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Self-marking phase-stepping electronic speckle pattern interfometry (ESPI) for 3D displacement measurement on cathode ray tube (CRT)-panelsHUANG, M. J; LIU, Zhao-Cheng; JHANG, Jhen-Huei et al.Optics and lasers in engineering. 2002, Vol 38, Num 5, pp 245-260, issn 0143-8166Article

Influence of phase drift on optical coherence tomography using a CCD camera-based heterodyne detection techniqueAKIBA, Masahiro; CHAN, Kin Pui; TANNO, Naohiro et al.Optical review. 2002, Vol 9, Num 4, pp 170-175, issn 1340-6000, 6 p.Article

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Interferometric technique for determining the energy deposition in gas-flow nuclear-pumped lasersPIKULEV, A. A.Quantum electronics (Woodbury). 2001, Vol 31, Num 6, pp 500-504, issn 1063-7818Article

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Exact phase error effect on contrast measurement in four-step phase-shifting interferometryVIKRAM, Chandra S.Optik (Stuttgart). 2000, Vol 111, Num 12, pp 563-564, issn 0030-4026Article

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Optical methods for residual strain measurementHUNG, Michael Y. Y.Optics and lasers in engineering. 1997, Vol 27, Num 1, issn 0143-8166, 137 p.Serial Issue

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Interferometry with coherent Gaussian illumination for roughness and shape measurementSANTOS, Guadalupe; CYWIAK, Moisés; BARRIENTOS, Bernardino et al.Optics communications. 2004, Vol 239, Num 4-6, pp 265-273, issn 0030-4018, 9 p.Article

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Phase shifting SEM moiré methodHUIMIN XIE; HAIXIA SHANG; FULONG DAI et al.Optics and laser technology. 2004, Vol 36, Num 4, pp 291-297, issn 0030-3992, 7 p.Article