OPTIMISATION DE LA REPONSE EN FREQUENCES D'UN SYSTEME DE BALAYAGE OPTIQUEMINTS M YA; PRILEPSKIJ ED.1983; OPTIKA I SPEKTROSKOPIJA; ISSN 0030-4034; SUN; DA. 1983; VOL. 54; NO 4; PP. 718-724; BIBL. 16 REF.Article

BALAYAGE PAR UN MIROIR PLAN ISOLE DISPOSE DANS LA PARTIE ARRIERE DE L'OBJECTIFKOSHELEV VN; MITIN VP.1980; OPT.-MEH. PROM.; ISSN 0030-4042; SUN; DA. 1980; NO 8; PP. 23-24; BIBL. 2 REF.Article

ANALYSE DES BRUITS D'UN DISPOSITIF OPTICO-MECANIQUE A BALAYAGEGOS'KOV PI; ZAMYATIN NV; ZINOV'EV GG et al.1979; OPT.-MEKH. PROMYSHL.; SUN; DA. 1979; NO 6; PP. 11-13; BIBL. 3 REF.Article

CALCUL DES PARAMETRES FONDAMENTAUX DES SYSTEMES D'EXPLORATION A MIROIRSMITIN VP.1980; OPT.-MEH. PROM.; ISSN 0030-4042; SUN; DA. 1980; NO 7; PP. 21-23; BIBL. 9 REF.Article

LIMITATION DE LA VITESSE DE BALAYAGE DANS LES MONOCHROMATEURSPUSHKIN YU D.1979; OPT.-MEKH. PROMYSHL.; SUN; DA. 1979; NO 6; PP. 44-46; BIBL. 6 REF.Article

BALAYAGE ASSERVI DANS LES SYSTEMES D'EXPLORATION AVEC MIROIR POLYEDRIQUESTUPAK NA.1979; OPT.-MEKH. PROMYSHL.; SUN; DA. 1979; NO 5; PP. 3-5; BIBL. 4 REF.Article

MICROSCOPE ELECTRONIQUE A BALAYAGE COMME SYSTEME TVGOLUBEV VP.1981; RADIOTEKH. I ELEKTRON.; SUN; DA. 1981; VOL. 26; NO 4; PP. 826-833; BIBL. 6 REF.Article

LECTURE ACOUSTO-OPTIQUE D'IMAGESBALAKSHIJ VI; PARYGIN VN.1979; RADIOTEKH. I EHLEKTRON.; SUN; DA. 1979; VOL. 24; NO 8; PP. 1621-1629; BIBL. 5 REF.Article

ADVANCED ROTATING MIRROR LASER BEAM SCANNERKAMEYAMA Y; MASUKO H; KUTSUZAWA S et al.1979; N.H.K. LAB. NOTE; JPN; DA. 1979; NO 242; 10 P.; BIBL. 7 REF.Serial Issue

COMPUTER-INTERFEROMETRIC HOLOGRAMS USED FOR LASER BEAM SCANNERSGERBIG V.1981; OPT. COMMUN.; ISSN 0030-4018; NLD; DA. 1981; VOL. 36; NO 2; PP. 90-93; BIBL. 11 REF.Article

LASER BEAM SCANNERS CONSTRUCTED FROM HOLOGRAMSCASE SK; GERBIG V.1980; OPT. ENG.; ISSN 0091-3286; USA; DA. 1980; VOL. 19; NO 5; PP. 711-715; BIBL. 18 REF.Article

CHOIX DU SCHEMA D'UN DISPOSITIF DE BALAYAGE OPTICO-MECANIQUE POUR INSCRIPTION LASERKISELEV NG.1980; OPT.-MEKH. PROMYSHL.; SUN; DA. 1980; NO 5; PP. 8-11; BIBL. 4 REF.Article

GRATING ACOUSTIC SCANNER USING BULK ACOUSTIC WAVESCHEN WH; LEAN EG.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 3; PP. 141-143; BIBL. 3 REF.Article

