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THE DETERMINATION OF FOIL THICKNESS BY SCANNING TRANSMISSION ELECTRON MICROSCOPY.KELLY PM; JOSTSONS A; BLAKE RG et al.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 31; NO 2; PP. 771-780; ABS. FR.; BIBL. 16 REF.Article

ELECTRON MICROSCOPE STUDY OF ELECTRICALLY ACTIVE IMPURITY PRECIPITATE DEFECTS IN SILICON.CULLIS AG; KATZ LE.1974; PHILOS. MAG.; G.B.; DA. 1974; VOL. 30; NO 6; PP. 1419-1443; BIBL. 1 P. 1/2Article

CRYSTALLITE ORIENTATION IN POLYCRYSTALLINE GRAPHITES MADE FROM GLASS-LIKE CARBONS UNDER HIGH PRESSURE.INAGAKI M; NAKA S.1975; J. MATER. SCI.; G.B.; DA. 1975; VOL. 10; NO 5; PP. 814-818; BIBL. 11 REF.Article

MICROSCOPY OF STATIC AND DYNAMIC PROPERTIES OF INTERFACES.SMITH DA.1975; J. PHYS., COLLOQ.; FR.; DA. 1975; VOL. 36; NO 4; PP. C4.1-C4.15; ABS. FR.; BIBL. 52 REF.; (COLLOQ. INT. JOINTS INTERGRANULAIRES METAUX; SAINT-ETIENNE; 1975)Conference Paper

THE LIQUID SURFACE TENSION AS A FACTOR INFLUENCING THE VLS GROWTH OF SILICON CRYSTALS.WEYHER J.1975; MATER. SCI. ENGNG; NETHERL.; DA. 1975; VOL. 20; NO 2; PP. 171-177; BIBL. 17 REF.Article

ORIGIN OF COLD CLEAVED (7 X 7) STRUCTURE ON SILICON (111) SURFACES.BOSKOVITZ G; HANEMAN D.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 44; NO 1; PP. 253-257; BIBL. 11 REF.Article

MORPHOLOGICAL AND X-RAY STUDY OF SIC CRYSTALS GROWN FROM GAS PHASE.CHOJNACKI J; OLEKSYN B; STOBIERSKI L et al.1975; KRISTALL U. TECH.; DTSCH.; DA. 1975; VOL. 10; NO 2; PP. 97-101; ABS. RUSSE; BIBL. 4 REF.Article

PRATICAL SCANNING ELECTRON MICROSCOPY. ELECTRON AND ION MICROPROBE ANALYSIS.GOLDSTEIN JI; YAKOWITZ H; NEWBURY DE et al.1975; NEW YORK; PLENUM PRESS; DA. 1975; PP. (600P.); BIBL. DISSEM.Book

SCANNING ELECTRON MICROSCOPE INVESTIGATION OF ELECTRIC ACTIVITY OF STACKING FAULTS IN SILICON EPITAXIAL LAYER.KATO T; MATSUKAWA T; SHIMIZU R et al.1975; APPL. PHYS. LETTERS; U.S.A.; DA. 1975; VOL. 26; NO 8; PP. 415-416; BIBL. 4 REF.Article

OBSERVATION DES SURFACES DE LA GLACE PAR MICROSCOPIE ELECTRONIQUE A BALAYAGE. II. CONTAMINATION DE LA SURFACE DE CRISTAUX DE GLACESUZUKI S.1975; LOW TEMPER. SCI., A; JAP.; DA. 1975; VOL. 33; PP. 1-9; ABS. ANGL.; BIBL. 7 REF.Article

SURFACE NUCLEATED CRYSTALLIZATION IN GE15TE80AS5 SEMICONDUCTING GLASSES.JOHNSON RT JR; GUINN RK; MIGLIONICO CJ et al.1974; MATER. RES. BULL.; U.S.A.; DA. 1974; VOL. 9; NO 5; PP. 667-677; BIBL. 20 REF.Article

SILICON EPITAXIAL GROWTH BY ELECTRODEPOSITION FROM MOLTEN FLUORIDES.COHEN U; HUGGINS RA.1976; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1976; VOL. 123; NO 3; PP. 381-383; BIBL. 3 REF.Article

ORIGINE DE L'ANOMALIE DANS L'ATTAQUE CHIMIQUE DU SILICIUM CONTENANT DE L'HYDROGENEVORONKOV VV; SAVEL'EV BN; VORONKOVA GI et al.1974; IZVEST. AKAD. NAUK S.S.S.R., NEORG. MATER.; S.S.S.R.; DA. 1974; VOL. 10; NO 5; PP. 801-804; BIBL. 12 REF.Article

