THE DETERMINATION OF FOIL THICKNESS BY SCANNING TRANSMISSION ELECTRON MICROSCOPY.KELLY PM; JOSTSONS A; BLAKE RG et al.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 31; NO 2; PP. 771-780; ABS. FR.; BIBL. 16 REF.Article

CRYSTALLITE ORIENTATION IN POLYCRYSTALLINE GRAPHITES MADE FROM GLASS-LIKE CARBONS UNDER HIGH PRESSURE.INAGAKI M; NAKA S.1975; J. MATER. SCI.; G.B.; DA. 1975; VOL. 10; NO 5; PP. 814-818; BIBL. 11 REF.Article

MICROSCOPY OF STATIC AND DYNAMIC PROPERTIES OF INTERFACES.SMITH DA.1975; J. PHYS., COLLOQ.; FR.; DA. 1975; VOL. 36; NO 4; PP. C4.1-C4.15; ABS. FR.; BIBL. 52 REF.; (COLLOQ. INT. JOINTS INTERGRANULAIRES METAUX; SAINT-ETIENNE; 1975)Conference Paper

THE LIQUID SURFACE TENSION AS A FACTOR INFLUENCING THE VLS GROWTH OF SILICON CRYSTALS.WEYHER J.1975; MATER. SCI. ENGNG; NETHERL.; DA. 1975; VOL. 20; NO 2; PP. 171-177; BIBL. 17 REF.Article

ORIGIN OF COLD CLEAVED (7 X 7) STRUCTURE ON SILICON (111) SURFACES.BOSKOVITZ G; HANEMAN D.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 44; NO 1; PP. 253-257; BIBL. 11 REF.Article

SILICON EPITAXIAL GROWTH BY ELECTRODEPOSITION FROM MOLTEN FLUORIDES.COHEN U; HUGGINS RA.1976; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1976; VOL. 123; NO 3; PP. 381-383; BIBL. 3 REF.Article

ORIGINE DE L'ANOMALIE DANS L'ATTAQUE CHIMIQUE DU SILICIUM CONTENANT DE L'HYDROGENEVORONKOV VV; SAVEL'EV BN; VORONKOVA GI et al.1974; IZVEST. AKAD. NAUK S.S.S.R., NEORG. MATER.; S.S.S.R.; DA. 1974; VOL. 10; NO 5; PP. 801-804; BIBL. 12 REF.Article

INVESTIGATION OF DEFECTS AND STRIATIONS IN AS-GROWN SI CRYSTALS BY SEM USING SCHOTTKY DIODES.DE ROCK AJR; FERRIS SD; KIMERLING LC et al.1975; APPL. PHYS. LETTERS; U.S.A.; DA. 1975; VOL. 27; NO 6; PP. 313-315; BIBL. 12 REF.Article

OBSERVATIONS ON THE GROWTH OF WHISKER CRYSTALS FROM ZINC ELECTROPLATE.LINDBORD U.1975; METALLURG. TRANS. A; U.S.A.; DA. 1975; VOL. 6; NO 8; PP. 1581-1586; BIBL. 12 REF.Article

OBSERVATION OF DISLOCATIONS IN A CONVENTIONAL SCANNING ELECTRON MICROSCOPE.GUYOT P; GJURASEVIC JM.1974; Z. NATURFORSCH., A; DTSCH.; DA. 1974; VOL. 29; NO 9; PP. 1381-1382; H.T. 2; BIBL. 4 REF.Article

STRUCTURE AND PROPERTIES OF GRAPHITIZED CARBON FIBER.KOYAMA T; ENDO M; HISHIYAMA Y et al.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 12; PP. 1933-1939; BIBL. 22 REF.Article

NATURALLY OCCURRING VAPOR-LIQUID-SOLID (VLS) WHISKER GROWTH OF GERMANIUM SULFIDE.FINKELMAN RB; LARSON RR; DWORNIK EJ et al.1974; J. CRYST. GROWTH; NETHERL.; DA. 1974; VOL. 22; NO 2; PP. 159-160; BIBL. 2 REF.Article

OBSERVATIONS OF CADMIUM TELLURIDE WHISKERS.GOSPODINOV MM; GANCHEVA VF; SIMOV SB et al.1974; C.R. ACAD. BULG. SCI.; BULG.; DA. 1974; VOL. 27; NO 10; PP. 1327-1329; BIBL. 5 REF.Article

