Positron diffraction study of SiC(0001) surfaceKAWASUSO, A; MAEKAWA, M; YOSHIKAWA, M et al.Applied surface science. 2005, Vol 244, Num 1-4, pp 149-152, issn 0169-4332, 4 p.Conference Paper

Automated structure-factor refinement from convergent-beam electron diffraction patternsZUO, J. M.Acta crystallographica. Section A, Foundations of crystallography. 1993, Vol 49, pp 429-435, issn 0108-7673, 3Article

Low-dose high-resolution electron microscopy of zeolite materials with a slow-scan CCD cameraPAN, M; CROZIER, P. A.Ultramicroscopy. 1993, Vol 48, Num 3, pp 332-340, issn 0304-3991Article

Structure factor determination in non-centrosymmetric crystals by a two-dimensional CBED-based multi-parameter refinement methodHØIER, R; BAKKEN, L. N; MARTHINSEN, K et al.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 159-170, issn 0304-3991Article

Formation of double-diffracted higher-order Laue zone linesCHOU, C. T; STEEDS, J. W.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1993, Vol 67, Num 5, pp 1095-1115, issn 0141-8610Article

High-resolution electron microscopy observations of large Pd clustersVOLKOV, V. V; VAN TENDELOO, G; VARGAFTIK, M. N et al.Journal of crystal growth. 1993, Vol 132, Num 3-4, pp 359-363, issn 0022-0248Article

One-dimensional contrast modulations in [001] high-resolution reverse images of Bi₂Sr₂(Ca_1-xNd_x)Cu₂O_8+δ ceramicsONOZUKA, T.Journal of applied crystallography. 1993, Vol 26, pp 104-111, issn 0021-8898, 1Article

Use of quasi-Bloch wave packages for description of fast electron diffraction in a crystal with defectsBORGARDT, N. I.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1993, Vol 68, Num 3, pp 453-470, issn 0141-8610Article

3D structure determination from electron-microscope images : electron crystallography of stauroliteWENK, H.-R; DOWNING, K. H; MEISHENG, H et al.Acta crystallographica. Section A, Foundations of crystallography. 1992, Vol 48, pp 700-716, issn 0108-7673, 5Article

Application of the focused-ion-beam technique for preparing the cross-sectional sample of chemical vapor deposition diamond thin film for high-resolution transmission electron microscope observationTARUTANI, M; TAKAI, Y; SHIMIZU, R et al.Japanese journal of applied physics. 1992, Vol 31, Num 9A, pp L1305-L1308, issn 0021-4922, 2Article

Dynamics of thermal diffuse scattering in high-energy electron diffraction and imaging : theory and experimentsWANG, Z. L.Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties. 1992, Vol 65, Num 3, pp 559-587, issn 0958-6644Article

Quantitative analysis of ionic solids by secondary neutral mass spectrometryFICHTNER, M; GOSCHNICK, J; SCHMIDT, U. C et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1992, Vol 10, Num 2, pp 362-367, issn 0734-2101Article

Automated phase determination in electron crystallography : thermotropic phases of thioureaDORSET, D. L.Ultramicroscopy. 1992, Vol 45, Num 3-4, pp 357-364, issn 0304-3991Article

Contribution of EPES in the study of materialsJARDIN, C; GERGELY, G; GRUZZA, B et al.Materials chemistry and physics. 1992, Vol 32, Num 2, pp 197-201, issn 0254-0584Article

Holographic reconstruction from measured diffuse low-energy-electron diffraction intensitiesMENDEZ, M. A; GLÜCK, C; GUERRERO, J et al.Physical review. B, Condensed matter. 1992, Vol 45, Num 16, pp 9402-9405, issn 0163-1829Article

Invariant recognition of molecular projections in vitreous ice preparationsSCHATZ, M; VAN HEEL, M.Ultramicroscopy. 1992, Vol 45, Num 1, pp 15-22, issn 0304-3991Article

Lattice images of narrow-bandgap semiconductors : InP, InAs, and InSbWATANABE, K; HASHIKAWA, N; HIRATSUKA, K et al.Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties. 1992, Vol 66, Num 5, pp 573-585, issn 0958-6644Article

Platinum dimers bridged by diphenylphosphinocyclopentadienyl ligands. Molecular structures and NMR studies of two isomeric forms of the complexes [Pt₂R₂(μ-C₅H₄PPh₂)₂]LIN, M; FALLIS, K. A; ANDERSON, G. K et al.Journal of the American Chemical Society. 1992, Vol 114, Num 12, pp 4687-4693, issn 0002-7863Article

Boundary characterisation methods using the TEMSTOBBS, W. M.Ultramicroscopy. 1992, Vol 40, Num 3, pp 300-312, issn 0304-3991Conference Paper

Monte Carlo simulation of Auger electron specroscopy and x-ray photoelectron spectroscopy spectraYOSHIKAWA, H; SHIMIZU, R.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1992, Vol 10, Num 4, pp 2931-2937, issn 0734-2101, 3Conference Paper

A computational method for obtaining stationary solutions in RHEED and REMMA, Y.Acta crystallographica. Section A, Foundations of crystallography. 1991, Vol 47, Num 2, pp 137-139, issn 0108-7673, 3 p.Article

Effects of tetragonal distortion in thin epitaxic films on electron channeling patterns in scanning electron microscopyKOZUBOWSKI, J. A; KELLER, R. R; GERBERICH, W. W et al.Journal of applied crystallography. 1991, Vol 24, pp 102-107, issn 0021-8898, 6 p., p.2Article

Detection of energy-selected secondary electrons in coincidence with energy-loss events in thin carbon foilsPIJPER, F. J; KRUIT, P.Physical review. B, Condensed matter. 1991, Vol 44, Num 17, pp 9192-9200, issn 0163-1829Article

Dynamical treatment of the splitting of HOLZ lines from dislocations in siliconHUAMIN ZOU; XIFU YAO; RENHUI WANG et al.Acta crystallographica. Section A, Foundations of crystallography. 1991, Vol 47, pp 490-497, issn 0108-7673, 5Article

EPR study of the [SiO₄/Li]⁰ centre in α-quartzBAILEY, P; WEIL, J. A.Journal of the Chemical Society. Faraday transactions. 1991, Vol 87, Num 19, pp 3143-3146Article