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DESIGN FOR TESTABILITY. A SURVEYWILLIAMS TW; PARKER KP.1982; IEEE TRANS. COMPUT.; ISSN 0018-9340; USA; DA. 1982; VOL. 31; NO 1; PP. 2-15; BIBL. 114 REF.Article

ANALYSE DE SIGNATURE+EMULATION=UN TESTEUR PORTABLE EFFICACE POUR LES SYSTEMES A MU PSIMIOT C.1978; ELECTRON. APPL. INDUSTR.; FRA; DA. 1978; NO 260; PP. 43-45Article

SIGNATURE ANALYSIS: A SYNTHETIC APPROACH FOR IDENTIFYING THE BEHAVIOUR OF LOGIC BOARDSD'ERCOLE S.1980; RIV. TEC. SELENIA; ITA; DA. 1980; VOL. 7; NO 1; PP. 1-7; BIBL. 11 REF.Article

WAS IST SIGNATURANALYSE. = QU'EST-CE QUE L'ANALYSE DE SIGNATURE.BECKMANN B; MUCHA J.1982; ELEKTRON. RECHENANAL.; ISSN 0013-5720; DEU; DA. 1982; VOL. 24; NO 1; PP. 16-18; BIBL. 6 REF.Article

L'ANALYSE DE SIGNATURE POUR LE TEST EN PRODUCTION DE CARTES A MICROPROCESSEURNATRASEVSCHI A.1981; ELECTRON. IND.; FRA; DA. 1981; NO 8; PP. 63-67Article

APPLYING SIGNATURE ANALYSIS TO EXISTING PROCESSOR-BASED PRODUCTSRHODES BURKE R.1981; ELECTRONICS; ISSN 0013-5070; USA; DA. 1981; VOL. 4; NO 54; PP. 127-133Article

SA ATTACKS BOARD FAULTS WITHOUT EXTRA HARDWARENATRASEVSCHI A.1980; ELECTRON DES.; ISSN 0013-4872; USA; DA. 1980; VOL. 28; NO 21; PP. 191-195; BIBL. 5 REF.Article

SIGNATURE ANALYSIS AND TEST STRATEGYSKILLING JK.1981; ELECTRON. PACKAG. PROD.; ISSN 0013-4945; USA; DA. 1981; VOL. 21; NO 1; PP. 151-154; 3 P.Article

ANALYSE DE SIGNATURE, LE TEST DES CIRCUITS PERIPHERIQUESHOURCADE JP.1980; MINIS ET MICROS; ISSN 0336-4585; FRA; DA. 1980; VOL. 129; PP. 47-50Article

SIGNATURE ANALYSIS. CONCEPTS, EXAMPLES, AND GUIDELINES.NADIG HJ.1977; HEWLETT-PACKARD J.; U.S.A.; DA. 1977; VOL. 28; NO 9; PP. 15-21; BIBL. 1 REF.Article

COMPONENT-BY-COMPONENT TESTING OF DIGITAL CIRCUIT BOARDSRAYMOND DW.1980; COMPUTER DESIGN; USA; DA. 1980; VOL. 19; NO 4; PP. 129-137; BIBL. 7 REF.Article

L'ANALYSE DE SIGNATURE APPLIQUEE A QUELQUES MICROPROCESSEURS 8 BITSHOURCADE JP.1980; MINIS ET MICROS; ISSN 0336-4585; FRA; DA. 1980; VOL. 5; NO 128; PP. 45-47Article

MIKROPROZESSOR-SELBSTTEST DURCH SIGNATUR-VERGLEICH = UNE METHODE DE SELF TEST DES MICROPROCESSEURS PAR L'ANALYSE DE SIGNATUREBUREN G; SCHUTZ W.1980; ELEKTRON. RECHENANL.; ISSN 0013-5720; DEU; DA. 1980; VOL. 22; NO 5; PP. 237-242; ABS. ENG; BIBL. 8 REF.Article

