Bayesian Modeling and Optimization of Functional Responses Affected by Noise FactorsDEL CASTILLO, Enrique; COLOSIMO, Bianca M; ALSHRAIDEH, Hussam et al.Journal of quality technology. 2012, Vol 44, Num 2, pp 117-135, issn 0022-4065, 19 p.Article

Constructing Definitive Screening Designs Using Conference MatricesLILI XIAO; LIN, Dennis K. J; FENGSHAN BAI et al.Journal of quality technology. 2012, Vol 44, Num 1, pp 2-8, issn 0022-4065, 7 p.Article

Directional Control Schemes for Multivariate Categorical ProcessesJIAN LI; TSUNG, Fugee; CHANGLIANG ZOU et al.Journal of quality technology. 2012, Vol 44, Num 2, pp 136-154, issn 0022-4065, 19 p.Article

Semiconductor Contamination: Eliciting a Physical Model Through Factorial ExperimentationRAMBERG, John S; PARKS, Harold G; MAANUM, Kristen A et al.Journal of quality technology. 2012, Vol 44, Num 2, pp 161-174, issn 0022-4065, 14 p.Article

T² Control Charts with Variable DimensionAPARISI, Francisco; EPPRECHT, Eugenio K; RUIZ, Omar et al.Journal of quality technology. 2012, Vol 44, Num 4, pp 375-393, issn 0022-4065, 19 p.Article

Monitoring the Coefficient of Variation Using EWMA ChartsCASTAGLIOLA, Philippe; CELANO, Giovanni; PSARAKIS, Stelios et al.Journal of quality technology. 2011, Vol 43, Num 3, pp 249-265, issn 0022-4065, 17 p.Article

Weighted CUSUM Control Charts for Monitoring Poisson Processes with Varying Sample SizesWEI JIANG; LIANJIE SHU; TSUI, Kwok-Leung et al.Journal of quality technology. 2011, Vol 43, Num 4, pp 346-362, issn 0022-4065, 17 p.Article

Generating and Assessing Exact G-Optimal DesignsRODRIGUEZ, Myrta; JONES, Bradley; BORROR, Connie M et al.Journal of quality technology. 2010, Vol 42, Num 1, pp 3-20, issn 0022-4065, 18 p.Article

Nonparametric CUSUM and EWMA Control Charts for Detecting Mean ShiftsLI, Su-Yi; TANG, Loon-Ching; NG, Szu-Hui et al.Journal of quality technology. 2010, Vol 42, Num 2, pp 209-226, issn 0022-4065, 18 p.Article

Optimum Designs Versus Orthogonal Arrays for Main Effects and Two-Factor InteractionsSCHOEN, Eric D.Journal of quality technology. 2010, Vol 42, Num 2, pp 197-208, issn 0022-4065, 12 p.Article

Sensitivity Analysis of Optimal Designs for Accelerated Life TestingMONROE, Eric M; RONG PAN; ANDERSON-COOK, Christine M et al.Journal of quality technology. 2010, Vol 42, Num 2, pp 121-135, issn 0022-4065, 15 p.Article

A Distribution-Free Phase I Control Chart for Subgroup ScaleJONES-FARMER, L. Allison; CHAMP, Charles W.Journal of quality technology. 2010, Vol 42, Num 4, pp 373-387, issn 0022-4065, 15 p.Article

EWMA Charts for the Weibull Shape ParameterPASCUAL, Francis.Journal of quality technology. 2010, Vol 42, Num 4, pp 400-416, issn 0022-4065, 17 p.Article

A Review of Statistical Methods for Quality Improvement and Control in NanotechnologyLU, Jye-Chyi; JENG, Shuen-Lin; KAIBO WANG et al.Journal of quality technology. 2009, Vol 41, Num 2, pp 148-164, issn 0022-4065, 17 p.Article

Run and Frequency Quota Rules in Process Monitoring and Acceptance SamplingBALAKRISHNAN, N; BERSIMIS, S; KOUTRAS, M. V et al.Journal of quality technology. 2009, Vol 41, Num 1, pp 66-81, issn 0022-4065, 16 p.Article

Bayesian Variable Selection for Fractional Factorial Experiments with Multilevel Categorical FactorsWOODWARD, Phil; WALLEY, Rosalind.Journal of quality technology. 2009, Vol 41, Num 3, pp 228-240, issn 0022-4065, 13 p.Article

Checking the Adequacy of Fit of Models from Split-Plot DesignsALMIMI, Ashraf A; KULAHCI, Murat; MONTGOMERY, Douglas C et al.Journal of quality technology. 2009, Vol 41, Num 3, pp 272-284, issn 0022-4065, 13 p.Article

Combined Charts for Mean and Variance InformationHAWKINS, Douglas M; QIQI DENG.Journal of quality technology. 2009, Vol 41, Num 4, pp 415-425, issn 0022-4065, 11 p.Article

Approval Criteria for Multivariate Measurement SystemsMAJESKE, Karl D.Journal of quality technology. 2008, Vol 40, Num 2, pp 140-153, issn 0022-4065, 14 p.Article

Assessing a Binary Measurement SystemDANILA, Oana; STEINER, Stefan H; JOCK MACKAY, R et al.Journal of quality technology. 2008, Vol 40, Num 3, pp 310-318, issn 0022-4065, 9 p.Article

Causation-Based T² Decomposition for Multivariate Process Monitoring and DiagnosisJING LI; JIONGHUA JIN; JIANJUN SHI et al.Journal of quality technology. 2008, Vol 40, Num 1, pp 46-58, issn 0022-4065, 13 p.Article

A new design criterion for robust parameter experimentsDEL CASTILLO, Enrique; ALVAREZ, Maria Jesus; ILZARBE, Laura et al.Journal of quality technology. 2007, Vol 39, Num 3, pp 279-295, issn 0022-4065, 17 p.Article

Construction of efficient mixed-level fractional factorial designsYONG GUO; SIMPSON, James R; PIGNATIELLO, Joseph J et al.Journal of quality technology. 2007, Vol 39, Num 3, pp 241-257, issn 0022-4065, 17 p.Article

A bayesian approach for the determination of warranty lengthGUTIERREZ-PULIDO, Humberto; AGUIRRE-TORRES, Victor; CHRISTEN, J. A et al.Journal of quality technology. 2006, Vol 38, Num 2, pp 180-189, issn 0022-4065, 10 p.Article

Blocked fractional factorial split-plot experiments for robust parameter designMCLEOD, Robert G; BREWSTER, John F.Journal of quality technology. 2006, Vol 38, Num 3, pp 267-279, issn 0022-4065, 13 p.Article