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UNTERSUCHUNG VON WOLFRAM-OBERFLAECHEN MIT SEKUNDAERIONEN UND THERMISCHEN IONEN IN EINEM ABBILDENDEN MASSENSPEKTROMETER = ANALYSE DE SURFACES DE TUNGSTENE DANS UN SPECTROMETRE DE MASSE A MISE EN IMAGE, AU MOYEN D'IONS SECONDAIRES ET THERMOIONIQUESPRAGER M; GAUKLER KH.1974; APPL. PHYS.; GERM.; DA. 1974; VOL. 4; NO 4; PP. 327-331; ABS. ANGL.; BIBL. 18 REF.Article

PLENARY LECTURE: SURFACE CHARACTERIZATION USING ELECTRON SPECTROSCOPY (ESCA).HERCULES DM.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 399-430; BIBL. 16 REF.Conference Paper

PLENARY LECTURE: ION MICROSCOPY AND SURFACE ANALYSIS.MORRISON GH.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 351-366; BIBL. 27 REF.Conference Paper

AUGER ELECTRON SPECTROSCOPY OF SOLID SURFACES.GRANT JT.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 133-154; BIBL. 3 P.Conference Paper

GLASS SURFACE ANALYSIS BY AUGER ELECTRON SPECTROSCOPYPANTANO CG JR; DOVE DB; ONODA GY JR et al.1975; J. NON-CRYST. SOLIDS; NETHERL.; DA. 1975; VOL. 19; PP. 41-53; BIBL. 23 REF.; (GLASS SURF. ROLLA CERAM. MATER. CONF. GLASS SURF. 4. PROC.; ST. LOUIS, MO.; 1975)Conference Paper

THE USE OF ION BEAMS IN SURFACE PHYSICS STUDIESCARTER G.1973; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1973; VOL. 10; NO 1; PP. 95-99; BIBL. 36 REF.Serial Issue

POSSIBILITIES OF THE ION MICROPROBE IN SURFACE ANALYSISHABRAKEN L; LEROY V; SERVAIS JP et al.1972; IN: ELECTRON ION BEAM SCI. TECHNOL. VTH INT. CONF.; PRINCETON; ELECTROCHEM. SOC.; DA. 1972; PP. 196-216; BIBL. 13 REF.Conference Proceedings

IONEN-MIKROSONDEN-ANALYSATOREN = ANALYSEURS A MICROSONDES IONIQUESLIEBL H.1972; MESSTECHNIK; DTSCH.; DA. 1972; VOL. 80; NO 12; PP. 358-365; ABS. ANGL.; BIBL. 17 REF.Serial Issue

QUELQUES PROBLEMES DE LA PHYSIQUE ET DE LA CHIMIE DE LA SURFACE DES SEMICONDUCTEURS1972; NOVOSIBIRSK; NAUKA; DA. 1972; PP. 1-250; BIBL. DISSEM.; ED. PAR A.V. RZHANOVBook

SURFACE CHARACTERIZATION BY ION MICROPROBE ANALYSER.STEWART IM.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 367-373; BIBL. 4 REF.Conference Paper

SPEKTRALANALYTISCHE UNTERSUCHUNGEN AN GUSSEISERNEN OBERFLAECHEN MIT DER GLIMMLAMPE. = RECHERCHES SUR L'ANALYSE SPECTROMETRIQUE DE LA SURFACE DE FONTES A L'AIDE D'UNE LAMPE A DECHARGEHARTUNG W.1977; GIESSEREI; DTSCH.; DA. 1977; VOL. 64; NO 24; PP. 634-637; ABS. ANGL. FR.; BIBL. 6 REF.Article

SURFACE OXIDATION OF SILICON NITRIDE FILMSRAIDER SI; FLITSCH R; ABOAF JA et al.1976; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1976; VOL. 123; NO 4; PP. 560-565; BIBL. 17 REF.Article

L'ANALYSE DES SURFACES.BAUDIN G.1976; ANALUSIS; FR.; DA. 1976; VOL. 4; NO 7; PP. 320-322Article

HYDROGEN DISTRIBUTION PROFILINGLANGLEY RA; PICRAUX ST; VOOK FL et al.1975; IN: HYDROGEN ENERGY. HYDROGEN ECON. ENERGY CONF.; MIAMI BEACH, FLA.; 1974; NEW YORK; PLENUM PRESS; DA. 1975; PP. 1089-1103; BIBL. 8 REF.Conference Paper

