Quantitative lateral resolution of a Quantum 2000 X-ray microprobeSCHEITHAUER, U.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 706-709, issn 0142-2421, 4 p.Conference Paper

Increment of lateral resolution in digital holography by speckle noise removalMONROY, Freddy Alberto; GARCIA-SUCERQUIA, Jorge.Optik (Stuttgart). 2010, Vol 121, Num 22, pp 2049-2052, issn 0030-4026, 4 p.Article

Metallic cylindrical focusing micromirrors with long axial focal depth or increased lateral resolutionMEI, Guo-Ai; YE, Jia-Sheng; YAN ZHANG et al.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2011, Vol 28, Num 6, pp 1051-1057, issn 1084-7529, 7 p.Article

3D optical microscopy using digital holographySTERN, A; JAVIDI, Bahram.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6983, pp 69830O.1-69830O.9, issn 0277-786X, isbn 978-0-8194-7181-9 0-8194-7181-XConference Paper

Embedded 3D vision system for automated micro-assemblyMURE-DUBOIS, James; HÜGLI, Heinz.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 63820J.1-63820J.11, issn 0277-786X, isbn 0-8194-6480-5, 1VolConference Paper

A novel ToF-SIMS operation mode for sub 100 nm lateral resolution: Application and performanceKUBICEK, Markus; HOLZLECHNER, Gerald; OPITZ, Alexander K et al.Applied surface science. 2014, Vol 289, pp 407-416, issn 0169-4332, 10 p.Article

The set of the detection and resolution criteria for a phase modulation microscopeANDREEV, Vladimir A; INDUKAEV, Konstantin V.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 61650E.1-61650E.13, issn 0277-786X, isbn 0-8194-6217-9, 1VolConference Paper

Theory & applications of multi-beam OCTHOLMES, Jon.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7139, issn 0277-786X, isbn 978-0-8194-7380-6, 1Vol, 713908.1-713908.7Conference Paper

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Lateral resolution of secondary ion mass spectrometry-results of an inter-laboratory comparisonSENONER, M; UNGER, W. E. S.Surface and interface analysis. 2007, Vol 39, Num 1, pp 16-25, issn 0142-2421, 10 p.Article

Quantitative assessment of lateral resolution improvement in digital holographyMONROY, Freddy; RINCON, Oscar; MARCELA TORRES, Yaneth et al.Optics communications. 2008, Vol 281, Num 13, pp 3454-3460, issn 0030-4018, 7 p.Article

Two-dimensional Observation of Emission Image of a Copper Chip Excited in a Glow Discharge PlasmaMATSUURA, Munehiko; WAGATSUMA, Kazuaki.ISIJ international. 2013, Vol 53, Num 11, pp 1923-1926, issn 0915-1559, 4 p.Article

Paired-Angle Multiplicative CompoundingMACIONE, James; ZHI YANG; FOX, Martin et al.Ultrasonic imaging (Print). 2008, Vol 30, Num 2, pp 112-130, issn 0161-7346, 19 p.Article

Summary of ISO/TC 201 Standard: XXX. ISO 18516: 2006 -Surface chemical analysis -Auger electron spectroscopy and X-ray photoelectron spectroscopy -Determination of lateral resolutionWOLSTENHOLME, J.Surface and interface analysis. 2008, Vol 40, Num 5, pp 966-968, issn 0142-2421, 3 p.Article

BAM-L002: a new type of certified reference material for length calibration and testing of lateral resolution in the nanometre rangeSENONER, M; WIRTH, Th; UNGER, W et al.Surface and interface analysis. 2004, Vol 36, Num 10, pp 1423-1426, issn 0142-2421, 4 p.Article

Summary of ISO/TC 201 Technical Report: ISO/TR 19319: 2003: Surface chemical analysis: Auger electron spectroscopy and x-ray photoelectron spectroscopy: Determination of lateral resolution, analysis area and sample area viewed by the analyserPOWELL, C. J.Surface and interface analysis. 2004, Vol 36, Num 7, pp 666-667, issn 0142-2421, 2 p.Article

Study and optimisation of SIMS performed with He⁺ and Ne⁺ bombardmentPILLATSCH, L; VANHOVE, N; DOWSETT, D et al.Applied surface science. 2013, Vol 282, pp 908-913, issn 0169-4332, 6 p.Article

Parallel atomic force microscopy using optical heterodyne detectionCHANTADA, Laura; KIM, Myun-Sik; MANZARDO, Omar et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 61860B.1-61860B.7, issn 0277-786X, isbn 0-8194-6242-X, 1VolConference Paper

Force microscopy with light-atom probesHEMBACHER, Stefan; GIESSIBL, Franz J; MANNHART, Jochen et al.Science (Washington, D.C.). 2004, Vol 305, Num 5682, pp 380-383, issn 0036-8075, 4 p.Article

Computer simulation of the AFM/LFM imaging process: Hexagonal versus honeycomb structure on graphiteVON TOUSSAINT, U; SCHIMMEL, T; KÜPPERS, J et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 620-625, issn 0142-2421Conference Paper

Lateral resolution in elastographyRIGHETTI, Raffaella; SRINIVASAN, Seshadri; OPHIR, Jonathan et al.Ultrasound in medicine & biology. 2003, Vol 29, Num 5, pp 695-704, issn 0301-5629, 10 p.Article

Resolution of aplanatic solid immersion lens based microscopyRUI CHEN; AGARWAL, Krishna; SHEPPARD, Colin J. R et al.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2012, Vol 29, Num 6, pp 1059-1070, issn 1084-7529, 12 p.Article

Optical probe using eccentric optics for optical coherence tomographyTAKAHASHI, Yoshiyuki; IWAYA, Mitsuharu; WATANABE, Yuuki et al.Optics communications. 2007, Vol 271, Num 1, pp 285-290, issn 0030-4018, 6 p.Article

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