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FIELD-SERVICE TESTERS SHARPEN ON-SITE SKILLSMCLEOD J.1980; ELECTRON. DES.; ISSN 0013-4872; USA; DA. 1980; VOL. 28; NO 21; PP. 109-118; 9 P.Article

LE TEST AUTOMATIQUE DES CARTESLISBONIS M.1980; TOUTE ELECTRON.; ISSN 0040-9855; FRA; DA. 1980; NO 456; PP. 27-29Article

CAROT REVISITEDANDERSON MM; EINSCHLAG MB; JAASMA EG et al.1978; BELL LAB. REC.; USA; DA. 1978; VOL. 56; NO 3; PP. 71-75Article

PROCESS MONITORING AND EVALUATIONFINK RC; GILES WJ.1982; SOLID STATE TECHNOL.; ISSN 0038-111X; USA; DA. 1982; VOL. 25; NO 11; PP. 107-111Article

THE PHILOSOPHY OF MULTI-TYPE A.T.E.ATKINSON S.1980; NEW ELECTRON.; ISSN 0047-9624; GBR; DA. 1980; VOL. 13; NO 24; PP. 46-49; 2 P.Article

STATE-OF-THE ART SUPPLEMENT: ATE, TEST & MEASURING INSTRUMENTS.1977; NEW ELECTRON.; G.B.; DA. 1977; VOL. 10; NO 22; PP. 65-140 (40P.)Article

COMMENT AMELIORER LA "TESTABILITE" DES SOUS-ENSEMBLES LOGIQUES.BOTHIER G.1977; ELECTRON. APPL. INDUSTR.; FR.; DA. 1977; NO 240; PP. 75-78Article

SCHNELLES ELEKTRISCHES PRUEFEN VON GEDRUCKTEN LEITERPLATTEN. = CONTROLE ELECTRIQUE RAPIDE DES CIRCUITS IMPRIMESDEEGEN A; SCHOCH W; URBITSCH H et al.1976; V.D.I. BER.; DTSCH.; DA. 1976; NO 265; PP. 79-85Article

ADVANCES IN AUTOMATIC METER TESTINGFIDGETT J; MATHER G.1982; IEE CONF. PUBL.; ISSN 0537-9989; GBR; DA. 1982; NO 217; PP. 133-137; BIBL. 4 REF.Conference Paper

AN AUTOMATED MASK DEFECT INSPECTION SYSTEMTSUJIYAMA B; KURIHARA K; SAITO K et al.1982; REVIEW OF THE ELECTRICAL COMMUNICATION LABORATORIES; ISSN 508535; JPN; DA. 1982; VOL. 30; NO 6; PP. 1076-1085; BIBL. 4 REF.Article

PC BOARD MANUFACTURING AND ATEDEBOW D.1980; ELECTRON. PACKAG.; ISSN 0013-4945; USA; DA. 1980; VOL. 20; NO 9; PP. 89-94Article

TEST ET TESTABILITE. EMPLOI DU MATERIELBOTHIER G.1979; TECHNIQUES DE L'INGENIEUR; ELECTRONIQUE; FRA; PARIS: TECH. ING.; DA. 1979; NO E83; FICHE E3975; 19 P.; BIBL. 14 REF.Book Chapter

TERADYNE'S J259, J273, J283 ARE STILL GOING STRONG1980; EVAL. ENG.; ISSN 0014-3316; USA; DA. 1980; VOL. 19; NO 4; PP. 86-89Article

THE ELEMENTS INVOLVED IN AUTOMATIC TEST GENERATIONWOLSKI KT.1979; ELECTRON. PACKAG. PRODUCT.; USA; DA. 1979; VOL. 19; NO 4; PP. 115-121; (5 P.)Article

A VLSI-ATE SELECTION MATRIXHEALY J.1982; SOLID STATE TECHNOL.; ISSN 0038-111X; USA; DA. 1982; VOL. 25; NO 11; PP. 81-88Article

AUTOMATIC METER ACCURACY TESTING EQUIPMENTEATON B.1982; IEE CONF. PUBL.; ISSN 0537-9989; GBR; DA. 1982; NO 217; PP. 123-127Conference Paper

SA ATTACKS BOARD FAULTS WITHOUT EXTRA HARDWARENATRASEVSCHI A.1980; ELECTRON DES.; ISSN 0013-4872; USA; DA. 1980; VOL. 28; NO 21; PP. 191-195; BIBL. 5 REF.Article

RECHNERGESTUETZTE ERMITTLUNG VON TESTS ZUR FEHLERERKENNUNG UND-LOKALISIERUNG IN ELEKTRONISCHEN SCHALTUNGEN UND SYSTEMEN = EXECUTION D'ESSAIS ASSISTEE PAR ORDINATEUR POUR LA DETECTION ET LA LOCALISATION DE DERANGEMENTS DANS DES MONTAGNES ET SYSTEMES ELECTRONIQUESFRUEHAUF U; SLOWIG P.1980; NACHR.-TECH., ELEKTRON.; DDR; DA. 1980; VOL. 30; NO 4; PP. 144-146; ABS. RUS/ENG/FRE; BIBL. 31 REF.Article

WHAT TO LOOK FOR IN ANALOG/DIGITAL PC BOARD LISTERSAL ESSER.1979; ELECTRON. PACKAG. PRODUCT.; USA; DA. 1979; VOL. 19; NO 6; PP. 55-61; (4 P.)Article

TEST SYSTEMS FOR MICROPROCESSOR POPULATED PRINTED CIRCUIT BOARD.DUDKOWSKI SJ.1978; ELECTRON. PACKAG. PRODUCT.; U.S.A.; DA. 1978; VOL. 18; NO 2; PP. 59-69 (7P.)Article

MODULAR DESIGN SHRINKS TEST SYSTEM.1977; ELECTRONICS; U.S.A.; DA. 1977; VOL. 50; NO 2; PP. 119-120Article

FORTSCHRITTLICHE LEITERPLATTENPRUEFUNG DURCH AUTOMATISCHES TESTSYSTEM. = PROGRES DES ESSAIS DES CIRCUITS IMPRIMES AU MOYEN DES SYSTEMES D'ESSAIS AUTOMATIQUESSACHSE G.1977; MESSEN U. PRUEFEN; DTSCH.; DA. 1977; NO 11; PP. 720-758 (3P.); BIBL. 14 REF.Article

CLEANING PCBS FOR AUTOMATIC TESTING.CLEMENTSON JJ.1976; ELECTRON. ENGNG; G.B.; DA. 1976; VOL. 48; NO 584; PP. 53-55Article

THE COMPUTER-AIDED APPROACH TO SUSCEPTIBILITY TESTINGAUDONE B; GERBI G.1980; IEEE TRANS. ELECTROMAGN. COMPAT.; ISSN 0018-9375; USA; DA. 1980; VOL. 22; NO 2; PP. 130-135; BIBL. 8 REF.Article

EE'S EXCLUSIVE REFERENCE/GUIDE. LARGE ATE SYSTEMS.1977; EVAL. ENGNG; U.S.A.; DA. 1977; VOL. 16; NO 3; PP. 10-23 (8P.)Article

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