INVESTIGATION OF DEFECTS AND STRIATIONS IN AS-GROWN SI CRYSTALS BY SEM USING SCHOTTKY DIODES.DE ROCK AJR; FERRIS SD; KIMERLING LC et al.1975; APPL. PHYS. LETTERS; U.S.A.; DA. 1975; VOL. 27; NO 6; PP. 313-315; BIBL. 12 REF.Article

OBSERVATIONS ON THE GROWTH OF WHISKER CRYSTALS FROM ZINC ELECTROPLATE.LINDBORD U.1975; METALLURG. TRANS. A; U.S.A.; DA. 1975; VOL. 6; NO 8; PP. 1581-1586; BIBL. 12 REF.Article

OBSERVATION OF DISLOCATIONS IN A CONVENTIONAL SCANNING ELECTRON MICROSCOPE.GUYOT P; GJURASEVIC JM.1974; Z. NATURFORSCH., A; DTSCH.; DA. 1974; VOL. 29; NO 9; PP. 1381-1382; H.T. 2; BIBL. 4 REF.Article

STRUCTURE AND PROPERTIES OF GRAPHITIZED CARBON FIBER.KOYAMA T; ENDO M; HISHIYAMA Y et al.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 12; PP. 1933-1939; BIBL. 22 REF.Article

NATURALLY OCCURRING VAPOR-LIQUID-SOLID (VLS) WHISKER GROWTH OF GERMANIUM SULFIDE.FINKELMAN RB; LARSON RR; DWORNIK EJ et al.1974; J. CRYST. GROWTH; NETHERL.; DA. 1974; VOL. 22; NO 2; PP. 159-160; BIBL. 2 REF.Article

OBSERVATIONS OF CADMIUM TELLURIDE WHISKERS.GOSPODINOV MM; GANCHEVA VF; SIMOV SB et al.1974; C.R. ACAD. BULG. SCI.; BULG.; DA. 1974; VOL. 27; NO 10; PP. 1327-1329; BIBL. 5 REF.Article

PREPARATION DE COUCHE SEMICONDUCTRICE DE TITANATE DE BARYUM AVEC UN COEFFICIENT DE TEMPERATURE DE LA RESISTIVITE POSITIFNAGAI M; YANAGIDA H.1976; J. CERAM. SOC. JAP.; JAP.; DA. 1976; VOL. 84; NO 3; PP. 157-161; ABS. ANGL.; BIBL. 8 REF.Article

ETCHING STUDY OF MICRODOMAINS IN LINBO3 SINGLE CRYSTALS.OHNISHI N; LIZUKA T.1975; J. APPL. PHYS.; U.S.A.; DA. 1975; VOL. 46; NO 3; PP. 1063-1067; BIBL. 8 REF.Article

(332) GA HABIT PLANES FORMED ON GAAS DURING BR2: CH3OH ETCHING.KOSZI LA; RODE DL.1975; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1975; VOL. 122; NO 12; PP. 1676-1680; BIBL. 3 REF.Article

CRYSTALLIZATION OF AMORPHOUS SELENIUM FILMS. II. PHOTO AND IMPURITY EFFECTS.KIM KS; TURNBULL D.1974; J. APPL. PHYS.; U.S.A.; DA. 1974; VOL. 45; NO 8; PP. 3447-3452; BIBL. 9 REF.Article

EIN BEITRAG ZUM PROBLEM DES WACHSTUMS VON ZINN-WHISKERN MIT HILFE VON FILMAUFNAHMEN MIT DEM RASTER-ELEKTRONENMIKROSKOP. = CONTRIBUTION A L'ETUDE DE LA CROISSANCE DE TRICHITES D'ETAIN, A L'AIDE DE PRISES DE VUES CINEMATOGRAPHIQUES AU MICROSCOPE ELECTRONIQUE A BALAYAGEZAMINER C.1974; FILM DE RECH.; ALLEM.; DA. 1974; VOL. 8; NO 4; PP. 327-337; ABS. FR. ALLEM.; BIBL. 10 REF.Article

CONTRIBUTION A L'ETUDE DU MECANISME DE L'ATTAQUE DES CRISTAUX EN RELATION AVEC LEUR STRUCTURE: CAS PARTICULIER DE L'HEMATITE.BALTZINGER C.1974; AO-CNRS-10545; FR.; DA. 1974; PP. (184P.); H.T. 9; BIBL. 7 P. 1/2; THESE DOCT. SCI.; METZ)Thesis

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