Chemical bath deposition of Bi₂S₃ films by a novel deposition systemCHAO GAO; HONGLIE SHEN; LEI SUN et al.Applied surface science. 2011, Vol 257, Num 17, pp 7529-7533, issn 0169-4332, 5 p.Article

Electrical properties of vacuum-annealed titanium-doped indium oxide filmsVAN, L. T; RATH, J. K; SCHROPP, R. E. I et al.Applied surface science. 2011, Vol 257, Num 22, pp 9461-9465, issn 0169-4332, 5 p.Article

Fabrication of silicon wafer with ultra low reflectance by chemical etching methodYINGLI CAO; AIMIN LIU; HONGHAO LI et al.Applied surface science. 2011, Vol 257, Num 17, pp 7411-7414, issn 0169-4332, 4 p.Article

Influence of strain/stress on the nonlinear-optical properties of sprayed deposited ZnO:Al thin filmsBAHEDI, K; ADDOU, M; EL JOUAD, M et al.Applied surface science. 2011, Vol 257, Num 18, pp 8003-8005, issn 0169-4332, 3 p.Article

Investigations on co-evaporated Cu₂SnSe₃ and Cu₂SnSe₃―ZnSe thin filmsUDAY BHASKAR, P; SURESH BABU, G; KISHORE KUMAR, Y. B et al.Applied surface science. 2011, Vol 257, Num 20, pp 8529-8534, issn 0169-4332, 6 p.Article

Optical properties of p-type CuAlO₂ thin film grown by rf magnetron sputteringMIN FANG; HAIPING HE; BIN LU et al.Applied surface science. 2011, Vol 257, Num 20, pp 8330-8333, issn 0169-4332, 4 p.Article

The transparence comparison of Ga- and Al-doped ZnO thin filmsLI, Zheng-Zheng; CHEN, Zhi-Zhan; WEI HUANG et al.Applied surface science. 2011, Vol 257, Num 20, pp 8486-8489, issn 0169-4332, 4 p.Article

Effect of fabrication parameters on morphological and optical properties of highly doped p-porous siliconZARE, Maryam; SHOKROLLAHI, Abbas; SERAJI, Faramarz E et al.Applied surface science. 2011, Vol 257, Num 22, pp 9507-9514, issn 0169-4332, 8 p.Article

Effect of argon ion activity on the properties of Y₂O₃ thin films deposited by low pressure PACVDBARVE, S. A; JAGANNATH; DEO, M. N et al.Applied surface science. 2010, Vol 257, Num 1, pp 215-221, issn 0169-4332, 7 p.Article

Effect of composition and deposition temperature on the characteristics of Ga doped ZnO thin filmsKIM, Y. H; JEONG, J; LEE, K. S et al.Applied surface science. 2010, Vol 257, Num 1, pp 109-115, issn 0169-4332, 7 p.Article

Effect of sputtering anisotropic ejection on the optical properties and residual stress of Nb₂O₅ thin filmsTIEN, Chuen-Lin.Applied surface science. 2010, Vol 257, Num 2, pp 481-486, issn 0169-4332, 6 p.Article

Error minimization in the envelope method for the determination of optical constants of a thin filmKAR, Meenakshi.Surface and interface analysis. 2010, Vol 42, Num 3, pp 145-150, issn 0142-2421, 6 p.Article

Growth of b-axis oriented VO₂ thin films on glass substrates using ZnO buffer layerCHIU, Te-Wei; TONOOKA, Kazuhiko; KIKUCHI, Naoto et al.Applied surface science. 2010, Vol 256, Num 22, pp 6834-6837, issn 0169-4332, 4 p.Article

Influence of temperature annealing on optical properties of SrTiO₃/BaTiO₃ multilayered films on indium tin oxideSUPASAI, T; DANGTIP, S; LEARNGARUNSRI, P et al.Applied surface science. 2010, Vol 256, Num 14, pp 4462-4467, issn 0169-4332, 6 p.Article

Preparation and photo-induced superhydrophilicity of composite TiO₂―SiO₂―In₂O₃ thin filmESHAGHI, A; PAKSHIR, M; MOZAFFARINIA, R et al.Applied surface science. 2010, Vol 256, Num 23, pp 7062-7066, issn 0169-4332, 5 p.Article

Resonant soft X-ray reflectivity as a sensitive probe to investigate polished zinc sulphide surfaceGUPTA, Pooja; SINHA, A. K; MODI, M. H et al.Applied surface science. 2010, Vol 257, Num 1, pp 210-214, issn 0169-4332, 5 p.Article

Effects of air annealing on the optical, electrical, and structural properties of nanostructured ZnS/Au/ZnS filmsGHORASHI, S. M. B; BEHJAT, A; NEGHABI, M et al.Applied surface science. 2010, Vol 257, Num 5, pp 1602-1606, issn 0169-4332, 5 p.Article

Investigating the interfacial interaction of different aminosilane treated nano silicas with a polyurethane coatingROSTAMI, M; RANJBAR, Z; MOHSENI, M et al.Applied surface science. 2010, Vol 257, Num 3, pp 899-904, issn 0169-4332, 6 p.Article

Oblique angle deposition of TiO₂ thin films prepared by electron-beam evaporationMIN WOOK PYUN; EUI JUNG KIM; YOO, Dae-Hwang et al.Applied surface science. 2010, Vol 257, Num 4, pp 1149-1153, issn 0169-4332, 5 p.Article

Optical and electrical characteristics of Al-doped ZnO thin films prepared by aqueous phase depositionYAO, Pin-Chuan; HANG, Shih-Tse; LIN, Yu-Shuan et al.Applied surface science. 2010, Vol 257, Num 5, pp 1441-1448, issn 0169-4332, 8 p.Article

Electronic and optical properties of La-aluminate dielectric thin films on Si (100)TAHIR, Dahlang; EUN HYE CHOI; YOUNG JOON CHO et al.Surface and interface analysis. 2010, Vol 42, Num 10-11, pp 1566-1569, issn 0142-2421, 4 p.Conference Paper

Comparative study on structural and optical properties of CdS films fabricated by three different low-cost techniquesRAVICHANDRAN, K; PHILOMINATHAN, P.Applied surface science. 2009, Vol 255, Num 11, pp 5736-5741, issn 0169-4332, 6 p.Article

Effect of fluorine doping on highly transparent conductive spray deposited nanocrystalline tin oxide thin filmsMOHOLKAR, A. V; PAWAR, S. M; RAJPURE, K. Y et al.Applied surface science. 2009, Vol 255, Num 23, pp 9358-9364, issn 0169-4332, 7 p.Article

Microstructures, optical and electrical properties of In-doped ZnO thin films prepared by sol-gel methodCHEN, K. J; HUNG, F. Y; CHANG, S. J et al.Applied surface science. 2009, Vol 255, Num 12, pp 6308-6312, issn 0169-4332, 5 p.Article

Spectroscopic ellipsometry of SiO₂/CdTe nanocomposite thin films prepared by dc magnetron sputteringBERA, S. K; BHATTACHARYYA, D; GHOSH, R et al.Applied surface science. 2009, Vol 255, Num 13-14, pp 6634-6640, issn 0169-4332, 7 p.Article