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Description of anisotropically microstrain-broadened line profiles by Edgeworth seriesLEINEWEBER, Andreas.Zeitschrift für Kristallographie. 2009, Vol 224, Num 9, pp 432-445, issn 0044-2968, 14 p.Article

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Depth profiling of marker layers using x-ray waveguide structuresGUPTA, Ajay; RAJPUT, Parasmani; SARAIYA, Amit et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 7, pp 075436.1-075436.8, issn 1098-0121Article

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High-temperature X-ray diffraction : solutions to uncertainties in temperature and sample positionBROWN, N. E; SWAPP, S. M; BENNETT, C. L et al.Journal of applied crystallography. 1993, Vol 26, pp 77-81, issn 0021-8898, 1Article

Intensity statistics and normalized structure factors for crystals with an incommensurate one-dimensional modulationLAM, E. J. W; BEURSKENS, P. T; VAN SMAALEN, S et al.Acta crystallographica. Section A, Foundations of crystallography. 1993, Vol 49, pp 709-721, issn 0108-7673, 5Article

On direct-methods phase information from differences between isomorphous structure factorsKYRIAKIDIS, C. E; PESCHAR, R; SCHENK, H et al.Acta crystallographica. Section A, Foundations of crystallography. 1993, Vol 49, pp 557-569, issn 0108-7673, 3Article

On the relation between the diffraction ratio, the doublet values and the reliability of the triplet estimatesKYRIAKIDIS, C. E; PESCHAR, R; SCHENK, H et al.Acta crystallographica. Section A, Foundations of crystallography. 1993, Vol 49, pp 350-358, issn 0108-7673, 2Article

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Possible improvements in the precision and accuracy of small-angle X-ray scattering measurementsSTEINHART, M; PLESTIL, J.Journal of applied crystallography. 1993, Vol 26, pp 591-601, issn 0021-8898, 4Article

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The intensity patterns with a multi-crustal diffractometer observed at a synchrotron sourceGARTSTEIN, E. L; COWLEY, R. A.Zeitschrift für Naturforschung. A, A Journal of physical sciences. 1993, Vol 48, Num 3, pp 519-522, issn 0932-0784Article

The lattice constant of a nonperfect crystal measured by X-ray diffractionLESZCZYNSKI, M.Journal of applied crystallography. 1993, Vol 26, pp 280-283, issn 0021-8898, 2Article