Hybrid analysis of micromachined silicon thin film based on digital microscopic holographyLEI XU; XIAOYUAN PENG; JIANMIN MIAO et al.SPIE proceedings series. 2004, pp 236-243, isbn 0-8194-5380-3, 8 p.Conference Paper

Three-dimensional dynamic environmental MEMS characterizationNOVAK, Erik.SPIE proceedings series. 2004, pp 1-8, isbn 0-8194-5380-3, 8 p.Conference Paper

Advanced photonic sensors and applications (Singapore, 30 November - 3 December 1999)Lieberman, Robert A; Asundi, Anand K; Asanuma, Hiroshi et al.SPIE proceedings series. 1999, isbn 0-8194-3499-X, XII, 776 p, isbn 0-8194-3499-XConference Proceedings

Makyoh topography: a simple yet powerful optical method for flatness and defect characterisation of mirror-like surfacesRIESZ, Ferenc.SPIE proceedings series. 2004, pp 86-100, isbn 0-8194-5380-3, 15 p.Conference Paper

Advanced photonic sensors and applications II (Singapore, 27-30 November 2001)Asundi, Anand K; Osten, Wolfgang; Varadan, Vijay K et al.SPIE proceedings series. 2001, isbn 0-8194-4326-3, XII, 360 p, isbn 0-8194-4326-3Conference Proceedings

Measurement of Two-Dimensional Crystal Shape Using Digital HolographyKHANAM, Taslima; RAJENDRAN, Arvind; KARIWALA, Vinay et al.Crystal growth & design. 2013, Vol 13, Num 9, pp 3969-3975, issn 1528-7483, 7 p.Article

Optical micro- and nanometrology in microsystems technology (5-7 April, 2006, Strasbourg, France)Gorecki, Christophe; Asundi, Anand K; Osten, Wolfgang et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6244-6, 1Vol, pagination multiple, isbn 0-8194-6244-6Conference Proceedings

Application of the vortex transform to microscopic interferometryPETITGRAND, Sylvain; BOSSEBOEUF, Alain; GUIRARDEL, Matthieu et al.SPIE proceedings series. 2004, pp 9-15, isbn 0-8194-5380-3, 7 p.Conference Paper

A miniaturized SNOM sensor based on the optical feedback inside the VCSEL cavityGORECKI, Christophe; HEINIS, Dominique.SPIE proceedings series. 2004, pp 183-187, isbn 0-8194-5380-3, 5 p.Conference Paper

Modified linear and circular carrier frequency Fourier transform method applied for studies of vibrating microelementsKACPERSKI, Jacek; KUJAWINSKA, Malgorzata; KREZEL, Jerzy et al.SPIE proceedings series. 2004, pp 287-298, isbn 0-8194-5380-3, 12 p.Conference Paper

Real-time shape measurement system including CG-outputMORIMOTO, Yoshiharu; FUJIGAKI, Motoharu; SAUGIER, Rodolphe et al.SPIE proceedings series. 2004, pp 117-128, isbn 0-8194-5380-3, 12 p.Conference Paper

Holographic interferometry deformations metrology by using AR modellingMOKDAD, Rabah; EL-HAFIDI, Idriss; MEYRUEIS, Patrick et al.SPIE proceedings series. 2004, pp 136-140, isbn 0-8194-5380-3, 5 p.Conference Paper

Evolutionary approach to an inverse problem in near-field optics microscopyBARCHIESI, Demetrio Macias; VIAL, Alexandre.SPIE proceedings series. 2004, pp 188-195, isbn 0-8194-5380-3, 8 p.Conference Paper

Systematic effects in coherence peak and phase evaluation of signals obtained with a vertical scanning white-light Mirau interferometerLEHMANN, Peter.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 618811.1-618811.11, issn 0277-786X, isbn 0-8194-6244-6, 1VolConference Paper

Analysis of static and dynamic operational behaviour of active micromembranesASWENDT, Petra; DEAN, Thierry.SPIE proceedings series. 2004, pp 25-33, isbn 0-8194-5380-3, 9 p.Conference Paper

Stroboscopic illumination and synchronous imaging for the characterization of MEMS vibrationsSERIO, B; HUNSINGER, J. J; CRETIN, B et al.SPIE proceedings series. 2004, pp 257-264, isbn 0-8194-5380-3, 8 p.Conference Paper

Microparticle characterization using digital holographyDARAKIS, Emmanouil; KHANAM, Taslima; RAJENDRAN, Arvind et al.Chemical engineering science. 2010, Vol 65, Num 2, pp 1037-1044, issn 0009-2509, 8 p.Article

Stress Measurement of thin wafer using Reflection Grating MethodCHI SENG NG; ASUNDI, Anand K.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7792, issn 0277-786X, isbn 978-0-8194-8288-4, 779210.1-779210.13Conference Paper

Strain and tilt measurement using multi-point diffraction strain sensorJUN WANG; WEI ZHOU; LIM, Lennie E. N et al.Optics and laser technology. 2008, Vol 40, Num 8, pp 1099-1103, issn 0030-3992, 5 p.Article

Accurate size measurement of needle-shaped particles using digital holographyKHANAM, Taslima; NURUR RAHMAN, Mohammad; RAJENDRAN, Arvind et al.Chemical engineering science. 2011, Vol 66, Num 12, pp 2699-2706, issn 0009-2509, 8 p.Article

Discussion of the finite element method in optical diffraction tomographyLOBERA, Julia; COUPLAND, Jeremy.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 61880I.1-61880I.9, issn 0277-786X, isbn 0-8194-6244-6, 1VolConference Paper

Nanometrology for MEMS : combination of optical interference, atomic force microscopy and nanoindentor-based actuatorJOBIN, Marc; PASSERAUB, Philippe; FOSCHIA, Raphael et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 61880T.1-61880T.8, issn 0277-786X, isbn 0-8194-6244-6, 1VolConference Paper

Real time measurement of microscopic surface shape using high speed cameras with continuously scanning interference microscopyMONTGOMERY, Paul; DRAMAN, Cemal; UHRING, Wilfried et al.SPIE proceedings series. 2004, pp 101-108, isbn 0-8194-5380-3, 8 p.Conference Paper

Study of the roughness and optical near field of mass surface by using a SNOM with shear-force regulationHAIDAR, Y; DE FORNEL, F; ZEROUKI, C et al.SPIE proceedings series. 2004, pp 171-182, isbn 0-8194-5380-3, 12 p.Conference Paper

Automated variable wavelength interferometry in reflected light modeLITWIN, D; GALAS, J; BLOCKI, N et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 61880F.1-61880F.8, issn 0277-786X, isbn 0-8194-6244-6, 1VolConference Paper