Low workfunction fully silicided gate on SiO₂/Si and LaAlO₃/GOI n-MOSFETsYU, D. S; CHIN, Albert; HUNG, B. F et al.DRC : Device research conference. 2004, pp 21-22, isbn 0-7803-8284-6, 1Vol, 2 p.Conference Paper

The Kelvin probe method for work function topographies: technical problems and solutionsBONNET, J; SOONCKINDT, L; LASSABATERE, L et al.Vacuum. 1984, Vol 34, Num 7, pp 693-698, issn 0042-207XArticle

Contributions to the work function of crystalsWEINERT, M; WATSON, R. E.Physical review. B, Condensed matter. 1984, Vol 29, Num 6, pp 3001-3008, issn 0163-1829Article

Work function of Rydberg matter surfaces from jellium calculationsSVANBERG, M; HOLMLID, L.Surface science. 1994, Vol 315, Num 1-2, pp L1003-L1006, issn 0039-6028Article

Effects of atomic scale roughness at metal/insulator interfaces on metal work functionSANLIANG LING; WATKINS, Matthew B; SHLUGER, Alexander L et al.PCCP. Physical chemistry chemical physics (Print). 2013, Vol 15, Num 45, pp 19615-19624, issn 1463-9076, 10 p.Article

Scandate cathode for TWTWANG SHUGUANG.Applied surface science. 2005, Vol 251, Num 1-4, pp 114-119, issn 0169-4332, 6 p.Conference Paper

Work function of carbon nanotubesSHIRAISHI, Masashi; ATA, Masafumi.Carbon (New York, NY). 2001, Vol 39, Num 12, pp 1913-1917, issn 0008-6223Article

Structure and properties of a beryllium dilayerBOETTGER, J. C; TRICKEY, S. B.Physical review. B, Condensed matter. 1985, Vol 32, Num 2, pp 1356-1358, issn 0163-1829Article

Macroscopic theory of the electron work function in solidsFAZYLOV, F. R.Philosophical magazine (2003. Print). 2014, Vol 94, Num 16-18, pp 1956-1966, issn 1478-6435, 11 p.Article

Influence of cyclic stresses upon the electronic work function for the metal surfaceLEVITIN, V. V; LOSKUTOV, S. V; PRAVDA, M. I et al.Solid state communications. 1994, Vol 92, Num 12, pp 973-976, issn 0038-1098Article

NATURE OF THE STABLE OXIDE LAYER FORMED ON AN ALUMINUM SURFACE BY WORK FUNCTION MEASUREMENTSAGARWALA VK; FORT T JR.1976; SURF. SCI.; NETHERL.; DA. 1976; VOL. 54; NO 1; PP. 60-70; BIBL. 7 REF.Article

Calculation of the work function with a local basis setDOLL, K.Surface science. 2006, Vol 600, Num 24, issn 0039-6028, L321-L325Article

Negative Poisson's ratios as a common feature of cubic metalsBAUGHMAN, R. H; SHACKLETTE, J. M; ZAKHIDOV, A. A et al.Nature (London). 1998, Vol 392, Num 6674, pp 362-365, issn 0028-0836Article

Predicting cathode life expectancy and emission quality from PWFD measurementsCATTELINO, M; MIRAM, G.Applied surface science. 1997, Vol 111, pp 90-95, issn 0169-4332Conference Paper

Technology and emission properties of dispenser cathode with controlled porosityCHUBUN, N. N; SUDAKOVA, L. N.Applied surface science. 1997, Vol 111, pp 81-83, issn 0169-4332Conference Paper

Work functions for models of scandate surfacesMÜLLER, W.Applied surface science. 1997, Vol 111, pp 30-34, issn 0169-4332Conference Paper

Work function of an electron of single crystals of yttrium and lanthanoidsFOMENKO, V. S.Poroškovaâ metallurgiâ (Kiev). 1994, Num 1-2, pp 92-97, issn 0032-4795Article

An apparent paradox in the thermodynamics of Fermi levels = Un paradoxe apparent dans la thermodynamique des niveaux de FermiROSE, A; WILLIAMS, R.Solid state communications. 1985, Vol 53, Num 6, pp 537-538, issn 0038-1098Article

Extended-muffin-tin-orbital energy-band method for a filmKASOWSKI, R. V; MIN-HSIUNG TSAI.Physical review. B, Condensed matter. 1984, Vol 29, Num 2, pp 1043-1047, issn 0163-1829Article

Work functions and effective masses of positons in metals = Travaux de sortie et masses effectives des positons dans les métauxFLETCHER, G; FRY, J. L; PATTNAIK, P. C et al.Physical review. B, Condensed matter. 1983, Vol 27, Num 7, pp 3987-3991, issn 0163-1829Article

Thickness contrast of few-layered graphene in SEMPARK, Min-Ho; KIM, Tae-Hoon; YANG, Cheol-Woong et al.Surface and interface analysis. 2012, Vol 44, Num 11-12, pp 1538-1541, issn 0142-2421, 4 p.Conference Paper

Interface properties and effective work function of Sb-predoped fully silicided NiSi gateHOSOI, Takuji; SANO, Kosuke; OHTA, Akio et al.Surface and interface analysis. 2008, Vol 40, Num 6-7, pp 1126-1130, issn 0142-2421, 5 p.Conference Paper

Tunable work function dual metal gate technology for bulk and non-bulk CMOSLEE, Jaehoon; HUICAI ZHONG; SUH, You-Seok et al.IEDm : international electron devices meeting. 2002, pp 359-362, isbn 0-7803-7462-2, 4 p.Conference Paper

Work function measurements of contact materials for industrial useAKBI, M; LEFORT, A.Journal of physics. D, Applied physics (Print). 1998, Vol 31, Num 11, pp 1301-1308, issn 0022-3727Article

Measurement of work function using an electron gun in the retarding field regimeBEN-SHALOM, A; SEIDMAN, A; CROITORU, N et al.Thin solid films. 1990, Vol 186, Num 2, pp L55-L59, issn 0040-6090Article