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Results 1 to 25 of 176

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Infrared and terahertz spectromicroscopy beam line BL6B(IR) at UVSOR-IIKIMURA, S; NAKAMURA, E; NISHI, T et al.Infrared physics & technology. 2006, Vol 49, Num 1-2, pp 147-151, issn 1350-4495, 5 p.Conference Paper

The AILES Infrared Beamline on the third generation Synchrotron Radiation Facility SOLEILROY, Pascale; ROUZIERES, Mathieu; ZEMING QI et al.Infrared physics & technology. 2006, Vol 49, Num 1-2, pp 139-146, issn 1350-4495, 8 p.Conference Paper

High-pressure far-infrared measurements at SINBADCESTELLI GUIDI, M; NUCARA, A; CALVANI, P et al.Infrared physics & technology. 2004, Vol 45, Num 5-6, pp 365-368, issn 1350-4495, 4 p.Conference Paper

Evolution of the high power THz source program at Jefferson LabNEIL, George R; WILLIAMS, G. P.Infrared physics & technology. 2004, Vol 45, Num 5-6, pp 389-391, issn 1350-4495, 3 p.Conference Paper

Diffraction theory of imaging with X-ray compound refractive lensKOHN, V; SNIGIREVA, I; SNIGIREV, A et al.Optics communications. 2003, Vol 216, Num 4-6, pp 247-260, issn 0030-4018, 14 p.Article

Depth-graded multilayersMORAWE, Ch; PEFFEN, J.-Ch; KOZHEVNIKOV, I. V et al.Journal de physique. IV. 2003, Vol 104, pp 239-242, issn 1155-4339, 4 p.Conference Paper

Advances in microdiffraction with X-ray waveguideLAGOMARSINO, S; CEDOLA, A; DI FONZO, S et al.Crystal research and technology (1979). 2002, Vol 37, Num 7, pp 758-769, issn 0232-1300Article

A modified pinkerton-type helium gas-flow system for high-accuracy data collection at the X3 SUNY synchrotron beamline at NSLSRIBAUD, Lynn; GUANG WU; YUEGANG ZHANG et al.Journal of applied crystallography. 2001, Vol 34, pp 76-79, issn 0021-8898, 1Article

Peak profile function for synchrotron X-ray diffractometryIDA, T; HIBINO, H; TORAYA, H et al.Journal of applied crystallography. 2001, Vol 34, pp 144-151, issn 0021-8898, 2Article

The calculation and measurement of synchrotron radiation flux : finite emittance effectsBAWAGAN, A. D. O.Chemical physics letters. 2001, Vol 334, Num 1-3, pp 187-194, issn 0009-2614Article

Third-generation synchrotron radiation source at the joint institute of nuclear researchBALALYKIN, N. I; BELOSHITSKII, P. F; SHIRKOV, G. D et al.Atomic energy (New York, N.Y.). 2001, Vol 91, Num 4, pp 841-849, issn 1063-4258Article

The Huber G670 imaging-plate Guinier camera tested on beamline 1711 at the MAX II synchrotronSTAHL, K.Journal of applied crystallography. 2000, Vol 33, pp 394-396, issn 0021-8898, 2Article

Magnetic diffraction of X-raysLAUNDY, D.Radiation physics and chemistry (1993). 1999, Vol 56, Num 1-2, pp 151-158, issn 0969-806XArticle

Asymmetrically cut crystals as optical elements for coherent x-ray beam conditioningSOUVOROV, A; DRAKOPOULOS, M; SNIGIREVA, I et al.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 10A, pp A184-A192, issn 0022-3727Article

Imaging of the energy flow in the three-beam case of x-ray diffractionHEYROTH, F; HÖCHE, H.-R; EISENSCHMIDT, C et al.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 10A, pp A133-A138, issn 0022-3727Article

Examination of Si1-xGex laterally graded crystals for use in high brilliance synchrotron beamsVELDKAMP, M; ERKO, A; SMIRNOVA, I et al.Materials science forum. 1999, pp 597-602, issn 0255-5476, isbn 0-87849-833-8Conference Paper

A (2+3)-type surface diffractometer : Mergence of the z-axis and (2+2)-type geometriesVLIEG, E.Journal of applied crystallography. 1998, Vol 31, pp 198-203, issn 0021-8898, 2Article

Use of image-processing tools for texture analysis of high-energy X-ray synchrotron dataFISKER, R; POULSEN, H. F; SCHOU, J et al.Journal of applied crystallography. 1998, Vol 31, pp 647-653, issn 0021-8898, 5Article

Synchrotron-based Compton scattering studiesMANNINEN, S.Radiation physics and chemistry (1993). 1998, Vol 51, Num 4-6, pp 481-486, issn 0969-806XConference Paper

Microbeam-forming methods for synchrotron radiationICE, G. E.X-ray spectrometry. 1997, Vol 26, Num 6, pp 315-326, issn 0049-8246Article

The LURE-IMT X-ray fluorescence photon microprobe : Special issue on micro- and ultratrace X-ray fluorescence analysisCHEVALLIER, P; DHEZ, P; LEGRAND, F et al.Journal of trace and microprobe techniques. 1996, Vol 14, Num 3, pp 517-539, issn 0733-4680Article

Synchrotron radiation sourcesMARKS, N.International journal of radiation applications and instrumentation. Part C, Radiation physics and chemistry. 1995, Vol 45, Num 3, pp 315-331, issn 1359-0197Article

Etudes expérimentale et théorique d'optiques focalisantes de type Bragg-Fresnel gravées sur des miroirs interférentiels adaptés aux domaines X et X-UV = Experimental and theoretical study of Bragg-Fresnel lenses ion etched on multilayer structure for the X and X-UV energy rangeIdir, Mourad; Barchewitz, R.1994, 189 p.Thesis

ASTRID: the Aarhus dual purpose storage ring for positive/negative ions and electronsIGGERHØJ.Journal de physique. IV. 1994, Vol 4, Num 9, pp 349-356, issn 1155-4339Conference Paper

Machine physicsERIKSSON, M.Journal de physique. IV. 1994, Vol 4, Num 9, pp 19-26, issn 1155-4339Conference Paper

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