DIE-SIGNATUR-ANALYSE = L'ANALYSE DE SIGNATUREHEINE K.1979; ELEKTRONIK; DEU; DA. 1979; VOL. 28; NO 1; PP. 48-51; BIBL. 4 REF.Article

ON A DYNAMIC DISPLAY FOR DIGITAL SYSTEM FAULT DETECTION.KARTALOPOULOS S.1977; I.E.E.E. TRANS. INSTRUMENT. MEASUR.; U.S.A.; DA. 1977; VOL. 26; NO 4; PP. 351-355; BIBL. 14 REF.Article

ALGORITHME DE TRI COMPLET DES ENSEMBLES DE TEST POUR LE DIAGNOSTIC DES CIRCUITS INTEGRES ET ANALYSE DE SIGNATURENOVIK G KH; STASHIN VV.1982; AVTOM. TELEMEH.; ISSN 0005-2310; SUN; DA. 1982; NO 8; PP. 162-164; ABS. ENG; BIBL. 6 REF.Article

CROP CLASSIFICATION WITH LANDSAT MULTISPECTRAL SCANNER DATA IIWHEELER SG; MISRA PN.1980; PATTERN RECOGNIT.; GBR; DA. 1980; VOL. 12; NO 4; PP. 219-228; BIBL. 7 REF.Article

THE SIGNATURE ANALYSIS OF SONIC BEARING VIBRATIONSBRAUN SG.1980; IEEE TRANS. SONICS ULTRASON.; ISSN 0018-9537; USA; DA. 1980; VOL. 27; NO 6; PP. 317-328; BIBL. 33 REF.Article

SIGNATURE, METHODE DE DEPANNAGE DES CARTES LOGIQUES AVEC LSI.HOURCADE JP.1978; MINIS ET MICROS; FR.; DA. 1978; VOL. 3; NO 64; PP. 16-19Article

UN CIRCUIT INTEGRE DE GENERATION ET ANALYSE DE VECTEURS POUR LE TEST DE CARTES A MICROPROCESSEUR = AN INTEGRATED CIRCUIT FOR BIT PATTERNS GENERATION/ANALYSIS FOR THE TEST OF MICROPROCESSOR-BASED BOARDSBORRIONE D; CAUBET B; COURTOIS B et al.1982; ; FRA; DA. 1982; IMAG-RR/293; 22 P.; 30 CM; ABS. ENG; BIBL. 2 P.;[RAPP. RECH.-LAB. INFORM. MATH. APPL. GRENOBLE; VOL. RR-293]Report

THE AFTERSHOCK OF THE MICROPROCESSOR EXPLOSIONHORDOS B.1979; MICROPROCESSEURS, UN OUTIL POUR LE FUTUR. JOURNEES D'ELECTRONIQUE 1979/1979/LAUSANNE; CHE; LAUSANNE: EPFL; DA. 1979; PP. 59-73; BIBL. 2 REF.Conference Paper

L'ANALYSE DE SIGNATURE.FLEYS M.1977; TOUTE ELECTRON.; FR.; DA. 1977; NO 421; PP. 41-47Article

L'ANALYSE DE SIGNATURE: UNE NOUVELLE PHILOSOPHIE DE LA MAINTENANCE.SCHWARTZ P.1977; ELECTRON. APPL. INDUSTR.; FR.; DA. 1977; NO 242; PP. 39-43Article

L'ANALYSE DE SIGNATURE SUR LE TESTEUR D'INSPECTION/FONCTIONNEL 3060A DE HEWLETT-PACKARD1980; MES., REGUL., AUTOM.; ISSN 0026-0193; FRA; DA. 1980; VOL. 45; NO 12; PP. 87Article

DESIGNING FOR TESTABILITY. MAINTAINING COMPLEX DIGITAL CIRCUITRY CAN BE A NIGHTMARELOWE L.1979; MICROPROCESS. AND MICROSYST.; GBR; DA. 1979; VOL. 3; NO 1; PP. 3-6; BIBL. 15 REF.Article

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