Auger neutralization and ionization processes for charge exchange between slow noble gas atoms and solid surfacesMONREAL, R. Carmina.Progress in surface science. 2014, Vol 89, Num 1, pp 80-125, issn 0079-6816, 46 p.Article

Adsorption of Nd on the Mo(1 1 0) surfaceWIEJAK, Marcin; JANKOWSKI, Maciej; YAKOVKIN, Ivan et al.Applied surface science. 2010, Vol 256, Num 15, pp 4834-4838, issn 0169-4332, 5 p.Conference Paper

Incident angle and energy dependences of low-energy Ar⁺ ion sputtering of GaAs/AlAs multilayered systemNAGATOMI, T; BUNGO, T; TAKAI, Y et al.Surface and interface analysis. 2009, Vol 41, Num 7, pp 581-589, issn 0142-2421, 9 p.Article

Investigation of molybdate -benzotriazole surface treatment against copper tarnishingZHANG, Da-Quan; HYUNG GOUN JOO; KANG YONG LEE et al.Surface and interface analysis. 2009, Vol 41, Num 3, pp 164-169, issn 0142-2421, 6 p.Article

Nitrogen plasma cleaning of Ge(10 0) surfacesKUTSUKI, Katsuhiro; OKAMOTO, Gaku; HOSOI, Takuji et al.Applied surface science. 2009, Vol 255, Num 12, pp 6335-6337, issn 0169-4332, 3 p.Article

Quantification of a Ti(CxN_1-x) based multilayer by Auger Electron SpectroscopyGUILLOT, J; WIRTZ, T; GIROT, T et al.Applied surface science. 2009, Vol 256, Num 3, pp 773-778, issn 0169-4332, 6 p.Article

AES, EELS and TRIM investigation of InSb and InP compounds subjected to Ar⁺ ions bombardmentABDELLAOUI, A; GHAFFOUR, M; OUERDANE, A et al.Applied surface science. 2008, Vol 254, Num 13, pp 4024-4028, issn 0169-4332, 5 p.Article

Ir-based diffusion barriers for Ohmic contacts to p-GaNVOSS, L. F; STAFFORD, L; GILA, B. P et al.Applied surface science. 2008, Vol 254, Num 13, pp 4134-4138, issn 0169-4332, 5 p.Article

Secondary electron spectra of gold under bombardment by very low-energy positronsMUKHERJEE, S; NADESALINGAM, M. P; GUAGLIARDO, Paul et al.Applied surface science. 2008, Vol 255, Num 1, pp 223-226, issn 0169-4332, 4 p.Article

Growth and crystalline structure of Co layers on Cu(0 01)TURKO, D; MORAWSKI, I; NOWICKI, M et al.Applied surface science. 2008, Vol 254, Num 14, pp 4391-4395, issn 0169-4332, 5 p.Conference Paper

On Coster-Kronig line shapes of solidsCINI, Michele; PERFETTO, Enrico; STEFANUCCI, Gianluca et al.Journal of physics. Condensed matter (Print). 2008, Vol 20, Num 47, issn 0953-8984, 474209.1-474209.5Conference Paper

Preparation and structural properties of MgO films grown on GaAs substrateCHROMIK, Stefan; SPANKOVA, Marianna; VIVRA, Ivo et al.Applied surface science. 2008, Vol 254, Num 12, pp 3635-3637, issn 0169-4332, 3 p.Conference Paper

AES depth profiling with a tilted sample in front of a cylindrical mirror analyzer : quantification and profile shape changes according to an extension of the conventional MRI modelHOFMANN, S; WANG, J. Y.Surface and interface analysis. 2007, Vol 39, Num 1, pp 45-51, issn 0142-2421, 7 p.Article

Threshold A1 KLL Auger spectra of oxidized aluminium foilsBUCKLEY, A. N; HARTMANN, A. J; LAMB, R. N et al.Surface and interface analysis. 2003, Vol 35, Num 11, pp 922-931, issn 0142-2421, 10 p.Article

Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS) studies of GaP and Si surfacesPAPARAZZO, E; MORETTO, L; BROLATTI, Massimo et al.Vacuum. 2002, Vol 65, Num 2, pp 193-206, issn 0042-207XArticle

Free-electron metal alloys: a study by high-energy XPSABEL, Marie-Laure; TSAKIROPOULOS, Panos; WATTS, John F et al.Surface and interface analysis. 2002, Vol 33, Num 10-11, pp 775-780, issn 0142-2421, 6 p.Article

Line structure in photoelectron and Auger electron spectra of CuO_x/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS)JIANG, Zhong-Tao; THURGATE, Stephen M; WILKIE, Peter et al.Surface and interface analysis. 2001, Vol 31, Num 4, pp 287-290, issn 0142-2421Article

Effects of surface structure on depth resolution of AES depth profiles of Ni/Cr multilayersZALAR, A; PRACEK, B; PANJAN, P et al.Surface and interface analysis. 2000, Vol 30, Num 1, pp 247-250, issn 0142-2421Conference Paper

The influence of crystal-field splitting and electron diffraction on the spin polarization of Fe L₃VV Auger electron spectraKUCHERENKO, YU; RENNERT, P.Journal of physics. Condensed matter (Print). 1997, Vol 9, Num 23, pp 5003-5013, issn 0953-8984Article

Elastic scattering corrections in AES and XPS. III. Behaviour of electron transport mean free path in solids for kinetic energies in the range 100 eV < E < 400 eVCUMPSON, P. J.Surface and interface analysis. 1997, Vol 25, Num 6, pp 447-453, issn 0142-2421Conference Paper

AES and XPS depth profile analysis. A critical reviewMATHIEU, H. J.Le Vide (1995). 1996, Vol 52, Num 279, issn 1266-0167, 10, 81-91 [12 p.]Conference Paper

Classical trajectories studies of DIET from calcium fluorideCIEPLINSKI, L; JEDRZEJEK, C.Surface science. 1995, Vol 339, Num 3, pp L940-L944, issn 0039-6028Article

Monte Carlo simulation of background in AES : a comparison with experimentDING, Z.-J; NAGATOMI, T; SHIMIZU, R et al.Surface science. 1995, Vol 336, Num 3, pp 397-403, issn 0039-6028Article

Target factor and neural network analyses applied of titanium nitride composition recognition by AESCARD, J; TESTONI, A. L; LE TARTE, L. A et al.Surface and interface analysis. 1995, Vol 23, Num 7-8, pp 495-505, issn 0142-2421Article

A fast and simple method for background removal in Auger electron spectroscopyBAUER, H. E.Fresenius' journal of analytical chemistry. 1995, Vol 353, Num 3-4, pp 450-455, issn 0937-0633Conference Paper