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Advances in metrology for x-ray and EUV optics (2-3 August 2005, San Diego, California, USA)Assoufid, Lahsen; Takacs, Peter Z; Taylor, John S et al.Proceedings of SPIE. 2005, isbn 0-8194-5926-7, 1Vol, pagination multiple, isbn 0-8194-5926-7Conference Proceedings

Prospects of applications of new devices based on capillary optics for radiation material scienceKOZHAKHMETOV, Serik.SPIE proceedings series. 2005, pp 59741E.1-59741E.4, isbn 0-8194-5993-3, 1VolConference Paper

Extremely Lightweight X-Ray Optics Based on Thin SubstratesHUDEC, R; SIK, J; LORENC, M et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8076, issn 0277-786X, isbn 978-0-8194-8666-0, 807604.1-807604.9Conference Paper

International Conference Coherent Control of the Fundamental Processes in Optics and X-Rays-Optics (CCFP'2006)Laser physics. 2007, Vol 17, Num 5, pp 635-671, issn 1054-660X, 36 p.Conference Paper

X-ray and Neutron Capillary Optics II (22-26 September 2004, Zvenigorod, Russia)Kumakhov, Muradin Abubekirovich.Proceedings of SPIE, the International Society for Optical Engineering. 2005, issn 0277-786X, isbn 0-8194-5949-6, 1Vol, XI-336 p, isbn 0-8194-5949-6Conference Proceedings

Latest metrology results with the SOLEIL synchrotron LTPTHOMASSET, Muriel; BROCHET, Sylvain; POLACK, Francois et al.Proceedings of SPIE. 2005, pp 592102.1-592102.9, isbn 0-8194-5926-7, 1VolConference Paper

Surface figuring and measurement methods with spatial resolution close to 0.1mm for X-ray mirror fabricationMIMURA, H; YUMOTO, H; ISHIKAWA, T et al.Proceedings of SPIE. 2005, pp 59210M.1-59210M.8, isbn 0-8194-5926-7, 1VolConference Paper

Advances in computational methods for x-ray optics II (21-24 August 2011, San Diego, California, United States)Rio, Manuel Sanchez del; Chubar, Oleg.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8141, issn 0277-786X, isbn 978-0-8194-8751-3, 1 vol, isbn 978-0-8194-8751-3Conference Proceedings

Advances in X-ray/EUV optics and components V (2-3 August 2010, San Diego, California, United States)Khounsary, Ali M; Morawe, Christian; Goto, Shunji et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7802, issn 0277-786X, isbn 978-0-8194-8298-3, 1 vol, isbn 978-0-8194-8298-3Conference Proceedings

International Conference Coherent Control of the Fundamental Process in Optics and X-ray-Optics (CCFP'2006)Laser physics. 2007, Vol 17, Num 9, pp 1187-1198, issn 1054-660X, 11 p.Conference Paper

Adaptive x-ray optics (3-5 August 2010, San Diego, California, United States)Khounsary, Ali M; O'Dell, Stephen L; Restaino, Sergio R et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7803, issn 0277-786X, isbn 978-0-8194-8299-0, 1Vol, various pagings, isbn 978-0-8194-8299-0Conference Proceedings

Beam Splitting Mirrors for an APS BeamlineKHOUNSARY, Ali; MCNULTY, Ian.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 67050P.1-67050P.6, issn 0277-786X, isbn 978-0-8194-6853-6, 1VolConference Paper

Silicon Planar Lenses for High Energy X-ray NanofocusingSNIGIREV, A; SNIGIREVA, I; GRIGORIEV, M et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 670506.1-670506.11, issn 0277-786X, isbn 978-0-8194-6853-6, 1VolConference Paper

Comparisons between EUV at-wavelength metrological methodsSUGISAKI, Katsumi; OKADA, Masashi; OUCHI, Chidane et al.Proceedings of SPIE. 2005, pp 59210D.1-59210D.8, isbn 0-8194-5926-7, 1VolConference Paper

A high resolution X-ray spectrometer utilizing Kirkpatrick-Baez optics and off-plane gratingsMCENTAFFER, Randall L; HUDEC, Rene; MURRAY, Neil J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7360, issn 0277-786X, isbn 978-0-8194-7634-0 0-8194-7634-X, 1Vol, 736014.1-736014.10Conference Paper

Mirrors from light-weight sintered micro-spheres combined with replication techniquesULMER, M. P; VAYNMAN, S; GRAHAM, M. E et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 66660U.1-66660U.7, issn 0277-786X, isbn 978-0-8194-6814-7Conference Paper

Shearing interferometer for quantifying the coherence of hard X-ray beamsPFEIFFER, F; BUNK, O; SCHULZE-BRIESE, C et al.Physical review letters. 2005, Vol 94, Num 16, pp 164801.1-164801.4, issn 0031-9007Article

EUV and x-ray optics (synergy between laboratory and space II)Hudec, R; Pina, Ladislav.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8076, issn 0277-786X, isbn 978-0-8194-8666-0, 1 vol, isbn 978-0-8194-8666-0Conference Proceedings

Advances in X-ray/EUV optics and components VI (22-24 August 2011, San Diego, California, United States)Morawe, Christian; Khounsary, Ali M; Goto, Shunji et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8139, issn 0277-786X, isbn 978-0-8194-8749-0, 1 vol, isbn 978-0-8194-8749-0Conference Proceedings

Crystal Quality Analysis and Improvement Using X-ray TopographyMAJ, J. A; GOETZE, K; MACRANDER, A. T et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7077, pp 70771L.1-70771L.5, issn 0277-786X, isbn 978-0-8194-7297-7, 1VolConference Paper

Comparison of measured and analytical ultraviolet light attenuationSANDERS, Jack T.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7794, issn 0277-786X, isbn 978-0-8194-8290-7, 77940R.1-77940R.5Conference Paper

Small X-Ray Telescope Based on Lobster Eye X-Ray Optics and Pixel DetectorTICHY, Vladimir; HROMCIK, Martin; HUDEC, René et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7360, issn 0277-786X, isbn 978-0-8194-7634-0 0-8194-7634-X, 1Vol, 736011.1-736011.7Conference Paper

A theoretical study of two-dimensional point focusing by two multilayer Laue lensesHANFEI YAN; MASER, Jorg; HYON CHOL KANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7077, pp 70770Q.1-70770Q.8, issn 0277-786X, isbn 978-0-8194-7297-7, 1VolConference Paper

Investigation of ion - implanted layers by X-ray reflectometry methodTOURYANSKI, A. G; GERASIMENKO, N. N; APRELOV, S. A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 143-149, issn 0277-786X, isbn 0-8194-5949-6, 1Vol, 7 p.Conference Paper

Table-top z-pinch and laser-plasma x-ray/EUV facility SparkyKANTSYREV, V; FEDIN, D; SAVAGE, M et al.SPIE proceedings series. 2005, pp 59180W.1-59180W.7, isbn 0-8194-5923-2, 1VolConference Paper

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