A miniaturized SNOM sensor based on the optical feedback inside the VCSEL cavityGORECKI, Christophe; HEINIS, Dominique.SPIE proceedings series. 2004, pp 183-187, isbn 0-8194-5380-3, 5 p.Conference Paper

Metrology of refractive microlens arraysWEIBLE, Kenneth J; VÖLKEL, Reinhard; EISNER, Martin et al.SPIE proceedings series. 2004, pp 43-51, isbn 0-8194-5380-3, 9 p.Conference Paper

Modified linear and circular carrier frequency Fourier transform method applied for studies of vibrating microelementsKACPERSKI, Jacek; KUJAWINSKA, Malgorzata; KREZEL, Jerzy et al.SPIE proceedings series. 2004, pp 287-298, isbn 0-8194-5380-3, 12 p.Conference Paper

Performance of a multi-fiber polarimetric strain sensorHEGDE, Gopalkrishna; SUKIA, Eluska; LIM CHOO MIN et al.SPIE proceedings series. 2004, pp 129-135, isbn 0-8194-5380-3, 7 p.Conference Paper

Real-time shape measurement system including CG-outputMORIMOTO, Yoshiharu; FUJIGAKI, Motoharu; SAUGIER, Rodolphe et al.SPIE proceedings series. 2004, pp 117-128, isbn 0-8194-5380-3, 12 p.Conference Paper

Three-dimensional dynamic environmental MEMS characterizationNOVAK, Erik.SPIE proceedings series. 2004, pp 1-8, isbn 0-8194-5380-3, 8 p.Conference Paper

Research of on-axis tracking technology based on equal acceleration modelLI WENIUN; ZHAO JINYU; CHEN TAO et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60242C.1-60242C.6, issn 0277-786X, isbn 0-8194-6055-9, 1VolConference Paper

Hybrid analysis of micromachined silicon thin film based on digital microscopic holographyLEI XU; XIAOYUAN PENG; JIANMIN MIAO et al.SPIE proceedings series. 2004, pp 236-243, isbn 0-8194-5380-3, 8 p.Conference Paper

Application of the vortex transform to microscopic interferometryPETITGRAND, Sylvain; BOSSEBOEUF, Alain; GUIRARDEL, Matthieu et al.SPIE proceedings series. 2004, pp 9-15, isbn 0-8194-5380-3, 7 p.Conference Paper

Real time measurement of microscopic surface shape using high speed cameras with continuously scanning interference microscopyMONTGOMERY, Paul; DRAMAN, Cemal; UHRING, Wilfried et al.SPIE proceedings series. 2004, pp 101-108, isbn 0-8194-5380-3, 8 p.Conference Paper

Study of the roughness and optical near field of mass surface by using a SNOM with shear-force regulationHAIDAR, Y; DE FORNEL, F; ZEROUKI, C et al.SPIE proceedings series. 2004, pp 171-182, isbn 0-8194-5380-3, 12 p.Conference Paper

The advanced position compensation to improve the dynamic tracking ability for fast moving target in an optoelectronic tracking systemWU NENGWEI; ZHAO LIRONG; ZHOU HUI et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60242D.1-60242D.9, issn 0277-786X, isbn 0-8194-6055-9, 1VolConference Paper

Makyoh topography: a simple yet powerful optical method for flatness and defect characterisation of mirror-like surfacesRIESZ, Ferenc.SPIE proceedings series. 2004, pp 86-100, isbn 0-8194-5380-3, 15 p.Conference Paper

Digital holographic Microscope for thermal characterization of silicon micro-hotplates for gas sensorCOPPOLA, Giuseppe; DE NICOLA, Sergio; FERRARO, Pietro et al.SPIE proceedings series. 2004, pp 228-235, isbn 0-8194-5380-3, 8 p.Conference Paper

Analysis of static and dynamic operational behaviour of active micromembranesASWENDT, Petra; DEAN, Thierry.SPIE proceedings series. 2004, pp 25-33, isbn 0-8194-5380-3, 9 p.Conference Paper

Interferometric methods for static and dynamic characterizations of micromembranes for sensing functionsSALBUT, L; KACPERSKI, J; STYK, A et al.SPIE proceedings series. 2004, pp 16-24, isbn 0-8194-5380-3, 9 p.Conference Paper

Stroboscopic illumination and synchronous imaging for the characterization of MEMS vibrationsSERIO, B; HUNSINGER, J. J; CRETIN, B et al.SPIE proceedings series. 2004, pp 257-264, isbn 0-8194-5380-3, 8 p.Conference Paper

Studies of the properties of the temporal phase shifting method applied to silicone microelement vibration investigations using the time average methodPATORSKI, Krzysztof; SIENICKI, Zbigniew; PAWLOWSKI, Michał et al.SPIE proceedings series. 2004, pp 208-219, isbn 0-8194-5380-3, 12 p.Conference Paper

ICO20, optical devices and instruments (21-26 August 2005, Changchun, China)Wyant, James C; Zhang, X. J.Proceedings of SPIE, the International Society for Optical Engineering. 2005, issn 0277-786X, isbn 0-8194-6055-9, 1Vol, pagination multiple, isbn 0-8194-6055-9Conference Proceedings

Holographic interferometry deformations metrology by using AR modellingMOKDAD, Rabah; EL-HAFIDI, Idriss; MEYRUEIS, Patrick et al.SPIE proceedings series. 2004, pp 136-140, isbn 0-8194-5380-3, 5 p.Conference Paper

Evolutionary approach to an inverse problem in near-field optics microscopyBARCHIESI, Demetrio Macias; VIAL, Alexandre.SPIE proceedings series. 2004, pp 188-195, isbn 0-8194-5380-3, 8 p.Conference Paper

Investigation on mechanical properties of porous alumina thin membranes using temporal sequence speckle pattern interferometryWU XIAOPING; LIU ZHAOTAO; MIAO HONG et al.SPIE proceedings series. 2004, pp 220-227, isbn 0-8194-5380-3, 8 p.Conference Paper

Frequency measurement of refraction index of air for high-resolution laser interferometryCIP, Ondrej; PETRU, Frantisek; MATOUSEK, Vit et al.SPIE proceedings series. 2004, pp 273-277, isbn 0-8194-5380-3, 5 p.Conference Paper

Thickness measurement of thin transparent plates with a broad-band wavelength scanning interferometerMADDALONI, P; COPPOLA, G; DE NATALE, P et al.SPIE proceedings series. 2004, pp 64-70, isbn 0-8194-5380-3, 7 p.Conference Paper

INS's error compensation on the base of the celestial theodoliteZHAO, Hai-Bo; GUO, Li-Hong.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60242E.1-60242E.6, issn 0277-786X, isbn 0-8194-6055-9, 1VolConference Paper