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Cell design for low-temperature time-domain reflectance measurementsBERBERIAN, J. G; COLE, R. H.Review of scientific instruments. 1992, Vol 63, Num 1, pp 99-103, issn 0034-6748Conference Paper

An alternative explicit six-port matrix calibration formalism using five standardsGHANNOUCHI, F. M; BOSISIO, R. G.IEEE transactions on microwave theory and techniques. 1988, Vol 36, Num 3, pp 494-498, issn 0018-9480Article

Entwicklundstendenzen der Betriebsanalysentechnik = Trends of development of in-plant analysis technologyFRECH, T.Automatisierungstechnische Praxis. 1990, Vol 32, Num 7, pp 338-342, issn 0178-2320, 5 p.Article

High-resolution frequency-domain reflectometry by estimation of modulated superimposed complex sinusoidsVAN HAMME, H.IEEE transactions on instrumentation and measurement. 1992, Vol 41, Num 6, pp 762-767, issn 0018-9456Conference Paper

New calibration method for a 7-port reflectometerLUFF, G. F; PROBERT, P. J; CARROTT, J. E et al.IEE proceedings. Part A. Physical science, Measurements and instrumentation, Management and education, Reviews. 1987, Vol 14, Num 7, pp 595-600, issn 0143-702XArticle

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Quasi-optical seven-port reflectometer for millimetre wavesCULLEN, A. L; XU, J. D.IEE proceedings. Part H. Microwaves, antennas and propagation. 1986, Vol 133, Num 6, pp 455-461, issn 0950-107XArticle

Finding initial estimates needed for the Engen method of calibrating single six-port reflectometersSTUMPER, U.IEEE transactions on microwave theory and techniques. 1990, Vol 38, Num 7, pp 946-949, issn 0018-9480, 4 p.Article

A simple fixed-frequency reflectometer for plasma density profile measurements on JETHUBBARD, A. E; COSTLEY, A. E; GOWERS, C. W et al.Journal of physics. E. Scientific instruments. 1987, Vol 20, Num 4, pp 423-427, issn 0022-3735Article

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Hanbit microwave plasma diagnostic systemKIM, B. C; LEE, K. D; HWANG, S. M et al.Surface & coatings technology. 1999, Vol 112, Num 1-3, pp 10-14, issn 0257-8972Conference Paper

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Observation of density fluctuations associated with the resonant q=2 surface in the Wendelstein VII-AS stellaratorSANCHEZ SANZ, J; HARTFUSS, H. J; ANABITARTE, E et al.Nuclear fusion. 1990, Vol 30, Num 11, pp 2383-2391, issn 0029-5515, 9 p.Article

Réalisation d'un réflectomètre à six accès dans la bande de fréquences millimétriques W (75-110 GHz) = Design and evaluation of a millimeter wave six-port reflectometer in the W frequency band (75-110 GHz)SOUBHI ABOUCHAHINE; HUYART, B; BERGEAULT, E et al.Annales des télécommunications. 1992, Vol 47, Num 11-12, pp 536-538, issn 0003-4347Conference Paper

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Reflectometry techniques for density profile measurements on fusion plasmasLAVIRON, C; DONNE, A. J. H; MANSO, M. E et al.Plasma physics and controlled fusion. 1996, Vol 38, Num 7, pp 905-936, issn 0741-3335Article

Source-pull measurements using reverse six-port reflectometers with application to MESFET mixter designDI-LUAN LE; GHANNOUCHI, F. M.IEEE transactions on microwave theory and techniques. 1994, Vol 42, Num 9, pp 1589-1595, issn 0018-9480, 1Article

Performance of an integrated six-port reflectometer operated with pulsed signalsCOLEF, G; ETTENBERG, M; KARMEL, P. R et al.IEEE transactions on instrumentation and measurement. 1990, Vol 39, Num 1, pp 189-194, issn 0018-9456Article

Using the least-squares boundary residual method to model the symmetrical five-port waveguide junctionCULLEN, A. L; YEO, S. P.IEE proceedings. Part H. Microwaves, antennas and propagation. 1987, Vol 134, Num 2, pp 116-124, issn 0950-107XArticle

A new comb reflectometer for the JET divertor plasmaCUPIDO, L; PRENTICE, R; BARTLETT, D. V et al.Plasma physics and controlled fusion. 1997, Vol 39, Num 2, pp 249-260, issn 0741-3335Article

Contribution à la détection non destructive par micro-ondes des discontinuités dans les matériaux = Contribution to microwave non destructive detection of discontinuities in materialsAbboud, Boufeldja; Pellissier, J.-P.1996, 122 p.Thesis

Microwave reflectometry with the extraordinary mode on tokamaks: determination of the electron density profile of Petula-BBOTTOLLIER-CURTET, H; ICHTCHENKO, G.Review of scientific instruments. 1987, Vol 58, Num 4, pp 539-546, issn 0034-6748Article