Hydrogenated diamond crystal C(100) conductivity studied by STMHELLNER, L; MAYNE, A. J; BERNARD, R et al.Diamond and related materials. 2005, Vol 14, Num 9, pp 1529-1534, issn 0925-9635, 6 p.Article

Contact mode potentiometric measurements with an atomic force microscope on high resistive perovskite thin filmsREICHENBERG, B; TIEDKE, S; SZOT, K et al.Journal of the European Ceramic Society. 2005, Vol 25, Num 12, pp 2353-2356, issn 0955-2219, 4 p.Conference Paper

Electron-beam-induced potentials in semiconductors: calculation and measurement with an SEM/SPM hybrid systemTHOMAS, Ch; JOACHIMSTHALER, I; HEIDERHOFF, R et al.Journal of physics. D, Applied physics (Print). 2004, Vol 37, Num 20, pp 2785-2794, issn 0022-3727, 10 p.Article

Ni ultrathin film development on SrTiO₃(100) surfaceVLACHOS, D; KAMARATOS, M; FOULIAS, S. D et al.Surface science. 2004, Vol 550, Num 1-3, pp 213-222, issn 0039-6028, 10 p.Article

Electrical resistance of a monatomic step on a crystal surfaceMATSUDA, Iwao; UENO, Masashi; HIRAHARA, Toru et al.Physical review letters. 2004, Vol 93, Num 23, pp 236801.1-236801.4, issn 0031-9007Article

Effect of different substituents on conducting character of azos and local states of azo/TiOPc compositesJIAN CAO; JINGZHI SUN; MANG WANG et al.Thin solid films. 2003, Vol 429, Num 1-2, pp 152-158, issn 0040-6090, 7 p.Article

Measurements of electron-transfer rates of charge-storage molecular monolayers on Si(100). Toward hybrid molecular/semiconductor information storage devicesROTH, Kristian M; YASSERI, Amir A; KUHR, Werner G et al.Journal of the American Chemical Society. 2003, Vol 125, Num 2, pp 505-517, issn 0002-7863, 13 p.Article

Phase control of external photoeffect in a bichromatic laser fieldASTAPENKO, V. A; BUIMISTROV, V. M.Journal of physics. D, Applied physics (Print). 2003, Vol 36, Num 12, pp 1371-1374, issn 0022-3727, 4 p.Article

Surface analysis of plasma-treated polydimethylsiloxane by x-ray photoelectron spectroscopy and surface voltage decayYOUN, Bok-Hee; HUH, Chang-Su.Surface and interface analysis. 2003, Vol 35, Num 5, pp 445-449, issn 0142-2421, 5 p.Article

The role of dangling-bond, hydrogen and adsorbate in diamond surface conductionYING DAI; BAIBIAO HUANG; DADI DAI et al.Diamond and related materials. 2003, Vol 12, Num 1, pp 15-19, issn 0925-9635, 5 p.Article

Surface conductivity on hydrogen terminated diamondWILLIAMS, Oliver A; JACKMAN, Richard B.Semiconductor science and technology. 2003, Vol 18, Num 3, pp S34-S40, issn 0268-1242Article

Electronic properties of hydrogen and oxygen terminated surfaces of polycrystalline diamond filmsROSSI, M. C; SPAZIANI, F; SALVATORI, S et al.Physica status solidi. A. Applied research. 2003, Vol 199, Num 1, pp 71-76, issn 0031-8965, 6 p.Conference Paper

Theoretical problems of scanning capacitance microscopySHIK, Alexander; RUDA, Harry E.Surface science. 2003, Vol 532-35, pp 1132-1135, issn 0039-6028, 4 p.Conference Paper

Surface characterization of silicone polymer used as an outdoor insulator by the measurement of surface voltage decayYOUN, Bok-Hee; HUH, Chang-Su.Surface and interface analysis. 2002, Vol 33, Num 12, pp 954-959, issn 0142-2421, 6 p.Article

Black diamond: a new material for active electronic devicesWILLIAMS, Oliver A; JACKMAN, Richard B; NEBEL, Christoph et al.Diamond and related materials. 2002, Vol 11, Num 3-6, pp 396-399, issn 0925-9635Conference Paper

Contact charging and surface charge measurement using a scanning Kelvin techniqueNALBACH, M; KLIEM, H.Physica status solidi. A. Applied research. 2000, Vol 178, Num 2, pp 715-719, issn 0031-8965Article

X-ray photoelectron spectroscopy of nickel dithiolene complex Langmuir-Blodgett filmsYANG, D.-Q; YAN SUN; YUN GUO et al.Applied surface science. 1999, Vol 148, Num 3-4, pp 196-204, issn 0169-4332Article

Mechanisms of surface conductivity in thin film diamond : Application to high performance devicesHUI JIN LOOI; PANG, L. Y. S; MOLLOY, A. B et al.Carbon (New York, NY). 1999, Vol 37, Num 5, pp 801-805, issn 0008-6223Conference Paper

Imaging of electrical features in organic thin films by scanning Maxwell-stress microscopySHIN, H. K; INOUE, T; KWON, Y. S et al.Synthetic metals. 1999, Vol 102, Num 1-3, pp 1579-1580, issn 0379-6779Conference Paper

Structure-dependent electrical conduction through indium atomic layers on the Si(111) surfaceTAKEDA, S; XIAO TONG; INO, S et al.Surface science. 1998, Vol 415, Num 3, pp 264-273, issn 0039-6028Article

Surface Coulomb explosions : The influence of initial charge distributionsCHENG, H.-P; GILLASPY, J. D.Computational materials science. 1998, Vol 9, Num 3-4, pp 285-294, issn 0927-0256Article

The motion of electric charges on and near insulator surfacesWINTLE, H. J.Le Vide (1995). 1998, Vol 53, Num 287, pp 49-58, issn 1266-0167, SUPConference Paper

Metal-oxide interactions on copper-segregated and copper-deposited TiO₂ rutile (001) surfacesTHIBADO, P. M; BONNELL, D. A.Journal of the American Ceramic Society. 1997, Vol 80, Num 5, pp 1267-1273, issn 0002-7820Article

Resonant electron emission of silver spheroids induced by laser surface plasmon excitationMONCHICOURT, P; RAYNAUD, M; SARINGAR, H et al.Journal of physics. Condensed matter (Print). 1997, Vol 9, Num 27, pp 5765-5775, issn 0953-8984Article

Phase transition of contact-electrified negative charges on a thin silicon oxide in airFUKANO, Y; SUGAWARA, Y; UCHIHASHI, T et al.Japanese journal of applied physics. 1996, Vol 35, Num 4A, pp 2394-2401, issn 0021-4922, 1Article