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Results 1 to 25 of 923

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Differential ion beam sputtering of segregated phases in aluminum casting alloysNGUYEN, Chuong L; WIRTZ, Tom; FLEMING, Yves et al.Applied surface science. 2013, Vol 265, pp 489-494, issn 0169-4332, 6 p.Article

Improvement of anti-oxidation capability and tribological property of arc ion plated Ag film by alloying with CuXIAOMING GAO; JIAYI SUN; MING HU et al.Applied surface science. 2011, Vol 257, Num 17, pp 7643-7648, issn 0169-4332, 6 p.Article

A review of Ga+ FIB/SIMSGIANNUZZI, Lucille A; UTLAUT, M.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 475-478, issn 0142-2421, 4 p.Conference Paper

Analysis and fragmentation of organic samples by (low-energy) dynamic SIMSNGO, K. Q; PHILIPP, P; JIN, Y et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 88-91, issn 0142-2421, 4 p.Conference Paper

Cesium retention during sputtering with low energy Cs+ and oxygen floodingBERGHMANS, B; RIP, J; VANDERVORST, W et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 225-227, issn 0142-2421, 3 p.Conference Paper

Characterization and quantification of biological micropatterns using cluster SIMSCHEN, Li-Jung; SHAH, Sunny S; VERKHOTUROV, Stanislav V et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 555-558, issn 0142-2421, 4 p.Conference Paper

Comparison of MeV monomer ion and keV cluster ToF-SIMSJONES, Brian N; MATSUO, Jiro; NAKATA, Yoshihiko et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 249-252, issn 0142-2421, 4 p.Conference Paper

Massive clusters: Secondary emission from qkeV to qMeV. New emission processes? New SIMS probe?DELLA-NEGRA, S; DEPAUW, J; GUILLERMIER, C et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 62-65, issn 0142-2421, 4 p.Conference Paper

New neutral cesium evaporation chamber and UHV suitcaseBENDLER, B; BARRAHMA, R; PHILIPP, P et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 514-517, issn 0142-2421, 4 p.Conference Paper

Sputtering soft materials with molecular projectiles: a microscopic viewDELCORTE, A; GARRISON, B. J; HAMRAOUI, K et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 16-19, issn 0142-2421, 4 p.Conference Paper

The Pegase project, a new solid surface probe: focused massive cluster ion beamsDELLA-NEGRA, S; ARIANER, J; DEPAUW, J et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 66-69, issn 0142-2421, 4 p.Conference Paper

The Storing Matter technique: Application to polymer samples using Ag collectorsBECKER, N; WIRTZ, T; MIGEON, H.-N et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 413-416, issn 0142-2421, 4 p.Conference Paper

ToF-SIMS depth profiling of trehalose: The effect of analysis beam dose on the quality of depth profilesMURAMOTO, Shin; BRISON, Jeremy; CASTNER, David G et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 58-61, issn 0142-2421, 4 p.Conference Paper

Long-life bismuth liquid metal ion source for focussed ion beam micromachining applicationMAZAROV, P; MELNIKOV, A; WERNHARDT, R et al.Applied surface science. 2008, Vol 254, Num 22, pp 7401-7404, issn 0169-4332, 4 p.Article

A study of theoretical depth resolution of GaAs/AlAs reference material with low energy inert-gas ions by monte Carlo simulationBANDO, Hideaki; TAMURA, Keiji; SHIMIZU, Ryuichi et al.Surface and interface analysis. 2007, Vol 39, Num 1, pp 9-15, issn 0142-2421, 7 p.Article

Hydrocarbon film growth by energetic CH3 molecule impact on SiC (001) surfaceGOU, F; MENG CHUANLIANG; ZHOULING, Z. T et al.Applied surface science. 2007, Vol 253, Num 20, pp 8517-8523, issn 0169-4332, 7 p.Article

Surface chemistry and optimization of focused ion beam iodine-enhanced etching of indium phosphideCALLEGARI, Victor; NELLEN, Philipp M; TIANHE YANG et al.Applied surface science. 2007, Vol 253, Num 22, pp 8969-8973, issn 0169-4332, 5 p.Article

Cluster ion sputtering : molecular ion yield relationships for different cluster primary ions in static SIMS of organic materialsSEAH, M. P.Surface and interface analysis. 2007, Vol 39, Num 11, pp 890-897, issn 0142-2421, 8 p.Article

Effects of surface treatments and annealing on carbon-based molecular sieve membranes for gas separationWANG, Liang-Jun; HONE, Franklin Chau-Nan.Applied surface science. 2005, Vol 240, Num 1-4, pp 161-174, issn 0169-4332, 14 p.Article

Ion beam sputtering for progressive reduction of nanostructures dimensionsSAVOLAINEN, M; TOUBOLTSEV, V; KOPPINEN, P et al.Applied physics. A, Materials science & processing (Print). 2004, Vol 79, Num 7, pp 1769-1773, issn 0947-8396, 5 p.Article

Atom-surface diffraction: a trajectory descriptionGUANTES, R; SANZ, A. S; MARGALEF-ROIG, J et al.Surface science reports. 2004, Vol 53, Num 6-8, pp 199-330, issn 0167-5729, 132 p.Article

Energetics of MCs+n molecular ions emitted from Cs+ irradiated surfacesSARKAR, Subhendu; CHAKRABORTY, Purushottam; GNASER, Hubert et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 19, pp 195427.1-195427.5, issn 1098-0121, 1Article

Separation of potential and kinetic electron emission for grazing impact of multiply charged Ar ions on a LiF(001) surfaceSTÖCKL, J; SUTA, T; DITROI, F et al.Physical review letters. 2004, Vol 93, Num 26, pp 263201.1-263201.4, issn 0031-9007, 1Article

Surface-aligned ion-molecule reaction on the surface of a molecular crystal CD3+ + CD3I → C2D5+ + DILEE, Jae-Gook; YATES, John T.Journal of the American Chemical Society. 2004, Vol 126, Num 40, pp 13071-13078, issn 0002-7863, 8 p.Article

Sub-damage-threshold femtosecond laser ablation from crystalline Si: surface nanostructures and phase transformationCOSTACHE, F; KOUTEVA-ARGUIROVA, S; REIF, J et al.Applied physics. A, Materials science & processing (Print). 2004, Vol 79, Num 4-6, pp 1429-1432, issn 0947-8396, 4 p.Conference Paper

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