ETUDE DES SURFACES METALLIQUES PAR MICROANALYSE IONIQUE ET SPECTROMETRIE AUGERLEROY V; SERVAIS JP; GRAAS H et al.1975; SILIC. INDUSTR.; BELG.; DA. 1975; VOL. 40; NO 2; PP. 37-47; ABS. ANGL. ALLEM.; BIBL. 12 REF.Article

ANALYSE EN PROFONDEUR DE SURFACES DE SOLIDES PAR UNE METHODE DE BALAYAGE HAUTE VITESSE PAR LE FAISCEAU IONIQUEDOI H; KANOMATA I.1975; MASS. SPECTROSC.; JAP.; DA. 1975; VOL. 23; NO 3; PP. 209-220; ABS. ANGL.; BIBL. 11 REF.Article

NEUE METHODEN ZUR OBERFLAECHENANALYSE UND IHRE ANWENDUNG FUER UNTERSUCHUNGEN AN EISEN UND STAHL = EMPLOI DE NOUVELLES METHODES D'ANALYSE DE SURFACE DANS LES ETUDES SUR LE FER ET L'ACIERGRABKE HJ; VIEFHAUS H.1975; ARCH. EISENHUETTENWES.; DTSCH.; DA. 1975; VOL. 46; NO 11; PP. 689-694; ABS. ANGL. FR.; BIBL. 42 REF.Article

APPLICATION OF EMISSION ELECTRON MICROSCOPY TO STUDYING THE STRUCTURAL AND TOPOGRAPHIC STATES OF GLASSES WITH A THIN SURFACE FILM OF AL, CU, AU, NI AND PT METALBOCHYNSKI Z; SCHMIDT W.1975; J. NON-CRYST. SOLIDS; NETHERL.; DA. 1975; VOL. 19; PP. 91; (GLASS SURF. ROLLA CERAM. MATER. CONF. GLASS SURF. 4. PROC.; ST. LOUIS, MO.; 1975)Conference Paper

ELECTRON BEAM MICROPOBES USED IN THE ANALYSIS AND DEVELOPMENT OF MATERIALSWEBER U.1974; SIEMENS FORSCH.-U. ENTWICKL.-BER.; DTSCH.; DA. 1974; VOL. 3; NO 5; PP. 294-298; ABS. ALLEM.; BIBL. 15 REF.Article

ELECTRON SPECTROSCOPY. PROGRESS IN RESEARCH AND APPLICATIONS. PROCEEDINGS OF THE INTERNATIONAL CONFERENCE; NAMUR; 19741974; AMSTERDAM; ELSEVIER; DA. 1974; PP. (1157 P.); BIBL. DISSEM.; ISBN 0444412913Conference Proceedings

INTERACTION D'UN COURANT D'EAU AVEC UN VERREPAPLAUSKAS AB; POLYAKOV VV; RYABOV VA et al.1974; IZVEST. AKAD. NAUK S.S.S.R., NEORG. MATER.; S.S.S.R.; DA. 1974; VOL. 10; NO 7; PP. 1336-1340; BIBL. 2 REF.Article

LE MICROSCOPE ELECTRONIQUE A PHOTOEMISSIONDANNOHL HD.1972; VIDE; FR.; DA. 1972; NO 158, SUPPL; PP. 302-303Serial Issue

ESCA. A NEW TOOL FOR SURFACE RESEARCHHERGLOTZ HK; SUCHAN HL.1975; ADV. COLLOID INTERFACE SCI.; NETHERL.; DA. 1975; VOL. 5; NO 2; PP. 79-103; BIBL. 2 P.Article

GLASS SURFACES. ROLLA CERAMIC MATERIAL, CONFERENCE ON GLASS SURFACES. 4. PROCEEDINGS; ST. LOUIS, MO.; 19751975; J. NON-CRYST. SOLIDS; NETHERL.; DA. 1975; VOL. 19; PP. (410 P.); BIBL. DISSEM.Conference Paper

CONVERSION-ELECTRON MOESSBAUER SPECTROSCOPY FOR THE STUDY OF SOLID SURFACESTRICKER MJ; THOMAS JM; WINTERBOTTOM AP et al.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 45; NO 2; PP. 601-608; BIBL. 14 REF.Article

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