LIQUID STRUCTURE ANALYSIS BY ENERGY-SCANNING X-RAY DIFFRACTIONPROBER JM; SCHULTZ JM; SANDLER SI et al.1973; NATURE PHYS. SCI.; G.B.; DA. 1973; VOL. 243; NO 124; PP. 32-34; BIBL. 2 REF.Serial Issue

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ETUDE ET MISE AU POINT D'UN SECTEUR ELECTROSTATIQUE CYLINDRIQUE A DEVIATION PI /2RAC(2)PERRIER P; CARRICABURU B.1972; REV. PHYS. APPL.; FR.; DA. 1972; VOL. 7; NO 1; PP. 61-67; ABS. ANGL.; BIBL. 13 REF.Serial Issue

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FILTRE DE PARTICULES CHARGEES D'APRES LEUR ENERGIEAFANAS'EV VP; VYDRIK AA; OVSYANNIKOVA LP et al.1982; Z. TEH. FIZ.; ISSN 0044-4642; SUN; DA. 1982; VOL. 52; NO 1; PP. 155-156; BIBL. 4 REF.Article

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REALISATION D'UN ANALYSEUR DE PERTES D'ENERGIE DES ELECTRONS A TRES HAUTE TENSION (300 A 1200 KV)SEVELY J; PEREZ JP; JOUFFREY B et al.1973; C.R. ACAD. SCI., B; FR.; DA. 1973; VOL. 276; NO 13; PP. 515-518; H.T. 1; BIBL. 6 REF.Serial Issue

MEASUREMENT OF PARTIAL SPECIFIC THICKNESS (NET THICKNESS) OF CRITICAL-POINT-DRIED CULTURED FIBROBLAST BY ENERGY ANALYSISHOSOI J; OIKAWA T; INOUE M et al.1981; ULTRAMICROSCOPY; ISSN 0304-3991; NLD; DA. 1981; VOL. 7; NO 2; PP. 147-154; BIBL. 5 REF.Article

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Thomson parabola ion energy analyzer with a coincident and jitter-free applied electric field rampYONEDA, H; HORIOKA, K; KIM, Y et al.Review of scientific instruments. 1988, Vol 59, Num 3, pp 457-459, issn 0034-6748Article

Data reduction technique for use with electrostatic energy analyzersHAYES, M. A.Review of scientific instruments. 1985, Vol 55, Num 12, pp 2029-2030, issn 0034-6748Article

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IMPROVEMENT IN THE ACCURACY OF MICROANALYSIS WITH THE COMBINED ELECTRON MICROSCOPE AND ENERGY ANALYSER.PORTER DA; EDINGTON JW.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 11; PP. 1179-1182; BIBL. 21 REF.Article

THE QUANTITATIVE INTERPRETATION OF PEAKS IN PHOTOELECTRON SPECTRA OBTAINED WITH DISPERSIVE ELECTROSTATIC ANALYSERS.WOODRUFF PR; TOROP L; WEST JB et al.1977; J. ELECTRON SPECTROSC. RELAT. PHENOMENA; NETHERL.; DA. 1977; VOL. 12; NO 2; PP. 133-142; BIBL. 9 REF.Article

A NEW ELECTRON ENERGY ANALYSER FOR VOLTAGE MEASUREMENT IN THE SEM.GOPINATH A; TEE WJ.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 6; PP. 660-663; BIBL. 4 REF.Article

Electrostatic charged-particle energy analyzer with three electrodesFISHKOVA, T. YA; MASON, A.Soviet physics. Technical physics. 1991, Vol 36, Num 12, pp 1416-1418, issn 0038-5662Article

ELEMENTAL ANALYSIS OF MICROAREAS BY ELECTRON ENERGY ANALYZER.KOKUBO Y; IWATSUKI M.1976; J. ELECTRON MICR.; JAP.; DA. 1976; VOL. 25; NO 3; PP. 123-130; BIBL. 21 REF.Article

ANGLE RESOLVED DETECTION OF CHARGED PARTICLES WITH A NOVEL TYPE TOROIDAL ELECTROSTATIC ANALYSERSMEENK RG; TROMP RM; KERSTEN HH et al.1982; NUCL. INSTRUM. METHODS PHYS. RES.; ISSN 0167-5087; NLD; DA. 1982; VOL. 195; NO 3; PP. 581-586; BIBL. 10 REF.Article

FAST HIGH-RESOLUTION ION ENERGY AND MOMENTUM SPECTROMETERKRISHNAN M; HIRSHFIELD JL.1980; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1980; VOL. 51; NO 7; PP. 911-917; BIBL. 14 REF.Article

MICROSCOPIE SELECTIVE A TRES HAUTE TENSION (1MV)ZANCHI GERALD.1978; ; FRA; DA. 1978; 825; 149 P.-PL.; 30 CM; BIBL. 108 REF.; TH.: SCI. PHYS./TOULOUSE 3/1978Thesis

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Transmission characteristics of a cylindrical energy analyzerCRAIG, J. H; DURRER, W. G.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1989, Vol 7, Num 6, pp 3337-3340, issn 0734-2101, 4 p.Article

COMPACT ANALYZER AND GONIOMETER FOR ANGLE-RESOLVED ELECTRON SPECTROSCOPYSTOFFEL NG; MARGARITONDO G.1982; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1982; VOL. 53; NO 1; PP. 18-21; BIBL. 6 REF.Article

PROPRIETES DES SPECTROMETRES ELECTROSTATIQUES A ELECTRODES EN SPIRALE LOGARITHMIQUETREMBLAY D; ROY D.1982; CAN. J. PHYS.; ISSN 0008-4204; CAN; DA. 1982; VOL. 60; NO 4; PP. 399-404; ABS. ENG; BIBL. 15 REF.Article