Num 8, pp 1624-1627, issn 0039-6028, 4 p.Conference Paper

Indium-induced superstructures formed on Si(1 1 0) surfacesICHIKAWA, Toshihiro; WARAGAYA, Takeshi.Applied surface science. 2009, Vol 256, Num 4, pp 1136-1139, issn 0169-4332, 4 p.Conference Paper

Ultra-thin oxide layer formation on Cu-9% Al(111) surface and Pd growth studied using reflection high energy electron diffraction and Auger electron spectroscopyNEMSAK, Slavomir; YOSHITAKE, Michiko; MASEK, Karel et al.Surface science. 2006, Vol 600, Num 18, pp 4357-4360, issn 0039-6028, 4 p.Conference Paper

Influence of Si(1 1 1) surface superstructure on quantum size effect in Au filmsKOPCIUSZYNSKI, M; ZDYB, R; JAŁOCHOWSKI, M et al.Applied surface science. 2014, Vol 304, pp 40-43, issn 0169-4332, 4 p.Conference Paper

New tilting mechanism of electron gun for reflection high-energy electron diffractionICHIKAWA, T; OYAMA, H.Japanese journal of applied physics. 1995, Vol 34, Num 4A, pp 2022-2024, issn 0021-4922, 1Article

Distorted wave approach to diffuse scattering in THEED and RHEEDDUDAREV, S. L; PENG, L.-M; WHELAN, M. J et al.Ultramicroscopy. 1993, Vol 52, Num 3-4, pp 393-399, issn 0304-3991Conference Paper

Geometrical correction to plasmon effects in energy-filtered RHEED spectraDERLET, P. M; SMITH, A. E; HORIO, Y et al.Surface science. 1997, Vol 393, Num 1-3, pp 85-94, issn 0039-6028Article

Calculation of RHEED intensities by a THEED algorithmANSTIS, G. R; GAN, X. S.Surface science. 1994, Vol 314, Num 3, pp L919-L924, issn 0039-6028Article

Inexpensive spot-profile analysis reflection high energy electron diffractionIDZERDA, Y.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 6, pp 3138-3140, issn 0734-2101Article

Comparison of reflection high-energy electron diffraction and low-energy electron diffraction using high-resolution instrumentationMÜLLER, B; HENZLER, M.Surface science. 1997, Vol 389, Num 1-3, pp 338-348, issn 0039-6028Article

Dynamical analysis of a RHEED pattern from the Si(111)-7×7 surfaceMA, Y; LORDI, S; EADES, J. A et al.Surface science. 1994, Vol 313, Num 3, pp 317-334, issn 0039-6028Article

Structure and coverage of epitaxial Pb-layers on Si(111)(7×7)WEMMENHOVE, M; HIBMA, T.Surface science. 1993, Vol 287-288, pp 925-929, issn 0039-6028, bConference Paper

Study of the Si(111)7×7 surface by RHEED rocking curve analysisHANADA, T; INO, S; DAIMON, H et al.Surface science. 1994, Vol 313, Num 1-2, pp 143-154, issn 0039-6028Article

On the Doyle-Turner representation of the optical potential for RHEED calculationsDUDAREV, S. L; PENG, L.-M; WHELAN, M. J et al.Surface science. 1995, Vol 330, Num 1, pp 86-100, issn 0039-6028Article

Origin of phase shift phenomena in RHEED intensity oscillation curvesHORIO, Y; ICHIMIYA, A.Ultramicroscopy. 1994, Vol 55, Num 3, pp 321-328, issn 0304-3991Article

REM observations of Si(hhk) surfaces and their vicinal surfacesSUZUKI, T; TANISHIRO, Y; MINODA, H et al.Surface science. 1993, Vol 298, Num 2-3, pp 473-477, issn 0039-6028Conference Paper

RHEED oscillations at special diffraction conditionsMAKYSM, P. A; MITURA, Z; KNIBB, M. G et al.Surface science. 1993, Vol 298, Num 2-3, pp 293-298, issn 0039-6028Conference Paper

Investigation of multislice RHEED calculationsGOTSIS, H. J; MAKSYM, P. A.Surface science. 1997, Vol 385, Num 1, pp 15-23, issn 0039-6028Article

Step characterization on vicinal Si surfaces by reflection high-energy electron diffraction at arbitrary azimuthsZHU, J.-H; BRUNNER, K; ABSTREITER, G et al.Applied surface science. 1999, Vol 137, Num 1-4, pp 191-196, issn 0169-4332Article

Hydrogen terminated Si(111) surface studied by RHEEDYAKOVLEV, N. L; SHUSTERMAN, Yu. V; MAKSYM, P. A et al.Applied surface science. 1998, Vol 130-32, pp 310-313, issn 0169-4332Conference Paper