Pascal and Francis Bibliographic Databases

Help

Search results

Your search

au.\*:("AMMERLAAN CAJ")

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 21 of 21

  • Page / 1
Export

Selection :

  • and

THE USE OF ENDOR IN SOLID-STATE SPECTROSCOPY.AMMERLAAN CAJ.1974; REV. ENERG. ATOM.; AUTR.; DA. 1974; VOL. 12; NO 4; PP. 743-761; BIBL. 2 P.Article

ITERATIVE EHT CALCULATIONS FOR THE POSITIVE DIVACANCY IN SILICONWEIGEL C; AMMERLAAN CAJ.1979; PHYS. STATUS SOLIDI, B; DDR; DA. 1979; VOL. 94; NO 2; PP. 505-516; ABS. GER; BIBL. 30 REF.Article

HIGH-TEMPERATURE THERMAL CONDUCTIVITY OF ELECTRON-IRRADIATED DIAMONDBURGEMEISTER EA; AMMERLAAN CAJ.1980; PHYS. REV. B; ISSN 0163-1829; USA; DA. 1980; VOL. 21; NO 6; PP. 2499-2505; BIBL. 15 REF.Article

EXTENDED-HUECKEL-THEORY CALCULATIONS FOR THE POSITIVE DIVADANCY IN SILICONAMMERLAAN CAJ; WOLFRAT JC.1978; PHYS. STATUS SOLIDI, B; DDR; DA. 1978; VOL. 89; NO 1; PP. 85-94; ABS. GER; BIBL. 21 REF.Article

PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS, AMSTERDAM, THE NETHERLANDS, 31 AUGUST-3 SEPTEMBER 1982AMMERLAAN CAJ ED.1983; PHYSICA B + C. B. PHYSICS OF CONDENSED MATTER. C. ATOMIC, MOLECULAR AND PLASMA PHYSICS. OPTICS; ISSN 511463; NLD; DA. 1983; VOL. 116; NO 1-3; XIX-661 P.; BIBL. DISSEM.Conference Paper

REORIENTATION OF NITROGEN IN TYPE-IB DIAMOND BY THERMAL EXCITATION AND TUNNELING = REORIENTATION DE L'AZOTE DANS DU DIAMANT TYPE IB PAR EXCITATION THERMIQUE ET EFFET TUNNELAMMERLAAN CAJ; BURGEMEISTER EA.1981; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1981; VOL. 47; NO 13; PP. 954-957; BIBL. 19 REF.Article

REORIENTATIONS OF NITROGEN IN DIAMONDAMMERLAAN CAJ; BURGEMEISTER EA.1980; INDUSTR. DIAM. REV.; GBR; DA. 1980-04; PP. 128-132; BIBL. 14 REF.Article

MAGNETIC DIPOLE-DIPOLE HYPERFINE INTEGRALS FOR SLATER-TYPE ORBITALSAMMERLAAN CAJ; WOLFRAT JC.1978; PHYS. STATUS SOLIDI, B; DDR; DA. 1978; VOL. 89; NO 2; PP. 541-546; ABS. GER; BIBL. 2 REF.Article

ELECTRON TRAPPING IN NEUTRON TRANSMUTATION DOPED SILICONVAN RUYVEN LJ; AMMERLAAN CAJ.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 10; PP. 632-634; BIBL. 13 REF.Article

OPTICALLY INDUCED DIVACANCY REORIENTATIONS IN SILICON. III. OPTICALLY INDUCED DIVACANCY ALIGNMENT, THEORETICAL MODELVAN DER LINDE RH; AMMERLAAN CAJ.1978; SEMI CONDUCT. AND INSULAT.; GBR; DA. 1978; VOL. 4; NO 1-2; PP. 139-150; BIBL. 4 REF.Article

THE DIVACANCY IN SILICON. SPIN-LATTICE RELAXATION AND PASSAGE EFFECTS IN ELECTRON PARAMAGNETIC RESONANCE.AMMERLAAN CAJ; VAN DER WIEL A.1976; J. MAGNET. RESON.; U.S.A.; DA. 1976; VOL. 21; NO 3; PP. 387-396; BIBL. 39 REF.Article

