EINIGE BEMERKUNGEN ZUR PRAEPARATION VON DUENNEN FOLIEN FUER DAS TEM DURCH LONENBESCHUSS = REMARQUES SUR LA PREPARATION DE LAMES MINCES PAR BOMBARDEMENT IONIQUE POUR LE MICROSCOPE ELECTRONIQUEMOLCIK M.1975; PRAKT. METALLOGR.; DTSCH.; DA. 1975; VOL. 12; NO 6; PP. 299-311; BIBL. 7 REF.; MEME DOC. ANGLArticle

AN INVESTIGATION OF SECOND PHASE PARTICLES IN ZIRCALOY-4 ALLOYSVANDER SANDE JB; BEMENT AL.1974; J. MATER. NUCL.; PAYS-BAS; DA. 1974; VOL. 52; NO 1; PP. 115-118; BIBL. 8 REF.Article

RADIATION DAMAGE AND DEGASSING PROCESSES AT BOMBARDMENT OF METALS BY POSITIVE IONSRADZHABOV TD; ISKANDEROVA ZA.1980; ZH. FIZ. KHIM.; SUN; DA. 1980-11; VOL. 54; NO 11; PP. 2891-2894; BIBL. 17 REF.Conference Paper

VITRIFICATION OF RECRYSTALLIZED FE₄₀NI₃₈MO₄B₁₈ DURING 5 KEV AR⁺ SPUTTERINGSWIJGENHOVEN H VAN; VANOPPEN J; STALS LM et al.1981; PHYS. STATUS SOLIDI, SECT. A, APPL. RES.; DDR; DA. 1981-09-16; VOL. 67; NO 1; PP. K5-K9; BIBL. 16 REF.Article

CONCENTRATION PROFILES OF 9 KEV DEUTERONS IN MOLYBDENUM AND NICKELALIMOV V KH; GORODETSKIJ AE; ZAKHAROV AP et al.1980; ZH. FIZ. KHIM.; SUN; DA. 1980-11; VOL. 54; NO 11; PP. 2882-2886; BIBL. 11 REF.Conference Paper

Progress in the preparation of cross-sectional TEM specimens by ion-beam thinningSTRECKER, Adolf; BÄDER, Ute; KELSCH, Marion et al.Zeitschrift für Metallkunde. 2003, Vol 94, Num 3, pp 290-297, issn 0044-3093, 8 p.Article

Quantitative Erfassung des Ionenstrahleinflusses beim Sputtering von Oxidschichten mit AES und XPS = Détermination quantitative de l'influence du jet d'ions dans la pulvérisation de couches d'oxyde par SPA et SPX = Quantitative evaluation of the ion-beam effect during sputtering of oxide layers using AES and XPSHOFMANN, S; SANZ, J.M.Fresenius' Zeitschrift für analytische Chemie. 1983, Vol 314, Num 3, pp 215-219, issn 0016-1152Article

Application of low energy inert gas ion bombardment in metallography = Gefügeentwicklung in der Metallographie mit Hilfe niederenergetischer InertgasionenPECHENYAKOV, I; KOVACHEVA, R.Praktische Metallographie. 1995, Vol 32, Num 1, pp 17-24, issn 0032-678XArticle

METALLOGRAPHIE-TAGUNG 1979 = METALLOGRAPHY MEETING 1979BECKER J.1980; METALL (BERL.); DEU; DA. 1980-01; VOL. 34; NO 1; PP. 61-62Conference Paper

Investigation of the structure of damage layers in TEM samples prepared using a focused ion beamRUBANOV, S; MUNROE, P. R.Journal of materials science letters. 2001, Vol 20, Num 13, pp 1181-1183, issn 0261-8028Article

Ion-beam thinning An atomistic view by molecular dynamics simulationsMAZZONE, A. M.Ultramicroscopy. 2000, Vol 85, Num 1, pp 15-21, issn 0304-3991Article