SCANNING ELECTRON MICROSCOPY 1981, CONFERENCE, (DALLAS TX, APRIL 14-18,) 19811981; SCANNING ELECTRON MICROSCOPY 1981. CONFERENCE/1981-04-14/DALLAS TX; USA; AMF O'HARE IL: SCANNING ELECTRON MICROSCOPY; DA. 1981; VOL. 2-3; 2 VOL.; 29 CMConference Proceedings

EFFICIENT AND FLEXIBLE LASER BEAM SCANNERS CONSTRUCTED FROM VOLUME HOLOGRAMSCASE SK; GERBIG V.1981; OPT. COMMUN.; ISSN 0030-4018; NLD; DA. 1981; VOL. 36; NO 2; PP. 94-100; BIBL. 24 REF.Article

LE MICROSCOPE ELECTRONIQUE A BALAYAGE ET LA MICROANALYSE X A SELECTION D'ENERGIE. I: LE MICROSCOPE ELECTRONIQUE A BALAYAGE ET SES APPLICATIONS EN METALLURGIE = SCANNING ELECTRON MICROSCOPY AND ENERGY SELECTION ANALYSIS. I. THE SCANNING ELECTRON MICROSCOP AND ITS APPLICATIONS IN METALLURGIEMOLINS R.1980; J. FOUR ELECTR. IND. ELECTROCHIM.; ISSN 0021-8189; FRA; DA. 1980; NO 6; PP. 17-28; 8 P.; ABS. ENGArticle

PHASED-ARRAY OPTICAL SCANNINGHUGHES JL; GHATAK AK.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 13; PP. 2098; BIBL. 1 REF.Article

PIEZOELECTRIC BIMORPH OPTICAL BEAM SCANNERS: ANALYSIS AND CONSTRUCTIONLEE JK.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 4; PP. 454-459; BIBL. 14 REF.Article

DESIGNERS' NOTEBOOK. 16-CHANNEL SCANNER REQUIRES 6 ICS.1976; DIGIT. DESIGN; U.S.A.; DA. 1976; VOL. 6; NO 9; PP. 60-62 (2P.)Article

A MODIFIED SPECIMEN STUB FOR THE EASY EXAMINATION OF ALL SURFACES OF SPECIMENS BY SCANNING ELECTRON MICROSCOPY.AUSTIN JC; CLEATON JONES P.1976; STAIN TECHNOL.; U.S.A.; DA. 1976; VOL. 51; NO 5; PP. 281-282Article

LOW TEMPERATURE SCANNING ELECTRON MICROSCOPY: A REVIEW.ECHLIN P.1978; J. MICR.; G.B.; DA. 1978; VOL. 112; NO 1; PP. 47-61; BIBL. 2 P.Article

ELECTROPHOTOMETRE A BALAYAGEKALINENKOV ND.1975; NOV. TEKH. ASTR.; S.S.S.R.; DA. 1975; NO 5; PP. 53-55; BIBL. 4 REF.Article

PHOTOMETRE A BALAYAGETEREBIZH V YU.1981; ASTRON. CIRK., IZD. BJURO ASTRON. SOOBSC. AKAD. NAUK SSSR; ISSN 0373-191X; SUN; DA. 1981; NO 1188; PP. 3-6Article

A SPECIMEN ORIENTATION, PREVIEW, AND MOUNTING DEVICE FOR SCANNING ELECTRON MICROSCOPYREDMOND BL.1979; STAIN TECHNOL.; USA; DA. 1979; VOL. 54; NO 5; PP. 290-292; BIBL. 3 REF.Article

AUGMENTED LASER SCAN EQUATIONS.BEISER L.1978; APPL. OPT.; U.S.A.; DA. 1978; VOL. 17; NO 8; PP. 1161-1162; BIBL. 4 REF.Article