Surface Analysis 2000Surface and interface analysis. 2001, Vol 31, Num 5, pp 345-374, issn 0142-2421Conference Proceedings

AOFA 10: 10th Working Conference on Applied Surface Analysis, Kaiserslautern, 6-10 September 1998GNASER, Hubert.Fresenius' journal of analytical chemistry. 1999, Vol 365, Num 1-3, issn 0937-0633, 288 p.Conference Proceedings

Micro-thermal analysis of polyester coatingsFISCHER, Hartmut R.Applied surface science. 2010, Vol 256, Num 12, pp 3714-3717, issn 0169-4332, 4 p.Article

Enhanced detection of fluorescent nanospheres using two-channel radially polarized surface plasmon microscopySUNG, Chih-Hsiang; CHAUVAT, Dominique; ZYSS, Joseph et al.Optics letters. 2010, Vol 35, Num 17, pp 2873-2875, issn 0146-9592, 3 p.Article

Study of surface changes on industrial glasses with AFM, FE-SEM, EDX, SNMS and LM. Part 1. Glass skin and corrosionCHUN WANG; HÄFNER, Wolfgang; KRAUSCH, Georg et al.Glass science and technology (Frankfurt). 2004, Vol 77, Num 3, pp 103-110, issn 0946-7475, 8 p.Article

Une nouvelle méthode d'étude de surface: la decoration polymère = A new method of study of surface: the polymer decorationLOTZ, B; WITTMANN, J.-C.Journal de microscopie et de spectroscopie électroniques. 1985, Vol 10, Num 3, pp 209-218, issn 0395-9279Article

Paint testing: a survey of modern techniques. II: Surface and interface studiesBOXALL, J.Pigment & resin technology. 1985, Vol 14, Num 10, pp 4-6, issn 0369-9420Article

Oberflächenrauheit richtig messen. Teil 1: Beschreibung der gebräuchlichsten Kenngrössen = Correctly measuring surface roughness. Part 1 : Description of the most common parametersBARTELT, R.F & M. Feinwerktechnik, Mikrotechnik, Messtechnik. 1997, Vol 105, Num 7-8, pp 504-508, issn 0944-1018, 4 p.Article

Behavior of gallium secondary ion intensity in gallium focused ion beam secondary ion mass spectrometrySAKAMOTO, T; OWARI, M; NIHEI, Y et al.Japanese journal of applied physics. 1997, Vol 36, Num 3A, pp 1287-1291, issn 0021-4922, 1Article

Development of standards for Surface Analysis by ISO Technical Committee 201 on Surface Chemical AnalysisPOWELL, C. J; SHIMIZU, R.Surface and interface analysis. 1997, Vol 25, Num 11, pp 860-868, issn 0142-2421Article

Effets instrumentaux et normalisation des spectres = Instrumental effects and spectra normalisationLORANG, G.Le Vide (1995). 1996, Vol 52, Num 279, issn 1266-0167, 7, 34-43 [11 p.]Conference Paper

Oberflächenanalyse und metallographische Untersuchungen an Judet-prothesen = Analyse superficielle et études métallographiques sur les prothèses de Judet = Surface analysis and metallographic studies of Judet prosthesisHÄUSSLER, G; POLSTER, J.Zeitschrift für Orthopädie und ihre Grenzgebiete. 1985, Vol 123, Num 3, pp 283-284, issn 0044-3220Article

Status report on ASTM E-42 Committee on surface analysisHOLLOWAY, P. H.Journal of vacuum science and technology. A, vacuum, surfaces, and films. 1983, Vol 1, Num 3, pp 1570-1573Article

Electrochemical stability and surface analysis in evaluation fluoride effect on new bioalloy Ti₇Al₃V₂Mo₂Fe used in dentistryIONITA, D; PRODANA, M; DEMETRESCU, I et al.Materials and corrosion (1995). 2011, Vol 62, Num 12, pp 1111-1116, issn 0947-5117, 6 p.Article

Surface modification of plasticized PVC by dry cleaning methods: Consequences for artworksMUNOZ, C. Morales.Applied surface science. 2010, Vol 256, Num 11, pp 3567-3572, issn 0169-4332, 6 p.Article

Surface analysis of hydrophobicity of Thai silk treated by SF₆ plasmaSUANPOOT, P; KUESENG, K; ORTMANN, S et al.Surface & coatings technology. 2008, Vol 202, Num 22-23, pp 5543-5549, issn 0257-8972, 7 p.Conference Paper

Chemical derivatization technique in ToF-SIMS for quantification analysis of surface amine groupsTAE GEOL LEE; KIM, Jinmo; HYUN KYONG SHON et al.Applied surface science. 2006, Vol 252, Num 19, pp 6632-6635, issn 0169-4332, 4 p.Conference Paper

Surface Analysis '99GRANT, John T.Surface and interface analysis. 2000, Vol 29, Num 3, pp 177-220, issn 0142-2421Conference Proceedings

Espectroscopia fotoelectrónica de Rayos-X = X-ray photoelectronic spectroscopyMELLO CASTANHO, S. R.Boletín de la Sociedad Española de Cerámica y Vidrio. 1997, Vol 36, Num 4, pp 425-434, issn 0366-3175Article

Elemental mapping using an energy-filter-equipped TEM with application to magnetic materialsKIMOTO, K; USAMI, K; YAHISA, Y et al.Hitachi review. 1996, Vol 45, Num 1, pp 15-18, issn 0018-277XArticle

An X-ray photoelectron spectroscopy study on the surface film on carbon black anode in lithium secondary cellsTAKEI, K; KUMAI, K; KOBAYASHI, Y et al.Journal of power sources. 1995, Vol 54, Num 2, pp 171-174, issn 0378-7753Conference Paper

Correlation of insulator properties with electron spectroscopic observationsLE GRESSUS, C; BLAISE, G.Analytica chimica acta. 1994, Vol 297, Num 1-2, pp 139-152, issn 0003-2670Article

Tunneling microscope for operation in air or fluidsDRAKE, B; SONNENFELD, R; SCHNEIR, J et al.Review of scientific instruments. 1986, Vol 57, Num 3, pp 441-445, issn 0034-6748Article

Etude complexe de la formation de la surface polie d'un verreROGOV, V. V; OL'SHEVSKAYA, G. V; DENISENKO, A. P et al.Steklo i keramika. 1984, Num 9, pp 15-16, issn 0131-9582Article

Advances on surface structural determination by LEEDSOARES, Edmar A; DE CASTILHO, Caio M. C; DE CARVALHO, Vagner E et al.Journal of physics. Condensed matter (Print). 2011, Vol 23, Num 30, issn 0953-8984, 303001.1-303001.19Article