Amorphisation and surface morphology development at low-energy ion millingBARNA, A; PECZ, B; MENYHARD, M et al.Ultramicroscopy. 1998, Vol 70, Num 3, pp 161-171, issn 0304-3991Article

Ion beam etching technique in the preparation of samples for cross-sectional microscopy studies of thin films and hard coatingsPISCHOW, K. A; KORHONEN, A. S; ADAMIK, M et al.Surface & coatings technology. 1994, Vol 67, Num 1-2, pp 95-104, issn 0257-8972Article

Measurement of the impurity diffusion of In in Ag single crystals by ion-beam sputtering (IBS) = Messung der Fremddiffusion von In in Ag-Einkristallen mit Hilfe der IonenstrahlzerstaeubungMEHRER, H; WEILER, D.Zeitschrift für Metallkunde. 1984, Vol 75, Num 3, pp 203-205, issn 0044-3093Article

The nature of ion milling damage in MoSi₂BOLDT, P; WEATHERLY, G. C; EMBURY, J. D et al.Philosophical magazine letters. 1997, Vol 75, Num 2, pp 97-103, issn 0950-0839Article

Querschnittspräparation für die Untersuchung von dünnen Schichten, Grenzflächen, Pulvern und Fasern im Transmissions-elektronenmikroskop = The preparation of cross sections for the examination of thin layers, interfaces, powders and fibres in the transmission electron microscopeKLAAR, H.-J; CHING-AN HUANG.Praktische Metallographie. 1994, Vol 31, Num 6, pp 290-306, issn 0032-678XArticle

VERSUCHE ZUR REDUKTION FLUESSIGEN ALUMINIUMS = ATTEMPTS AT OEXIDIZING MOLTEN ALUMINIUMGERLACH J; HENNING U.1982; METALL (BERL.); DEU; DA. 1982-06; VOL. 36; NO 6; PP. 642-645; BIBL. 4 REF.Article

Transmissionselektronenmikroskopie von Strukturwerkstoffen aus intermetallischen Phasen = Transmission electron microscopy of structural materials made of intermetallic phasesWUNDERLICH, W; WUNDERLICH, W.WUNDERLICH, W; WUNDERLICH, W.Praktische Metallographie. 1994, Vol 31, Num 3, pp 120-134, issn 0032-678XArticle

Metallographische Praeparation von Metall/Keramik-Verbindungen = Metallographic preparation of metal/ceramic compositesTURWITT, M; ELSSNER, G; PETZOW, G et al.Praktische Metallographie. 1985, Vol 22, Num 5, pp 230-241, issn 0032-678XArticle

Transmission electron microscope study of surface steps on SiGe/Si(001) superlattices produced by differential etchingATICI, Y; CHERNS, D.Journal of crystal growth. 1995, Vol 154, Num 3-4, pp 262-268, issn 0022-0248Article

The preparation of transmission electron and scanning microscope specimens using ion beam thinningMORRIS, F.W.Praktische Metallographie. 1984, Vol 21, Num 10, pp 510-519, issn 0032-678XArticle

Elaboration de couches minces in situ de Bi2Sr2CaCu2O8 par pulvérisation cathodique radio-fréquence et leur observation au microscope électronique à transmission = Realization of Bi₂Sr₂CaCu₂O₈ thin films by in situ radio-frequency sputtering and observation by transmission electron microcopeTaffin, Alain; Mercey, B.1995, 85 p.Thesis

Anwendung des Ionenstrahlpolierens in der Interferenzschichten-Mikroskopie = Application of ion beam polishing in interference layer microscopyGAUDIG, W; SCHECK, R.Praktische Metallographie. 1984, Vol 21, Num 12, pp 624-628, issn 0032-678XArticle

Study of the near-surface of hot- and cold-rolled AlMg0.5 aluminium alloyBUYTAERT, G; TERRYN, H; VAN GILS, S et al.Surface and interface analysis. 2005, Vol 37, Num 6, pp 534-543, issn 0142-2421, 10 p.Article