The three-dimensional (3-D) transmission cross-coefficient for transmission imagingSHEPPARD, C. J. R; GU, M.Optik (Stuttgart). 1995, Vol 100, Num 4, pp 155-158, issn 0030-4026Article

First results of a positron microscopeVAN HOUSE, J; RICH, A.Physical review letters. 1988, Vol 60, Num 3, pp 169-172, issn 0031-9007Article

Transmission positron microscopesDOYAMA, Masao; KOGURE, Yoshiaki; INOUE, Miyoshi et al.Applied surface science. 2006, Vol 252, Num 9, pp 3126-3131, issn 0169-4332, 6 p.Conference Paper

High resolution, top entry goniometers for use in the JEOL transmission electron microscopesDONOVAN, P; EVERATT, P; SELF, P. G et al.Journal of physics. E. Scientific instruments. 1983, Vol 16, Num 12, pp 1242-1246, issn 0022-3735Article

Three-dimensional imaging by a microscopeSTREIBL, N.Journal of the Optical Society of America A, Optics and image science. 1985, Vol 2, Num 2, pp 121-127Article

SINGLE LENS TRANSMISSION SCANNING ACOUSTIC MICROSCOPEMOROZOV AI; KULAKOV MA.1980; ELECTRON LETTERS; GBR; DA. 1980; VOL. 16; NO 15; PP. 596-597; BIBL. 8 REF.Article

OPTIMIZATION OF A TRANSMISSION ACOUSTIC MICROSCOPE.BRIDOUX E; NONGAILLARD B; ROUVAEN JM et al.1978; J. APPL. PHYS.; U.S.A.; DA. 1978; VOL. 49; NO 2; PP. 574-579; BIBL. 4 REF.Article

ACOUSTIC MICROSCOPYNONGAILLARD B.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 423-431; BIBL. 8 REF.Conference Paper

DELINEATION OF SHALLOW JUNCTIONS IN SILICON BY TRANSMISSION ELECTRON MICROSCOPYSHENG TT; MARCUS RB.1981; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1981; VOL. 128; NO 4; PP. 881-884; BIBL. 10 REF.Article

SCANNING TRANSMISSION ELECTRON MICROSCOPY: MICROANALYSIS FOR THE MICROELECTRONIC AGEBROWN LM.1981; J. PHYS. F; ISSN 0305-4608; GBR; DA. 1981; VOL. 11; NO 1; PP. 1-26; BIBL. 2 P.Article

ELECTRON IMAGING TECHNIQUESWADE RH.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 336-346; BIBL. 33 REF.Conference Paper

A PRACTICAL PROCEDURE FOR ALIGNMENT OF A HIGH RESOLUTION ELECTRON MICROSCOPEZEMLIN F.1979; ULTRAMICROSCOPY; NLD; DA. 1979; VOL. 4; NO 2; PP. 241-245; BIBL. 3 REF.Article

A TV SYSTEM FOR IMAGE RECORDING AND PROCESSING IN CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPY.HERRMANN KH; KRAHL D; RUST HP et al.1978; ULTRAMICROSCOPY; NLD; DA. 1978; VOL. 3; NO 2; PP. 227-235; BIBL. 9 REF.Article

INTERSTITIAL SUPERSATURATION NEAR PHOSPHORUS-DIFFUSED EMITTER ZONES IN SILICONSTRUNK H; GOSELE U; KOLBESEN BO et al.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 8; PP. 530-532; BIBL. 17 REF.Article

TRANSMISSION SCANNING ACOUSTIC MICROSCOPY WITH APPLICATIONS TO NONDESTRUCTIVE TESTING AND EVALUATIONTSAI CS; LEE CC; WANG JK et al.1979; INTERNATION. LAB.; USA; DA. 1979; VOL. 9; NO 3; PP. 89-92; (3 P.); BIBL. 5 REF.Article

TRANSMISSION SCANNING ACOUSTIC MICROSCOPY: WITH APPLICATIONS TO NONDESTRUCTIVE TESTING AND EVALUATIONTSAI CS; LEE CC; WANG JK et al.1979; AMER. LAB.; USA; DA. 1979; VOL. 11; NO 4; PP. 16-22; (3 P.); BIBL. 5 REF.Article

IMAGE DE L'OBJET DANS UN MICROSCOPE ELECTRONIQUE A TRANSMISSION EN PRESENCE DE CHAMPS ELECTRIQUESBUNDZA BP; KULYUPIN YU A; NEPIJKO SA et al.1979; ZH. TEKH. FIZ.; SUN; DA. 1979; VOL. 49; NO 1; PP. 130-133; BIBL. 3 REF.Article

A DETECTION METHOD FOR PRODUCING PHASE AND AMPLITUDE IMAGES SIMULTANEOUSLY IN A SCANNING TRANSMISSION ELECTRON MICROSCOPE.DEKKERS NH; DE LANG H.1977; PHILIPS TECH. REV.; NETHERL.; DA. 1977; VOL. 37; NO 1; PP. 1-9; BIBL. 16 REF.Article

BOND INTEGRITY EVALUATION USING TRANSMISSION SCANNING ACOUSTIC MICROSCOPYSINCLAIR DA; ASH EA.1980; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1980; VOL. 16; NO 23; PP. 880-882; BIBL. 5 REF.Article

COURBE UNIVERSELLE DE GROSSISSEMENT POUR LE MICROSCOPE ELECTRONIQUE A TRANSMISSIONPILYANKEVICH AN; KLIMOVITSKIJ AM; BELODED RM et al.1977; ZAVODSK. LAB.; S.S.S.R.; DA. 1977; VOL. 43; NO 11; PP. 1365-1366; BIBL. 2 REF.Article

INTERSTITIAL SUPERSATURATION AND CLIMB OF MISFIT DISLOCATIONS IN PHOSPHORUS-DIFFUSED SILICONSTRUNK H; GOESELE U; KOLBESEN BO et al.1980; J. MICR.; GBR; DA. 1980; VOL. 118; NO 1; PP. 35-39; BIBL. 20 REF.Article

NEUES KONZEPT BEIM BAU VON MIKROSKOPEN = NOUVEAU CONCEPT DANS LA CONSTRUCTION D'UN MICROSCOPE1980; G.I.T., FACHZ. LAB.; DEU; DA. 1980; VOL. 24; NO 1; PP. 64-65Article

2 1/2 D ELECTRON MICROSCOPY: THROUGH-FOCUS DARK-FIELD IMAGE SHIFTS.BELL WL.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 4; PP. 1676-1682; BIBL. 19 REF.Article

In situ laser heating in a scanning transmission electron microscopeHODGSON, R. T; BOEBINGER, G. S; BATSON, P. E et al.Applied physics letters. 1983, Vol 43, Num 9, pp 881-883, issn 0003-6951Article

Image-based wave front sensorless adaptive opticsBOOTH, Martin J; DEBARRE, Delphine; WILSON, Tony et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 671102.1-671102.7, issn 0277-786X, isbn 978-0-8194-6859-8Conference Paper