THERMAL AND OPTICAL MEASUREMENTS ON VACANCIES IN TYPE IIA DIAMONDBURGEMEISTER EA; AMMERLAAN CAJ; DAVIES G et al.1980; J. PHYS. C: SOLID STATE PHYS.; ISSN 0022-3719; GBR; DA. 1980; VOL. 13; NO 26; PP. L691-L695; BIBL. 18 REF.Article

ON THE PRODUCTION OF PARAMAGNETIC DEFECTS IN SILICON BY ELECTRON IRRADIATIONSIEVERTS EG; MULLER SH; AMMERLAAN CAJ et al.1978; SOLID STATE COMMUNIC.; GBR; DA. 1978; VOL. 28; NO 2; PP. 221-225; BIBL. 19 REF.Article

DIVACANCY IN SILICON: HYPERFINE INTERACTIONS FROM ELECTRON-NUCLEAR DOUBLE-RESONANCE MEASUREMENTS. IISIEVERTS EG; MULLER SH; AMMERLAAN CAJ et al.1978; PHYS. REV., B; USA; DA. 1978; VOL. 18; NO 12; PP. 6834-6848; BIBL. 39 REF.Article

DIVACANCY IN SILICON: HYPERFINE INTERACTIONS FROM ELECTRON-NUCLEAR DOUBLE RESONANCE MEASUREMENTS.DE WIT JG; SIEVERTS EG; AMMERLAAN CAJ et al.1976; PHYS. REV., B; U.S.A.; DA. 1976; VOL. 14; NO 8; PP. 3494-3503; BIBL. 35 REF.Article

EPR SPECTRA OF HEAT-TREATMENT CENTERS IN OXYGEN-RICH SILICON.MULLER SH; SPRENGER M; SIEVERTS EG et al.1978; SOLID STATE COMMUNIC.; GBR; DA. 1978; VOL. 25; NO 12; PP. 987-990; BIBL. 13 REF.Article

ELECTRON PARAMAGNETIC RESONANCE ON IRON-RELATED CENTERS IN SILICONMULLER SH; TUYNMAN GM; SIEVERTS EG et al.1982; PHYS. REV. B; ISSN 0163-1829; USA; DA. 1982; VOL. 25; NO 1; PP. 25-40; BIBL. 42 REF.Article

EPR OBSERVATION OF AN AU-FE COMPLEX IN SILICON. PT. 2:ELECTRONIC STRUCTURESIEVERTS EG; MULLER SH; AMMERLAAN CAJ et al.1982; PHYS. STATUS SOLIDI (B), BASIC RES.; DDR; DA. 1982-01; VOL. 109; NO 1; PP. 83-94; BIBL. 30 REF.Article

EPR OBSERVATION OF AN AU-FE COMPLEX IN SILICON. II: ELECTRONIC STRUCTURESIEVERTS EG; MULLER SH; AMMERLAAN CAJ et al.1982; PHYS. STATUS SOLIDI (B), BASIC RES.; ISSN 0370-1972; DDR; DA. 1982; VOL. 109; NO 1; PP. 83-94; ABS. GER; BIBL. 30 REF.Article

EPR OBSERVATION OF AN AU-FE COMPLEX IN SILICON. I. EXPERIMENTAL DATAKLEINHENZ RL; LEE YH; CORBETT JW et al.1981; PHYSICA STATUS SOLIDI. (B). BASIC RESEARCH; ISSN 0370-1972; DDR; DA. 1981; VOL. 108; NO 2; PP. 363-371; ABS. GER; BIBL. 25 REF.Article

EPR OBSERVATION OF AN AU-FE COMPLEX IN SILICON. PT. 1:EXPERIMENTAL DATAKLEINHENZ RL; LEE YH; CORBETT JW et al.1981; PHYS. STATUS SOLIDI (B), BASIC RES.; DDR; DA. 1981-12; VOL. 108; NO 2; PP. 363-371; BIBL. 25 REF.Article

  • Page / 1