Field Emission '98 Proceedings of the 45th Internatonal Field Emission SymposiumMOUSA, M. S; DANOIX, F.Ultramicroscopy. 1999, Vol 79, Num 1-4, issn 0304-3991, 317 p.Conference Proceedings

Field emission characteristics research of some types of carbon fibresSHESHIN, E. P; ANASHCHENKO, A. V; KUZMENKO, S. G et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 109-114, issn 0304-3991Conference Paper

Field emission from diamond and related filmsXU, N. S.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 59-72, issn 0304-3991Conference Paper

Droplet emission from liquid metal ion sources and their disintegrationTZVETKOV, T; DRANDAROV, N.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 217-224, issn 0304-3991Conference Paper

Field emission of carbon fibersSHESHIN, E. P.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 101-108, issn 0304-3991Conference Paper

The resonant field electron emission from DLC filmLI, D.-C; LIU, G.-J; YANG, Y.-T et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 83-87, issn 0304-3991Conference Paper

Explosive phenomenon during the interaction of NO with AgBÄR, T; VISART DE BOCARME, T; KRUSE, N et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 245-249, issn 0304-3991Conference Paper

Refining the application of Fowler-Nordheim theoryFORBES, R. G.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 11-23, issn 0304-3991Conference Paper

Remote atom probe field ion microscopyMILLER, M. K; LARSON, D. J.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 259-264, issn 0304-3991Conference Paper

The electrical surface as centroid of the surface-induced chargeFORBES, R. G.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 25-34, issn 0304-3991Conference Paper

Some aspects of image projection in the field-ion microscopeCEREZO, A; WARREN, P. J; SMITH, G. D. W et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 251-257, issn 0304-3991Conference Paper

Thermal instability of molybdenum and silicon tipsYU, Z. X; DENG, S. Z; WU, S. S et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 125-129, issn 0304-3991Conference Paper

Measurements of modulation of the total emitted current in laser-assisted field emissionBRUGAT, M; HAGMANN, M. J.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 181-188, issn 0304-3991Conference Paper

Stability consideration of metal-diamond-vacuum micro-emission regimesDENG, S. Z; YU, Z. X; XU, N. S et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 95-100, issn 0304-3991Conference Paper

Tunneling in a double-barrier system and its practical implications for field ionization and field emissionKNOR, Z.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 1-10, issn 0304-3991Conference Paper

Electron motion and confinement in the orbitip vacuum gauge. II. Modelling resultsNICOLAESCU, D; FILIP, V; OKUYAMA, F et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 167-174, issn 0304-3991Conference Paper

Methods for atom probe study of near surface zones in cemented carbidesFRYKHOLM, R; ANDREN, H.-O.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 283-286, issn 0304-3991Conference Paper

A comparison between quantitative EELS and APFIM microanalysis of carbonitride grains in cermetsZACKRISSON, J; GROGGER, W; HOFER, F et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 273-281, issn 0304-3991Conference Paper

A novel approach to gaseous field ion sources for focused ion beam applicationsMILLER, M. K; SIJBRANDIJ, S. J.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 225-230, issn 0304-3991Conference Paper

Studies of field emission current from amorphous silicon deposited on a tungsten tipSHARMA, R. B; PRADEEP, N; JOAG, D. S et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 131-134, issn 0304-3991Conference Paper

Study of the MgO-coated W emitters by field emission microscopyMOUSA, M. S; AL SHARE, M.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 195-202, issn 0304-3991Conference Paper

Electrons motion and confinement in the orbitip vacuum gauge. I. TheoryFILIP, V; NICOLAESCU, D; OKUYAMA, F et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 159-166, issn 0304-3991Conference Paper

Enhanced field emission from carbide-coated field emitters, and device applicationsCHARBONNIER, F. M; MACKIE, W. A; XIE, T et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 73-82, issn 0304-3991Conference Paper

FIM studies of clean and graphitized rhodium using lithium and oxygen as imaging speciesMEDVEDEV, V. K; SUCHORSKI, Yu; VISART DE BOCARME, T et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 239-244, issn 0304-3991Conference Paper

Simulations of photon-assisted field emission : Their significance in basic science and device applicationsHAGMANN, M. J.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 115-124, issn 0304-3991Conference Paper