THE OBSERVATION OF DISLOCATIONS BY SCANNING ELECTRON MICROSCOPY AND X-RAY DIFFRACTION TOPOGRAPHY.STEFANIAY V; KARSOS J; PUSKAS L et al.1977; KRISTALL U. TECH.; DTSCH.; DA. 1977; VOL. 12; NO 1; PP. K5-K6; BIBL. 6 REF.Article

ANISOTROPIE DE FUSION DES MONOCRISTAUX DE GERMANIUMNAJDICH YU V; GRIGORENKO NF; PEREVERTAJLO VM et al.1977; ZH. FIZ. KHIM.; S.S.S.R.; DA. 1977; VOL. 51; NO 11; PP. 2984-2986; BIBL. 4 REF.Article

SPUTTERING-SURFACE CHANGES INDUCED BY ION BOMBARDMENT.NAVINSEK B.1976; PROGR. SURF. SCI.; G.B.; DA. 1976; VOL. 7; NO 2; PP. 49-70; H.T. 11; BIBL. 2 P.Article

STUDY OF THE MORPHOLOGY OF CDTE WHISKERS BY SCANNING ELECTRON MICROSCOPE.SIMOV S; GANTCHEVA V; KAMADJIEV P et al.1976; J. CRYST. GROWTH; NETHERL.; DA. 1976; VOL. 32; NO 1; PP. 133-136; BIBL. 7 REF.Article

GAAS GROWTH BY VAPOUR PHASE TRANSPORT. I. STUDY OF THE EFFECT OF SUPERSATURATION AND SURFACE ADSORPTION.LOYAU JB; OBERLIN M; OBERLIN A et al.1975; J. CRYST. GROWTH; NETHERL.; DA. 1975; VOL. 29; NO 2; PP. 176-186; BIBL. 13 REF.Article

INTERFACIAL ENERGIES OF COHERENT TWIN BOUNDARIES IN ALUMINA.ACHUTARAMAYYA G; SCOTT WD.1975; ACTA METALLURG.; E.U.; DA. 1975; VOL. 23; NO 12; PP. 1469-1472; ABS. FR. ALLEM.; BIBL. 12 REF.Article

MORPHOLOGICAL CHANGES OCCURRING DURING REDUCTION OF WO₃.SARIN VK.1975; J. MATER. SCI.; G.B.; DA. 1975; VOL. 10; NO 4; PP. 593-598; BIBL. 12 REF.Article

OBSERVATIONS ON WHISKERS AND SKELETAL CRYSTALS IN PBSE LAYERS BY SCANNING ELECTRON MICROSCOPY.GANTCHEVA V; SIMOV S; KAMADJIEV P et al.1975; J. MATER. SCI.; G.B.; DA. 1975; VOL. 10; NO 11; PP. 1943-1946; BIBL. 11 REF.Article

LIMITING FACTORS IN SPECIMEN THICKNESS IN CONVENTIONAL AND SCANNING TRANSMISSION ELECTRON MICROSCOPY.FRASER HL; JONES IP; LORETTO MH et al.1977; PHILOS. MAG.; G.B.; DA. 1977; VOL. 35; NO 1; PP. 159-176; BIBL. 1 P.Article

INVESTIGATION OF THE AMORPHIZATION PROCESS IN CRYSTALLINE BORON.TSOMAYA KP; SAMSONOV GV; TAVADZE FN et al.1976; J. LESS COMMON METALS; NETHERL.; DA. 1976; VOL. 47; PP. 249-254; BIBL. 17 REF.; (INT. SYMP. BORON BORIDES. 5. PROC.; BORDEAUX; 1975)Conference Paper

GROWTH AND CHARACTERIZATION OF SILICON RIBBONS PRODUCED BY A CAPILLARY ACTION SHAPING TECHNIQUE.CISZEK TF; SCHWUTTKE GH.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 27; NO 1; PP. 231-241; ABS. ALLEM.; BIBL. 7 REF.Article

STEREOSCOPIE AU MICROSCOPE ELECTRONIQUE A BALAYAGE: APPLICATION A L'ETUDE DES FIGURES DE CORROSION DE L'HEMATITE ALPHA -FE₂O₃.WAGNER F; BALTZINGER C; BARO R et al.1974; J. MICR.; FR.; DA. 1974; VOL. 19; NO 3; PP. 201-206; ABS. ANGL.; BIBL. 11 REF.Article