au.\*:("ANGELL JB")
Results 1 to 3 of 3
Selection :
A DUAL-GATE DEEP-DEPLETION TECHNIQUE FOR GENERATION LIFETIME MEASUREMENTBARTH PW; ANGELL JB.1980; IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1980; VOL. 27; NO 12; PP. 2252-2255; BIBL. 6 REF.Article
A LOW-CAPACITANCE MULTIELECTRODE PROBE FOR USE IN EXTRACELLULAR NEUROPHYSIOLOGY. = UNE SONDE A ELECTRODES MULTIPLES DE FAIBLE CAPACITANCE A L'USAGE DE LA NEUROPHYSIOLOGIE EXTRACELLULAIREWISE KD; ANGELL JB.1975; I.E.E.E. TRANS. BIO-MED. ENGNG; U.S.A.; DA. 1975; VOL. 22; NO 3; PP. 212-219; BIBL. 14 REF.Article
ENHANCING TESTABILITY OF LARGE-SCALE INTEGRATED CIRCUITS VIA TEST POINTS AND ADDITIONAL LOGICWILLIAMS MJY; ANGELL JB.1973; I.E.E.E. TRANS. COMPUTERS; U.S.A.; DA. 1973; VOL. 22; NO 1; PP. 46-60; BIBL. 22 REF.Serial Issue