kw.\*:("ANALYSE RAYONS X")
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ROENTGENANALYSE IN DER INDUSTRIE = X-RAY ANALYSIS IN INDUSTRYHOFMANN R; KRUEGER W.1980; SIEMENS-ENERGIETECH.; DEU; DA. 1980-09; VOL. 2; NO 9; PP. 358-359Article
ESTIMATION OF THE COMPOSITION OF ALLOY PHASES BY LOCAL X-RAY ANALYSISLANDYSHEV AV; SELIVERSTENKO SI; SHVANGIRADZE RR et al.1983; ZURNAL ANALITICESKOJ HIMII; ISSN 0044-4502; SUN; DA. 1983; VOL. 38; NO 5; PP. 917-921; ABS. ENG; BIBL. 6 REF.Article
INDUSTRIEROBOTER FUER DIE AUTOMATISCHE ROENTGENPRUEFUNG VON ACHSSCHENKELN = INDUSTRIAL ROBOTS FOR AUTOMATIC RADIOGRAPHIC CONTROL OF STEERING KNUCKLES1981; GIESSEREI; DEU; DA. 1981-08-31; VOL. 68; NO 18; PP. 556-557Article
ON THE INFLUENCE OF THE DISTORTION DISTRIBUTION ON THE DETERMINATION OF ROENTGENOGRAPHIC PARTICLE SIZES AND DISTORTIONS = ZUM EINFLUSS DER VERZERRUNGSVERTEILUNG BEI DER BESTIMMUNG DER ROENTGENOGRAPHISCHEN TEILCHENGROESSE UND DER VERZERRUNGEN = SUR L'INFLUENCE DE LA DISTRIBUTION DES DISTORSIONS POUR DETERMINER LES DISTORSIONS ET LA TAILLE DES PARTICULES PAR RAYONS XROELL H; SCHULZ H.1982; CRYST. RES. TECH.; DDR; DA. 1982-07; VOL. 17; NO 7; PP. 875-883; BIBL. 6 REF.Article
NIEJEDNORODNOSI SPIEKOW CU-NI OKROSLONA PRZY ZASTOSOWANIU MIKROANALIZATORA RENTGENOWSKIEGO = HETEROGENEITY OF CU-NI SINTERS DETERMINED PAR MEANS OF A X-RAY MICROANALIZER = HETEROGENEITE DES PRODUITS FRITTES CU-NI DETERMINEE PAR MICROANALYSEUR A RAYONS XPRZYBYLOWICZ K; RADON A.1980; RUDY MET. NIEZELAZ.; ISSN 0035-9696; POL; DA. 1980; VOL. 25; NO 1; PP. 3-7; ABS. RUS/ENG/FRE/GER; BIBL. 5 REF.Article
ROENTGENOGRAPHISCHE EIGENSPANNUNGSMESSUNGEN AN ALUMINIUMWERKSTOFFEN (1) = MEASUREMENT OF RESIDUAL STRESSES IN ALUMINIUM ALLOY PRODUCTS BY X-RAY DIFFRACTION METHODS (1)FURRER P; KOUTNY M.1980; ALUMINIUM (DUESSELD.); DEU; DA. 1980-02; VOL. 56; NO 2; PP. 139-142; BIBL. 16 REF.Article
STANOVENI FAZOVEHO SLOZENI A TLOUSTKY TENKYCH VRSTEV NA ZAKLADE RENTGENOVE KVANTITATIVNI FAZOVE ANALYZY = DETERMINATION OF THE PHASE COMPOSITION AND THE THICKNESS OF THIN LAYERS BY THE X-RAY QUANTITATIVE PHASE ANALYSISCERMAK M.1982; KOVOVE MATER.; CSK; DA. 1982-02; VOL. 20; NO 1; PP. 111-119; BIBL. 3 REF.Article
X-RAY ANALYSIS OF NON-METALLIC INCLUSIONS IN THIN STEEL SHEETS BY CONTACT MICRORADIOGRAPHYKOISHI S; ARAKI M; IRITANI M et al.1982; KAWASAKI STEEL GIHO; ISSN 0368-7236; JPN; DA. 1982; VOL. 14; NO 1; PP. 82-90; BIBL. 8 REF.Article
