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Results 1 to 25 of 2372

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Noise and spatial resolution in SQUID microscopyCHATRAPHORN, S; FLEET, E. F; WELLSTOOD, F. C et al.IEEE transactions on applied superconductivity. 2001, Vol 11, Num 1, pp 234-237, issn 1051-8223, 1Conference Paper

HTS SQUID microscope head with sharp permalloy rod for high spatial resolutionNAGAISHI, Tatsuoki; MINAMIMURA, Kenichi; ITOZAKI, Hideo et al.IEEE transactions on applied superconductivity. 2001, Vol 11, Num 1, pp 226-229, issn 1051-8223, 1Conference Paper

SQUID microscope for magnetic structure visualization in magnetoimpedance elementsGUDOSHNIKOV, Sergey A; RUDENCHIK, Pavel E; MATVEETS, Ludmila V et al.IEEE transactions on applied superconductivity. 2001, Vol 11, Num 1, pp 223-225, issn 1051-8223, 1Conference Paper

Utilize AIMS simulation to estimate profile side-wall angleLU, Colbert; LIN, C. H; WANG, C. F et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 634943.1-643943.10, issn 0277-786X, isbn 0-8194-6444-9, 2VolConference Paper

Developing an aberration-corrected Schottky emission SEM and method for measuring aberrationKAWASAKI, Takeshi; NAKANO, Tomonori; HIROSE, Kotoko et al.Microelectronic engineering. 2009, Vol 86, Num 4-6, pp 1017-1020, issn 0167-9317, 4 p.Conference Paper

A WESTERBORK SURVEY OF CLUSTERS OF GALAXIES. XIV: ABELL 1979 AND ABELL 1314WILSON AS; VALLEE JP.1982; ASTRON. ASTROPHYS., SUPPL. SER.; ISSN 0365-0138; DEU; DA. 1982; VOL. 47; NO 3; PP. 601-609; BIBL. 25 REF.Article

Map-free line-scanning tomographic optical microscopeSINKO, József; DUDAS, László; GAJDATSY, Gábor et al.Optics letters. 2011, Vol 36, Num 20, pp 4011-4013, issn 0146-9592, 3 p.Article

Fresh fruit ― microstructure, texture and qualityWOOD, Delilah F; IMAM, Syed H; ORTS, William J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 73781J.1-73781J.12Conference Paper

Plasmonics (nanoimaging, nanofabrication, and their applications II)Kawata, Satoshi; Shalaev, Vladimir M; Tsai, Din Ping et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6403-1, 1Vol, pagination multiple, isbn 0-8194-6403-1Conference Proceedings

Near-field Optics: Generality in Super-Resolution Imaging in 3DLEWIS, Aaron.Nanophotonics. 2014, Vol 3, Num 1-2, 128 p.Serial Issue

Development of scanning thennal microscopy for nano-scale real temperature measurementNAKABEPPU, Osamu; SUZUKI, Takamitsu.International heat transfer conference. 2002, pp 447-452, isbn 2-84299-308-X, 6 p.Conference Paper

Localized surface plasmon microscope with an illumination system employing a radially polarized zeroth-order Bessel beamWATANABE, Kouyou; TERAKADO, Goro; KANO, Hiroshi et al.Optics letters. 2009, Vol 34, Num 8, pp 1180-1182, issn 0146-9592, 3 p.Article

Enhancing OPC Model Stability and Predictability Using SEM Image ContoursEL-DIN HABIB, Mohamed Serag.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7122, issn 0277-786X, isbn 978-0-8194-7355-4 0-8194-7355-3, 712244.1-712244.9, 2Conference Paper

Miniature electrostatic column for a compact scanning electron microscopeAMBE, T; TANAKA, H; TEGURI, H et al.Microelectronic engineering. 2002, Vol 61-62, pp 317-321, issn 0167-9317Conference Paper

Investigation into Sources of Random Uncertainties in the NanoScan-3Di Metrological Scanning Probe MicroscopeGOGOLINSKII, K. V; GUBSKII, K. L; KUZNETSOV, A. P et al.Nanotechnologies in Russia (Print). 2013, Vol 8, Num 5-6, pp 337-341, issn 1995-0780, 5 p.Article

Tight focusing with a binary microaxiconKOTLYAR, V. V; STAFEEV, S. S; O'FAOLAIN, L et al.Optics letters. 2011, Vol 36, Num 16, pp 3100-3102, issn 0146-9592, 3 p.Article

Nanophotonics and near fieldDE FORNEL, Frédérique; ZYSS, Joseph.Comptes rendus. Physique. 2012, Vol 13, Num 8, issn 1631-0705, 84 p.Serial Issue

Identification of scanning probe microscopes sensor heads and validation of a mechanical model by a laser vibrometerARMINGER, Bernd R; ZAGAR, Bernhard G.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 73781B.1-7378B.9Conference Paper

Influence of Image Processing on Line-Edge Roughness in CD-SEM MeasurementYAMAGUCHI, Atsuko; YAMAMOTO, Jiro.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 692221.1-692221.8, issn 0277-786X, isbn 978-0-8194-7107-9Conference Paper

High-resolution surface-plasmon imaging in air and in water : V(z) curve and operating conditionsBERGUIGA, Lotfi; SANJUN ZHANG; ARGOUL, Francoise et al.Optics letters. 2007, Vol 32, Num 5, pp 509-511, issn 0146-9592, 3 p.Article

Reciprocity in scanning near-field optical microscopy : illumination and collection modes of transmission measurementsIMURA, Kohei; OKAMOTO, Hiromi.Optics letters. 2006, Vol 31, Num 10, pp 1474-1476, issn 0146-9592, 3 p.Article

Error factor in bottom CD measurement for contact hole using CD-SEMABE, Hideaki; YAMAZAKI, Yuichiro.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6195-4, 2Vol, vol 2, 61524H.1-61524H.9Conference Paper

Simultaneous imaging of multiple focal planes using a two-photon scanning microscopeAMIR, W; CARRILES, R; HOOVER, E. E et al.Optics letters. 2007, Vol 32, Num 12, pp 1731-1733, issn 0146-9592, 3 p.Article

Tip-enhanced near-field Raman scattering and imaging of carbon nanostructuresVERMA, Prabhat; YANO, Taka-Aki; INOUYE, Yasushi et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 63240K.1-63240K.9, issn 0277-786X, isbn 0-8194-6403-1, 1VolConference Paper

Active monitoring and control of electron beam induced contaminationVLADAR, Andras E; POSTEK, Michael T; VANE, Ronald et al.SPIE proceedings series. 2001, pp 835-843, isbn 0-8194-4030-2Conference Paper

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