Proceedings/6th. Symposium on applied surface analysis, Dayton OH, 6-8 June 1984 = Communications/ 6ème Symposium sur l'analyse de surface appliquée, Dayton OH, 6-8 juin 1984GRANT, J. T; MURDAY, J. S.Applications of surface science. 1985, Vol 21, Num 1-4, issn 0378-5963, X-322 pConference Proceedings

APPLICATION OF PHOTOACOUSTIC SPECTROSCOPY TO METAL SURFACECHIBA A.1979; KINZOKU HYOMEN GIJUTSU; ISSN 0026-0614; JPN; DA. 1979; VOL. 30; NO 11; PP. 576-583; BIBL. 49 REF.Article

THE APPLICATION OF SURFACE ANALYTICAL TECHNIQUES TO THIN FILMS AND SURFACE COATINGS = APPLICATION DES METHODES D'ANALYSE DE SURFACE A L'ANALYSE DE COUCHES MINCES ET DE REVETEMENTS SUPERFICIELSWALLS JM.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 80; NO 1-3; PP. 213-220; BIBL. 28 REF.Conference Paper

TRACE DETECTION IN SURFACE MICROANALYSIS = DETECTION DE TRACES EN MICROANALYSE DE SURFACELANDRON C.1981; VACUUM; ISSN 0042-207X; GBR; DA. 1981; VOL. 31; NO 7; PP. 291-295; BIBL. 23 REF.Article

L'IMPIANTO IONICO IN METALLURGIA: RICHERCHE, APPLICAZIONI, PROSPETTIVE = ION IMPLANTATION IN METALLURGY: RESEARCHES, APPLICATIONS AND PROSPECTIVE = L'IMPLANTATION D'IONS EN METALLURGIE: RECHERCHES, APPLICATIONS, PROSPECTIVELO RUSSO S.1981; FIS. TECNOL.; ISSN 0391-9757; ITA; DA. 1981; VOL. 4; NO 4; PP. 245-264; H.T. 1; BIBL. 37 REF.Article

THE INFLUENCE OF ION SPUTTERING ON THE ELEMENTAL ANALYSIS OF SOLID SURFACES = INFLUENCE DU BOMBARDEMENT IONIQUE SUR L'ANALYSE ELEMENTAIRE DE SURFACES SOLIDESCOBURN JW.1979; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1979; VOL. 64; NO 3; PP. 371-382; BIBL. 179 REF.Conference Paper

APPLICATION OF NEW SURFACE ANALYSIS FOR THE ULTRA THRIN FILMS ON METAL SURFACEMAEDA S.1980; KINZOKU HYOMEN GIJUTSU; ISSN 0026-0614; JPN; DA. 1980; VOL. 31; NO 8; PP. 402-407; BIBL. 65 REF.Article

Werkstoffcharakterisierung mittels SIMS: Neue Moeglichkeiten der Spuren-, Mikrobereichs- und Oberflaechenanalayse = Caractérisation des matériaux par SIMS; nouvelles possibilités de l'analyse des traces, de la microanalyse, et de l'analyse de surface = Characterization of materials by SIMS: new possibilities of trace, micro and surface analysisGRASSERBAUER, M; STINGEDER, G; PIMMINGER, M et al.Fresenius' Zeitschrift für analytische Chemie. 1983, Vol 315, Num 7, pp 575-590, issn 0016-1152Article

The influence of radiation damage (microscopic causes) on the sensitivity of Auger electron spectroscopy and X-ray photoelectron spectroscopy = Influence de l'endommagement par rayonnement sur la sensibilité de la spectroscopie Auger et de la spectroscopie photoélectroniqueCAZAUX, J.Applications of surface science. 1985, Vol 20, Num 4, pp 457-471, issn 0378-5963Article

Verfahren zur Bestimmung von Kohlenstoff auf Stahloberflaechen = Method for the determination of carbon on steel surfacesKRETSCHMER, M; KOCH, K.H; GRUNENBERG, D et al.Stahl und Eisen (1881). 1984, Vol 104, Num 4, pp 193-195, issn 0340-4803Article

Quantification of hydrogen in surfaces and thin films using a non-destructive forward scattering technique = Quantification de l'hydrogène dans les surfaces et les couches minces, au moyen d'une méthode non destructive de diffusion avantBARDIN, T. T; PRONKO, J. G; JOSHI, A et al.Thin solid films. 1984, Vol 119, Num 4, pp 429-438, issn 0040-6090Conference Paper

Characterization and control of steel surfaces. Pt. 2:Analysis. Quantiative analysis and chemical state analysis using AESHOMMA, T.Transactions of the Iron and Steel institute of Japan. 1984, Vol 24, Num 8, pp 667-669, issn 0021-1583Article

Proceedings/5th. Symposium on applied surface analysis, Dayton, OH, 8-10 June 1983 = Comptes-rendus/5ème congrès sur l'analyse de surface appliquée, Dayton, OH, 8-10 juin 1983GRANT, J. T; MURDAY, J. S.Applications of surface science. 1984, Vol 18, Num 1-2, pp 1-231, issn 0378-5963Conference Proceedings