ON THE QUANTITATIVE ANALYSIS OF O0, O- AND O2--IONS IN BINARY SILICATE BY X-RAY PHOTOELECTRON SPECTROSCOPYSASAKI T; KAWAGUCHI M; YAMANE M et al.1981; J. JAP. INST. MET.; JPN; DA. 1981-08; VOL. 45; NO 8; PP. 790-796; BIBL. 17 REF.Article
METODY WYZNACZANIA NAPREZEN WLASNYCH W WALKACH = METHODEN ZUR BESTIMMUNG DER RESTSPANNUNGEN IN RUNDSTAEBEN = METHODS OF THE MEASUREMENT OF RESIDUAL STRESSES IN SHAFTS = METHODES POUR LA DETERMINATION DES CONTRAINTES RESIDUELLES DANS DES BARRES RONDESZAMOJCIN Z; GLOWNIAK J; TYCHOWSKA B et al.1981; OBROB. PLAST.; POL; DA. 1981-01; VOL. 20; NO 1; PP. 39-43; BIBL. 15 REF.Article
QUANTITATIVE X-RAY MICROANALYSIS ON SURFACES WITH UNKENOWN ORIENTATION = MICROANALYSE QUANTITATIVE PAR RAYONS X DE SURFACES A ORIENTATION INCONNUERUSS JC; HARE TM.1980; CAN. J. SPECTROSC.; ISSN 0045-5105; CAN; DA. 1980; VOL. 25; NO 4; PP. 98-105; ABS. FRE; BIBL. 5 REF.Article
CHEMICAL X-RAY FLUORESCENCE ANALYSISLOBANOV FI.1981; ZAVOD. LAB.; ISSN 0321-4265; SUN; DA. 1981-10; VOL. 47; NO 10; PP. 1-11; BIBL. 117 REF.Article
METHODOLOGY FOR EVALUATING INTEGRAL GAUSSIAN PROFILES = METHODOLOGIE POUR L'EVALUATION DES PROFILS GAUSSIENS INTEGRAUXCAMPBELL AB III.1980; U.S. DEPT INTER., BUR. MINES, INFORM. CIRC.; USA; DA. 1980; NO 8811; PP. 1-18; BIBL. 16 REF.Serial Issue
INFLUENCE OF CRYSTAL NUCLEI ON THE GRAPHITE SHAPE IN CASTIRONMIKHAJLOV RI.1979; LITEJNOE PROIZVOD.; SUN; DA. 1979-09; VOL. 9; PP. 2-3; BIBL. 7 REF.Article
BORON NITRIDE IN GRAY CAST IRONGLUSHKO YU V; GRIGOR'YAN SA; KITAEV YA A et al.1981; LITEJNOE PROIZVOD.; SUN; DA. 1981-04; VOL. 4; PP. 4; BIBL. 1 REF.Article
THE BI-MNBI EUTECTIC REGION OF THE BI-MN PHASE DIAGRAMPIRICH RG; BUSCH G; POIT W et al.1980; METALL. TRANS., A; USA; DA. 1980-01; VOL. 11A; NO 1; PP. 193-194; BIBL. 10 REF.Article
THE CRYSTAL STRUCTURE OF URU3B2ROGL P.1980; J. NUCL. MATER.; NLD; DA. 1980-09; VOL. 92; NO 2/3; PP. 292-298; BIBL. 16 REF.Article
A NEW METHOD FOR POWDER DIFFRACTION PHASE ANALYSIS = EIN NEUES VERFAHREN ZUR ROENTGENOGRAPHISCHEN PHASENANALYSE = UN NOUVEAU PROCEDE D'ANALYSE DE PHASE PAR RAYONS XFIALA J.1982; CRYST. RES. TECH.; DDR; DA. 1982-05; VOL. 17; NO 5; PP. 643-650; BIBL. 14 REF.Article
