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In situ study of ligand-receptor interaction by total internal reflection ellipsometryBALEVICIUS, Z; BALEVICIUTE, I; TUMENAS, S et al.Thin solid films. 2014, Vol 571, pp 744-748, issn 0040-6090, 5 p., 3Conference Paper

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Surface roughness and optical contact characterization of transparent prisms using frustrated total internal reflection tunneling ellipsometryAZZAM, R. M. A.Thin solid films. 2014, Vol 571, pp 666-668, issn 0040-6090, 3 p., 3Conference Paper

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Transmission optimization of multilayer OLED encapsulation based on spectroscopic ellipsometryTO, C. H; WONG, F. L; LEE, C. S et al.Thin solid films. 2013, Vol 549, pp 22-29, issn 0040-6090, 8 p.Conference Paper

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