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Correction for extraneous background in X-ray microanalysis of cell culturesVON EULER, A; WROBLEWSKI, R; ROOMANS, G. M et al.Scanning microscopy. 1992, Vol 6, Num 2, pp 451-456, issn 0891-7035Article

Computer simulation of single-crystal patterns = Rechnersimulation von EinkristallmusternBATOVA, D.E; IVANOV, V.I; KOPYL, A.V et al.Zavodskaâ laboratoriâ. 1984, Vol 50, Num 6, pp 584-588, issn 0321-4265Article

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ESTIMATION OF THE COMPOSITION OF ALLOY PHASES BY LOCAL X-RAY ANALYSISLANDYSHEV AV; SELIVERSTENKO SI; SHVANGIRADZE RR et al.1983; ZURNAL ANALITICESKOJ HIMII; ISSN 0044-4502; SUN; DA. 1983; VOL. 38; NO 5; PP. 917-921; ABS. ENG; BIBL. 6 REF.Article

ROENTGENOGRAPHISCHE EIGENSPANNUNGSMESSUNGEN AN ALUMINIUMWERKSTOFFEN (1) = MEASUREMENT OF RESIDUAL STRESSES IN ALUMINIUM ALLOY PRODUCTS BY X-RAY DIFFRACTION METHODS (1)FURRER P; KOUTNY M.1980; ALUMINIUM (DUESSELD.); DEU; DA. 1980-02; VOL. 56; NO 2; PP. 139-142; BIBL. 16 REF.Article

Determination of the qualitative phase composition of a ceramic by X-ray phase analysisDYATLOVA, E. M; BOBKOVA, N. M; YURKEVICH, T. N et al.Glass and ceramics. 1992, Vol 49, Num 9-10, pp 435-437, issn 0361-7610Article

Sucrose solutions as prospective medium to study the vesicle structure: SAXS and SANS studyKISELEV, M. A; LESIEUR, P; KISSELEV, A. M et al.Journal of alloys and compounds. 2001, Vol 328, Num 1-2, pp 71-76, issn 0925-8388Conference Paper

An analysis of semiconductor package by X-ray CT instrumentTAKADO, Tsumoru; ARITA, Hiroshi; OHNO, Yasuhide et al.SPIE proceedings series. 2000, pp 128-133, isbn 0-930815-62-9Conference Paper

High-temperature camera for in situ examination of semiconductor crystals by X-ray topographySMOLSKIJ, I.L; DILBARYAN, G.A; ROZHANSKIJ, V.N et al.Zavodskaâ laboratoriâ. 1984, Vol 50, Num 5, pp 465-467, issn 0321-4265Article

Interactive Laue pattern processingSHULAKOV, E.V.Zavodskaâ laboratoriâ. 1984, Vol 50, Num 6, pp 580-583, issn 0321-4265Article

Interactive processing and interpretation of oscillation patternsIVANOV, V.I; SHEKHTMAN, V.S.Zavodskaâ laboratoriâ. 1984, Vol 50, Num 6, pp 577-580, issn 0321-4265Article

Inspecting food products using X-ray technologyBLOOMFIELD, K.Cereal foods world. 2001, Vol 46, Num 4, pp 156-158, issn 0146-6283Article

Recent developments in the application of X-ray microanalysis to the study of food systems. DiscussionBROOKER, B. E; MANNING, D; ROOMANS, G. M et al.Food structure. 1991, Vol 10, Num 2, pp 145-152, issn 1046-705XArticle

Fortschritte in der Roentgenspektrometrie leichter Elemente = Advancements in the X-ray spectrometry of light elementsAluminium (Düsseldorf). 1984, Vol 60, Num 9, issn 0002-6689, 649Article

Rapid technique for detecting and correcting signal variation during microanalysisMEDLIN, D. L; HOWITT, D. G.Ultramicroscopy. 1993, Vol 48, Num 1-2, pp 93-96, issn 0304-3991Article

Analysis of raw materials for iron and steel with X-ray computed tomographic scannerTAGUCHI, I; TANAKA, K.Tetsu-to-hagané. 1986, Vol 72, Num 10, pp 1629-1636, issn 0021-1575Article

Das Rasterelektronenmikroskop im Dienste der Qualitaetssicherung = The use of the scanning electron microscope in the field of quality assuranceSCHULTE, H; KRIEGER, D.MTZ. Motortechnische Zeitschrift. 1985, Vol 46, Num 1, pp 21-27, issn 0024-8525Article

Stand und Entwicklungstendenzen der Automatisierung der Roentgenpulverdiffraktometrie = Position and tendencies of development of the automatical powder diffractometryHEROLD, A.Freiberger Forschungshefte. Reihe B. 1984, Vol 243, pp 7-10, issn 0071-9420Article

Direct X-ray measurement of residual strains in textured steel = Mesure directe par rayons X des contraintes résiduelles dans l'acier texturéGAZZARA, C. P.Advances in x-ray analysis. 1984, Vol 27, pp 197-206, issn 0376-0308Conference Paper

Röntgenmikroanalytische Bestimmung von Implantiertem Stickstoff in Metallen = Détermination analytique par rayons X des ions azote implantés dans les métaux = XR-analysis determination of nitrogen ion implanted in metalsBEIER, W; BRUMMER, O; DRAKO, W. M et al.Experimentelle Technik der Physik. 1983, Vol 31, Num 2, pp 131-136, issn 0014-4924Article

A NEW METHOD FOR POWDER DIFFRACTION PHASE ANALYSIS = EIN NEUES VERFAHREN ZUR ROENTGENOGRAPHISCHEN PHASENANALYSE = UN NOUVEAU PROCEDE D'ANALYSE DE PHASE PAR RAYONS XFIALA J.1982; CRYST. RES. TECH.; DDR; DA. 1982-05; VOL. 17; NO 5; PP. 643-650; BIBL. 14 REF.Article

VYPOCET HODNOT, NUTNYCH PRO RENTGENOVOU KVANTITATIVNI FAZOVOU ANALYZU INTERMETALICKYCH FAZI, NITRIDU A OXIDU, VYSKYTUJICICH SE V OCELICH = CALCULATION OF THE VALUES NECESSARY FOR THE X-RAY QUANTITATIVE PHASE-ANALYSIS OF INTERMETALLIC PHASES, NITRIDES AND OXIDES EXISTING IN STEELSNEUMANN J; HEJDOVA H; CERMAK M et al.1981; KOVOVE MATER.; CSK; DA. 1981-12; VOL. 19; NO 6; PP. 741-748; BIBL. 9 REF.Article

HUTNICZE LABORATORIUM SPKETROMETRII RENTGENOWSKIEJ = LABORATORY OF THE X-RAY SPECTROMETRY AT THE STEELWORKS = LABORATOIRE DE SPECTROMETRIE DE RX DANS UNE USINE SIDERURGIQUEFERET F.1981; WIAD. HUT.; ISSN 0043-5139; POL; DA. 1981; VOL. 37; NO 3; PP. 89-94; ABS. RUS/ENGArticle