VYPOCET HODNOT, NUTNYCH PRO RENTGENOVOU KVANTITATIVNI FAZOVOU ANALYZU INTERMETALICKYCH FAZI, NITRIDU A OXIDU, VYSKYTUJICICH SE V OCELICH = CALCULATION OF THE VALUES NECESSARY FOR THE X-RAY QUANTITATIVE PHASE-ANALYSIS OF INTERMETALLIC PHASES, NITRIDES AND OXIDES EXISTING IN STEELSNEUMANN J; HEJDOVA H; CERMAK M et al.1981; KOVOVE MATER.; CSK; DA. 1981-12; VOL. 19; NO 6; PP. 741-748; BIBL. 9 REF.Article
HUTNICZE LABORATORIUM SPKETROMETRII RENTGENOWSKIEJ = LABORATORY OF THE X-RAY SPECTROMETRY AT THE STEELWORKS = LABORATOIRE DE SPECTROMETRIE DE RX DANS UNE USINE SIDERURGIQUEFERET F.1981; WIAD. HUT.; ISSN 0043-5139; POL; DA. 1981; VOL. 37; NO 3; PP. 89-94; ABS. RUS/ENGArticle
NEW WAYS TO TEST WELDS = NOUVELLES METHODES DE CONTROLE DES SOUDURESDAU GJ.1980; WELD. DES. FABR.; ISSN 0043-2253; USA; DA. 1980; VOL. 53; NO 9; PP. 82-85; LOC. ISArticle
THE SPATIAL RESOLUTION OF X-RAY MICROANALYSIS IN THE SCANNING TRANSMISSION ELECTRON MICROSCOPE = RESOLUTION SPATIALE DE LA MICROSONDE ELECTRONIQUE DANS LE MICROSCOPE ELECTRONIQUE A TRANSMISSION BALAYAGEDOIG P; LONSDALE D; FLEWITT PEJ et al.1980; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1980; VOL. 41; NO 5; PP. 761-775; BIBL. 20 REF.Article
MENNYISEGI VEGYELEMZES SCANNING ELEKTRONMIKROSZKOPBAN KELTETT KARAKTERISZTIKUS ROENTGENSUGARZAS ALAPJAN = QUANTITATIVE ANALYSIS BY MEANS OF THE CHARACTERISTIC X-RAYS GENERATED IN SEM = ANALYSE QUANTITATIVE AU MOYEN DES RAYONS X CARACTERISTIQUES PRODUITS DANS LA MICROSCOPIE ELECTRONIQUE A BALAYAGEMARCZIS L; BOROSSAY B.1980; BANYASZ. KOHASZ. LAPOK, KOHASZ.; ISSN 0005-5670; HUN; DA. 1980; VOL. 113; NO 8; PP. 344-350; ABS. RUS/ENG/GER; BIBL. 11 REF.Article
ZASTOSOWANIE MASZYNY CYFROWEJ ODRA, 1305 W CENTRALNYM OSRODKU OBLICZENIOWYN HUTY POKOJ DO WSPOLPRACY Z LABORATORIUM SPEKTROMETRII RENTGENOWSKIEJ = THE CO-OPERATION OF THE X-RAY SPECTROMETRIC LABORATORY WITH "ODRA 1305" DIGITAL COMPUTER IN THE COMPUTATION CENTER OF THE "HUTA POKOJ" STEELWORKS = COOPERATION ENTRE LE LABORATOIRE D'ANALYSE PAR SPECTROMETRIE RX ET LE CALCULATEUR NUMERIQUE "ODRA 1305" DU CENTRE DE CALCUL DE L'USINE SIDERURGIQUE "HUTA POKOJ".WINNICK A; FOLMER F; KESTOWICZ J et al.1979; HUTNIK; ISSN 0018-8077; POL; DA. 1979; VOL. 46; NO 7; PP. 322-323; ABS. RUS/ENGArticle
THEORIE DES ROENTGEN-INTEGRALVERFAHRENS = THEORY OF THE X-RAY INTEGRAL METHODLODE W; PEITER A.1980; HAERTEREI-TECH. MITT.; DEU; DA. 1980-06; VOL. 35; NO 3; PP. 148-155; BIBL. 8 REF.Article