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Interfacial layers in Ta₂O₅ based stacks and constituent depth profiles by spectroscopic ellipsometryKARMAKOV, Y; PASKALEVA, A; ATANASSOVA, E et al.Applied surface science. 2012, Vol 258, Num 10, pp 4507-4512, issn 0169-4332, 6 p.Article

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Triple axis diffractometric investigations of the microstructure of thin Al_xGa_1-xN epitaxial filmsZIELINSKA-ROHOZINSKA, E; KOWALSKA, M; PAKULA, K et al.Crystal research and technology (1979). 2003, Vol 38, Num 11, pp 951-955, issn 0232-1300, 5 p.Article

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Structure, electrical and optical properties of N-In codoped ZnO thin films prepared by ion-beam enhanced deposition methodNINGYI YUAN; JINHUA LI; LINING FAN et al.Journal of crystal growth. 2006, Vol 290, Num 1, pp 156-160, issn 0022-0248, 5 p.Article

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