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Oven-Based Thermally Tunable Aluminum Nitride MicroresonatorsKIM, Bongsang; NGUYEN, Janet; WOJCIECHOWSKI, Kenneth E et al.Journal of microelectromechanical systems. 2013, Vol 22, Num 2, pp 265-275, issn 1057-7157, 11 p.Article

SROP and DROP Spectra with Alkali Atomic Vapor Cell and ApplicationsWANG, Junmin; LIANG, Qiangbing; GAO, Jing et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8072, issn 0277-786X, isbn 978-0-8194-8662-2, 80720W.1-80720W.9Conference Paper

Time and frequency metrology at PTB: recent resultsGERGINOV, Vladislav.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8132, issn 0277-786X, isbn 978-0-8194-8742-1, 81320H.1-81320H.6Conference Paper

Étalonnage d'un analyseur de réseau vectoriel à partir d'un atténuateur pour des mesures sous pointes = Attenuator based vector network analyser calibration for on-wafer measurementsALLAL, Djamel; BAHOUCHE, Mebrouk; BERGEAULT, Eric et al.Revue française de métrologie. 2010, Num 23, pp 21-25, issn 1772-1792, 5 p.Article

Atlas of Thorium standard spectrum for the grating 1300 lines/mm mounted at PGS-2 spectrographDOMIN, Jan; BLICHARZ, Łukasz; MAJOWICZ, Janusz et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7745, issn 0277-786X, isbn 9780819472358, 77450N.1-77450N.18Conference Paper

Feasibility study for rapid determination of alanine aminotransferase concentration in whole blood by using visible and near infrared spectroscopyFURONG HUANG; ZHE CHEN; JIANHUI YU et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7845, issn 0277-786X, isbn 978-0-8194-8375-1, 78450O.1-78450O.8Conference Paper

Modélisation du comportement thermique d'un calorimètre de référence pour la mesure du pouvoir calorifique des gaz = Thermal behaviour modelisation of a reference calorimeter used to measure the gas calorific valueVILLERMAUX, Clotilde; HALOUA, Frédérique; ZAREA, Mures et al.Revue française de métrologie. 2009, Num 17, pp 29-34, issn 1772-1792, 6 p.Article

Noise-immune laser receiver-transmitters with the quantum sensitivity limitKUTAEV, Yu. F; MANKEVICH, S. K; NOSACH, O. Yu et al.Quantum electronics (Woodbury). 2009, Vol 39, Num 11, pp 1008-1017, issn 1063-7818, 10 p.Article

Analyse de la qualité de l'énergie électrique: mesure du Flicker = Power quality analysis: measurement of FlickerESPEL, Patrick.Revue française de métrologie. 2009, Num 20, pp 39-46, issn 1772-1792, 8 p.Article

On coaxial microcalorimeter calibrationBRUNETTI, L; OBERTO, L.EPJ. Applied physics (Print). 2008, Vol 43, Num 2, pp 239-244, issn 1286-0042, 6 p.Article

Summary of ISO/TC 201 Standard: XXX. ISO 18516: 2006 -Surface chemical analysis -Auger electron spectroscopy and X-ray photoelectron spectroscopy -Determination of lateral resolutionWOLSTENHOLME, J.Surface and interface analysis. 2008, Vol 40, Num 5, pp 966-968, issn 0142-2421, 3 p.Article

Data acquisition card for CERN Proton Synchrotron beam current transformersKASPROWICZ, Grzegorz.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6937, pp 69370V.1-69370V.9, issn 0277-786X, isbn 978-0-8194-7124-6 0-8194-7124-0, 2Conference Paper

An experimental study of intermodulation effects in an atomic fountain frequency standardGUENA, J; DUDLE, G; THOMANN, P et al.EPJ. Applied physics (Print). 2007, Vol 38, Num 2, pp 183-189, issn 1286-0042, 7 p.Article

Summary of ISO/TC 201 standard: XXVIII, ISO 18115:2001/amd. 1:2006 - : Surface chemical analysis -vocabulary -amendment 1SEAH, M. P.Surface and interface analysis. 2007, Vol 39, Num 4, pp 367-369, issn 0142-2421, 3 p.Article

Unités de mesure SILEGENT, Nicole.Techniques de l'ingénieur. Génie mécanique. 2007, Vol BL1, Num 23v2, issn 1762-8768, 23v2.1-23v2.16, doc23v2.1-2 [18 p.]Article

Advances in Chip-Scale Atomic Frequency References at NISTKNAPPE, S; SHAH, V; BRANNON, A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 667307.1-667307.10, issn 0277-786X, isbn 978-0-8194-6821-5, 1VolConference Paper

Unités de mesure SILEGENT, Nicole.Techniques de l'ingénieur. Constantes physico-chimiques. 2006, Vol K1, Num 23v2, issn 0245-9604, 23v2.1-23v2.18Article

Le système international d'unités ((SI)) = The International system of units (SI)2006, isbn 92-822-2213-6, 1Vol, 180 p., isbn 92-822-2213-6Book

Interrogation d'un ion unique pour la métrologie optique = Interrogation of a single ion for optical metrologyHAGEL, G; CHAMPENOIS, C; LISOWSKI, C et al.Journal de physique. IV. 2006, Vol 135, pp 163-164, issn 1155-4339, 2 p.Conference Paper

Absolute frequency measurement of rubidium 5S-7S two-photon transitions with a femtosecond laser combCHUI, Hsiang-Chen; KO, Ming-Sheng; LIU, Yi-Wei et al.Optics letters. 2005, Vol 30, Num 8, pp 842-844, issn 0146-9592, 3 p.Article

Summary of iso/tc 201 standard: XIX ISO 17331 : 2004 -surface chemical analysis-chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection x-ray fluorescence (TXRF) spectroscopyMORI, Yoshihiro.Surface and interface analysis. 2005, Vol 37, Num 5, pp 522-523, issn 0142-2421, 2 p.Article

États de surface: CaractérisationRAPHET, Bernard.Techniques de l'ingénieur. Mesures et contrôle. 2005, Vol RD1, Num R1230, issn 0399-4147, R1230.1-R1230.22, docR1390v2.1 [23 p.]Article

A single indium ion optical frequency standardVON ZANTHIER, J; EICHENSEER, M; NEVSKY, A. Yu et al.Laser physics. 2005, Vol 15, Num 7, pp 1021-1027, issn 1054-660X, 7 p.Conference Paper

Frequency comparisons and absolute frequency measurements of 171Yb+ single-ion optical frequency standardsPEIK, E; LIPPHARDT, B; SCHNATZ, H et al.Laser physics. 2005, Vol 15, Num 7, pp 1028-1033, issn 1054-660X, 6 p.Conference Paper

Frequency comparison between two atomic fountain clocks at the 10-16 levelVIAN, C; ROSENBUSCH, P; LUITEN, A et al.Annales françaises des microtechniques et de chronométrie. 2005, Vol 75, Num 54, pp 83-88, issn 0294-1228, 6 p.Conference Paper

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