A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foilsHUTCHINSON, C. R; HACKENBERG, R. E; SHIFLET, G. J et al.Ultramicroscopy. 2003, Vol 94, Num 1, pp 37-48, issn 0304-3991, 12 p.Article

Apertureless near-field scanning Raman microscopy using reflection scattering geometrySUN, W. X; SHEN, Z. X.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 237-244, issn 0304-3991, 8 p.Article

Automated image processing for grain boundary analysisMAHADEVAN, Sowmya; CASASENT, David.Ultramicroscopy. 2003, Vol 96, Num 2, pp 153-162, issn 0304-3991, 10 p.Article

Development of a specimen holder for in situ generation of pure in-plane magnetic fields in a transmission electron microscopeUHLIG, T; HEUMANN, M; ZWECK, J et al.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 193-196, issn 0304-3991, 4 p.Article

Imaging of fullerene-like structures in CN_x thin films by electron microscopy; sample preparation artefacts due to ion-beam millingCZIGANY, Zs; NEIDHARDT, J; BRUNELL, I. F et al.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 163-173, issn 0304-3991, 11 p.Article

Improved comparison of low energy loss spectra with band structure calculations: the example of BN filamentsMOREAU, P; CHEYNET, M. C.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 293-303, issn 0304-3991, 11 p.Article

Interpretation of secondary electron images obtained using a low vacuum SEMTOTH, M; THIEL, B. L; DONALD, A. M et al.Ultramicroscopy. 2003, Vol 94, Num 2, pp 71-87, issn 0304-3991, 17 p.Article

Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?VAN DYCK, D; VAN AERT, S; DEKKER, A. J et al.Ultramicroscopy. 2003, Vol 98, Num 1, pp 27-42, issn 0304-3991, 16 p.Article

Nanomaterials for field electron emission: preparation, characterization and applicationXU, Ning-Sheng; DENG, Shao-Zhi; JUN CHEN et al.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 19-28, issn 0304-3991, 10 p.Conference Paper

On the application of quantum transport theory to electron sourcesJENSEN, Kevin L.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 29-48, issn 0304-3991, 20 p.Conference Paper

Image potential between closely separated quantum-size film and a metalIL'CHENKO, L. G; GORAYCHUK, T. V.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 67-73, issn 0304-3991, 7 p.Conference Paper

Field emission from diamond particles studied by scanning field emission microscopyWATANABE, Akihiko; DEGUCHI, Masahiro; KITABATAKE, Makoto et al.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 145-151, issn 0304-3991, 7 p.Conference Paper

Light-illuminated STM studies on photo-absorption in InAs nanowiresTAKAHASHI, Takuji; TAKADA, Kan; TAKEUCHI, Misaichi et al.Ultramicroscopy. 2003, Vol 97, Num 1-4, pp 1-6, issn 0304-3991, 6 p.Conference Paper

Ambient STM and in situ AFM study of nitrite reductase proteins adsorbed on gold and graphite: influence of the substrate on protein interactionsCONTER, S. Antoranz; IWASAKI, H; SUZUKI, S et al.Ultramicroscopy. 2003, Vol 97, Num 1-4, pp 65-72, issn 0304-3991, 8 p.Conference Paper

Effects of temperature and pressure on microcantilever resonance responseMERTENS, Johann; FINOT, Eric; THUNDAT, Thomas et al.Ultramicroscopy. 2003, Vol 97, Num 1-4, pp 119-126, issn 0304-3991, 8 p.Conference Paper

Imaging of lactic acid bacteria with AFM: elasticity and adhesion maps and their relationship to biological and structural dataSCHAER-ZAMMARETTI, Prisca; UBBINK, Job.Ultramicroscopy. 2003, Vol 97, Num 1-4, pp 199-208, issn 0304-3991, 10 p.Conference Paper

Nanotribological characterization of molecularly thick lubricant films for applications to MEMS/NEMS by AFMHUIWEN LIU; BHUSHAN, Bharat.Ultramicroscopy. 2003, Vol 97, Num 1-4, pp 321-340, issn 0304-3991, 20 p.Conference Paper

Feasibility of tunable MEMS photonic crystal devicesRAJIC, S; CORBEIL, J. L; DATSKOS, P. G et al.Ultramicroscopy. 2003, Vol 97, Num 1-4, pp 473-479, issn 0304-3991, 7 p.Conference Paper

Mechanical characterization of micro/nanoscale structures for MEMS/NEMS applications using nanoindentation techniquesXIAODONG LI; BHUSHAN, Bharat; TAKASHIMA, Kazuki et al.Ultramicroscopy. 2003, Vol 97, Num 1-4, pp 481-494, issn 0304-3991, 14 p.Conference Paper

Nanobeam propagation and imaging in a FEGTEM/STEMMÖBUS, Günter; NUFER, Stefan.Ultramicroscopy. 2003, Vol 96, Num 3-4, pp 285-298, issn 0304-3991, 14 p.Conference Paper

Localization in elastic and inelastic scatteringLUPINI, A. R; PENNYCOOK, S. J.Ultramicroscopy. 2003, Vol 96, Num 3-4, pp 313-322, issn 0304-3991, 10 p.Conference Paper

Experimental investigation of phase contrast formed by inelastically scattered electronsKIMOTO, Koji; MATSUI, Yoshio.Ultramicroscopy. 2003, Vol 96, Num 3-4, pp 335-342, issn 0304-3991, 8 p.Conference Paper

Energy-filtering TEM at high magnification: spatial resolution and detection limitsGROGGER, Werner; SCHAFFER, Bernhard; KRISHNAN, Kannan M et al.Ultramicroscopy. 2003, Vol 96, Num 3-4, pp 481-489, issn 0304-3991, 9 p.Conference Paper

Experimental and theoretical evidence for the magic angle in transmission electron energy loss spectroscopyDANIELS, Howard; BROWN, Andy; SCOTT, Andrew et al.Ultramicroscopy. 2003, Vol 96, Num 3-4, pp 523-534, issn 0304-3991, 12 p.Conference Paper

Quantum size aspects of the piezoresistive effect in ultra thin piezoresistorsIVANOV, Tzv; GOTSZALK, T; SULZBACH, T et al.Ultramicroscopy. 2003, Vol 97, Num 1-4, pp 377-384, issn 0304-3991, 8 p.Conference Paper