SURFACE ANALYSIS USING GLOW DISCHARGE SPECTROMETRY = ANALYSE DES SURFACES PAR SPECTROMETRIE A DECHARGE LUMINESCENTEHOCQUAUX H.1983; BULLETIN DU CERCLE D'ETUDES DES METAUX; ISSN 0366-4104; FRA; DA. 1983; VOL. 15; NO 1; PP. 4.1-4.9; BIBL. 7 REF.; IDEM FREConference Paper

LASER SURFACE ALLOYING FOR PASSIVATION OF TI-PD = FORMATION D'ALLIAGE SUPERFICIEL PAR LASER POUR LA PASSIVATION DE TI-PDDRAPER CW; MEYER LS; JACOBSON DC et al.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 75; NO 3; PP. 237-240; BIBL. 11 REF.Article

MICROSCOPES FOR THE METALLURGIST: PART TWO OF OUR SURVEY OF OPTICAL AND ELECTRON EQUIPMENT = MICROSCOPES POUR LE METALLURGISTE. DEUXIEME PARTIE SUR LA VUE D'ENSEMBLE DE L'EQUIPEMENT OPTIQUE ET ELECTRONIQUEHEBBERT RA.1980; MET. MATER.; ISSN 0026-0940; GBR; DA. 1980-06; PP. 53-58; 2 P.Article

HYDROGEN DISTRIBUTION IN TITANIUM ALLOYS BY LOCAL SPECTROGRAPHIC ANALYSISBORASHEVA TV.1980; ZH. FIZ. KHIM.; SUN; DA. 1980-11; VOL. 54; NO 11; PP. 2842-2845; BIBL. 7 REF.Conference Paper

UNTERSUCHUNG VON HETEROGEN-KATALYSATOREN MIT MODERNEN OBERFLAECHEN-ANALYSENMETHODEN = STUDY OF HETEROGENEOUS CATALYSTS BY MODERN SURFACE ANALYSIS METHODSMROSS WD; KRONENBITTER J.1982; CHEM.-ING.-TECH.; DEU; DA. 1982-01; VOL. 54; NO 1; PP. 33-40; BIBL. 42 REF.Conference Paper

QUANTITATIVE SURFACE ANALYSIS OF COPPER-NICKEL ALLOYS BY SECONDARY ION MASS SPECTROMETRY = ANALYSE QUANTITATIVE DE SURFACE DES ALLIAGES CUIVRE-NICKEL PAR SPECTROMETRIE DE MASSE D'ION SECONDAIREFUKUDA Y; HONDA F; RABALAIS JW et al.1980; ANAL. CHEM. (WASH.); ISSN 0003-2700; USA; DA. 1980; VOL. 52; NO 13; PP. 2213-2214; BIBL. 19 REF.Article

CONVERSION ELECTRON MOESSBAUER SPECTROSCOPIC STUDIES ON THE CHEMICAL STATES OF SURFACE LAYERS OF CORRODED TIN PLATES AND TIN-COATED IRON PLATESKATO A; ENDO K; SANO H et al.1980; BUNSEKI KAGAKU; ISSN 0525-1931; JPN; DA. 1980; VOL. 29; NO 10; PP. 708-713; ABS. ENG; BIBL. 6 REF.Article

NUCLEAR-PHYSICAL METHOD OF HYDROGEN ANALYSIS IN SURFACE LAYERS OF MATERIALSIVASHINA YU K; IVASHINA GA; NEMCHENKO VF et al.1980; ZH. FIZ. KHIM.; SUN; DA. 1980-11; VOL. 54; NO 11; PP. 2827-2830; BIBL. 11 REF.Conference Paper

ETUDE PAR SPECTROMETRIE DE PHOTOELECTRONS DE LA COUCHE SUPERFICIELLE D'EPROUVETTES DE FER PUR ET D'ACIER TRAITEES PAR ELECTRO-USINAGE = INVESTIGATION BY PHOTOELECTRON SPECTROMETRY OF THE SURFACE LAYER OF PURE IRON AND STEEL SAMPLES ELECTROCHEMICALLY MACHINEDFONTAINE REMY; FEVE LUCETTE.1980; ; FRA; DA. 1980; DGRST-78 7 2216; (12) P.-PL.; 30 CM; BIBL. 8 REF.; ACTION CONCERTEE: MECANIQUEReport

CALIBRATION OF A JUMPING BEAM EVAPORATOR BY QUANTITATIVE ESCA MEASUREMENTS.POLASCHEGG HD; SNAITH JC.1976; J. MICR. SPECTROSC. ELECTRON.; FR.; DA. 1976; VOL. 1; NO 1; PP. 53-62; BIBL. 13 REF.Article

SIMULTANEOUS BULK AND SURFACE MICROANALYSIS BY ELECTRON SPECTROSCOPY = MICROANALYSE SIMULTANEE EN VOLUME ET EN SURFACE PAR SPECTROSCOPIE ELECTRONIQUECAZAUX J; MOUZE D; PERRIN J et al.1981; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1981; VOL. 38; NO 12; PP. 1021-1023; BIBL. 13 REF.Article

METHODOLOGY FOR EVALUATING INTEGRAL GAUSSIAN PROFILES = METHODOLOGIE POUR L'EVALUATION DES PROFILS GAUSSIENS INTEGRAUXCAMPBELL AB III.1980; U.S. DEPT INTER., BUR. MINES, INFORM. CIRC.; USA; DA. 1980; NO 8811; PP. 1-18; BIBL. 16 REF.Serial Issue