Optical probing of ultrafast devices and integrated circuitsOptical and quantum electronics. 1996, Vol 28, Num 7, issn 0306-8919, 279 p.Serial Issue

Full wave electromagnetic simulation of electrooptic high-speed probesCONN, D; WU, H. X; ZHANG, M et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 765-782, issn 0306-8919Article

Analysis of microwave propagation effects using two-dimensional electrooptic field mapping techniquesDAVID, G; JÄGER, D; TEMPEL, R et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 919-932, issn 0306-8919Article

A proposed semiconductor laser pump-probe sourceVICKERS, A. J; ALLESTON, S; GUPTA, R et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 983-989, issn 0306-8919Article

Ultrafast electrical signal generation, propagation and detectionDYKAAR, D. R; KEIL, U. D.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 731-764, issn 0306-8919Article

Electrooptic sampling of freely propagating terahertz fieldsWU Q; ZHANG, X.-C.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 945-951, issn 0306-8919Article

Separating temporally-overlapped waveforms with electrooptic samplingSHAH, S. A; ZENG, A; WONG, W. S et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 953-960, issn 0306-8919Article

Modulation bandwidth and noise limit of photoconductive gatesHWANG, J. R; CHENG, H. J; WHITAKER, J. F et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 961-973, issn 0306-8919Article

Electrooptic sampling of low temperature GaAs pulse generators for oscilloscope calibrationSMITH, A. J. A; RODDIE, A. G; HENDERSON, D et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 933-943, issn 0306-8919Article

Optoelectronic techniques for ultrafast device network analysis to 700 GHzFRANKEL, M. Y.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 783-800, issn 0306-8919Article

Scanning probe microscopy for testing ultrafast electronic devicesHOU, A. S; NECHAY, B. A; HO, F et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 819-841, issn 0306-8919Article

A new method for characterizing ultrafast resonant-tunnelling diodes with electrooptic samplingSHIMIZU, N; NAGATSUMA, T; WAHO, T et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 897-905, issn 0306-8919Article

Ultrafast characterization of in-plane-gate field-effect transistors : parasitics in laterally gated transistorsOGAWA, K; ALLAM, J; BAYNES, N. DE B et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 907-917, issn 0306-8919Article

Two-dimensional field mapping of monolithic microwave integrated circuits using electrooptic sampling techniquesMERTIN, W.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 801-817, issn 0306-8919Article

Ultrafast-ultrafine probing of high-speed electrical waveforms using a scanning force microscope with photoconductive gatingNEES, J; WAKANA, S.-I; HAMA, S et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 843-865, issn 0306-8919Article

Monolithically-integrated optoelectronic circuit for ultrafast sampling of a dual-gate field-effect transistorALLAM, J; BAYNES, N. DE B; CLEAVER, J. R. A et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 875-896, issn 0306-8919Article

Electrooptic charaterization of modulation-doped field-effect transistors with monolithically-integrated test fixturesZENG, A; JACKSON, M. K; VAN HOVE, M et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 867-874, issn 0306-8919Article

Precise analysis of linear and non-linear chirp parameters of gain-switched distributed feedback laser pulses for the fibre optic compression schemeTSUCHIYA, M; TAKESHITA, H; KAMIYA, T et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 975-982, issn 0306-8919Article

Widely tunable electrooptic pulse-pattern generation and its application to on-wafer large-signal characterization of ultra high-speed electronic devicesOTSUJI, T; NAGATSUMA, T; KATO, K et al.Optical and quantum electronics. 1996, Vol 28, Num 7, pp 991-1005, issn 0306-8919Article