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TOF-SIMS study on surface modification of reed switch blades by pulsing nitrogen plasmaARUSHANOV, K. A; DROZDOV, M. N; KARABANOV, S. M et al.Applied surface science. 2013, Vol 265, pp 642-647, issn 0169-4332, 6 p.Article

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Possibilities of LA-ICP-MS technique for the spatial elemental analysis of the recent fish scales: Line scan vs. depth profilingHOLA, Markéta; KALVODA, Jiří; NOVAKOVA, Hana et al.Applied surface science. 2011, Vol 257, Num 6, pp 1932-1940, issn 0169-4332, 9 p.Article

A beneficial application of backside SIMS for the depth profiling characterization of implanted siliconFUJIYAMA, N; HASEGAWA, T; SUDA, T et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 654-656, issn 0142-2421, 3 p.Conference Paper

Depth Profiling of Anodic Tantalum Oxide Films with Gold Cluster IonsPOERSCHKE, David; WUCHER, Andreas.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 171-174, issn 0142-2421, 4 p.Conference Paper

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Fundamental studies of molecular depth profiling using organic delta layers as model systemsLU, C; WUCHER, A; WINOGRAD, N et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 81-83, issn 0142-2421, 3 p.Conference Paper

Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutralsWILLINGHAM, D; BRENES, D. A; WINOGRAD, N et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 45-48, issn 0142-2421, 4 p.Conference Paper

MCs⁺ depth profiling using cluster primary ionsNIEHUIS, E; GREHL, T; KOLLMER, F et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 204-206, issn 0142-2421, 3 p.Conference Paper

Numerical approach to resolve mass interference in depth profiling As in SiGeGUI, D; HUANG, Y. H; NISTALA, R. R et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 535-538, issn 0142-2421, 4 p.Conference Paper

RIMS analysis of Ca and Cr in Genesis solar wind collectorsVERYOVKIN, I. V; TRIPA, C. E; ZINOVEV, A. V et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 467-469, issn 0142-2421, 3 p.Conference Paper

Surface analysis of polyvinyl chloride bombarded by Ar⁺ and charged water dropletsHIRAOKA, Kenzo; IIJIMA, Yoshitoki; SAKAI, Yuji et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 236-240, issn 0142-2421, 5 p.Conference Paper

The effect of incident energy on molecular depth profiling of polymers with large Ar cluster ion beamsNINOMIYA, Satoshi; ICHIKI, Kazuya; YAMADA, Hideaki et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 221-224, issn 0142-2421, 4 p.Conference Paper

On the temperature dependence of Na migration in thin Si0₂ films during ToF-SIMS O₂⁺ depth profilingKRIVEC, Stefan; DETZEL, Thomas; BUCHMAYR, Michael et al.Applied surface science. 2010, Vol 257, Num 1, pp 25-32, issn 0169-4332, 8 p.Article

SIMS analysis of polymersWENG, Lu-Tao; BERTRAND, Patrick.Surface and interface analysis. 2010, Vol 42, Num 8, issn 0142-2421, 74 p.Serial Issue

TOF-SIMS depth profiling of deuterated polystyrene-block-poly(n-propyl methacrylate) diblock copolymer flimsLEE, Jihye; YOON, Donghwan; SHIN, Kwanwoo et al.Surface and interface analysis. 2010, Vol 42, Num 8, pp 1409-1416, issn 0142-2421, 8 p.Article

Formation and characterisation of NiAI-Ti coating on nickel-based superalloy B1900SHAHRIARI, F; ASHRAFIZADEH, F; SAATCHI, A et al.Surface and interface analysis. 2009, Vol 41, Num 5, pp 378-383, issn 0142-2421, 6 p.Article

XPS survey spectra simulation of nano-structured surfacesOLLIVIER, E; LANGERON, J. P.Surface and interface analysis. 2009, Vol 41, Num 4, pp 295-302, issn 0142-2421, 8 p.Article

Initial formation of contact layers on Ni/SiC samples studied by XPSPEEZ-GARCIA, S. A; CAO, Y; NYBORG, L et al.Surface and interface analysis. 2008, Vol 40, Num 8, pp 1144-1148, issn 0142-2421, 5 p.Article

RF-sputtered CrB₂ diffusion barrier for Ni/Au Ohmic contacts on p-CUCrO₂LIM, W. T; SADIK, P. W; NORTON, D. P et al.Applied surface science. 2008, Vol 254, Num 16, pp 5211-5215, issn 0169-4332, 5 p.Article

Defect engineering of ZnOWEBER, M. H; SELIM, F. A; SOLODOVNIKOV, D et al.Applied surface science. 2008, Vol 255, Num 1, pp 68-70, issn 0169-4332, 3 p.Article

Backscattering effect in quantitative AES sputter depth profiling of multilayersHOFMANN, S; WANG, J. Y; ZALAR, A et al.Surface and interface analysis. 2007, Vol 39, Num 10, pp 787-797, issn 0142-2421, 11 p.Article