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Results 1 to 25 of 1688

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Negative ion yield and sputter yield variations for Cs+ bombardment of Si with O2 gas floodingFRANZREB, Klaus; WILLIAMS, Peter.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 129-133, issn 0142-2421, 5 p.Conference Paper

The isotopic comparative method (ICM) for SIMS quantification of boron in silicon up to 40 at.%DUBOIS, Christiane; PRUDON, Gilles; DUPUY, Jean-Claude et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 36-40, issn 0142-2421, 5 p.Conference Paper

Analysis of cluster ion sputtering yields: correlation with the thermal spike model and implications for static secondary ion mass spectrometrySEAH, M. P.Surface and interface analysis. 2007, Vol 39, Num 7, pp 634-643, issn 0142-2421, 10 p.Article

An application of cesium-xenon co-sputtering : quantitative study of a Pd-Rh thin film by ToF-SIMSBRISON, J; HUBERT, R; LUCAS, S et al.Surface and interface analysis. 2006, Vol 38, Num 12-13, pp 1654-1657, issn 0142-2421, 4 p.Conference Paper

Positron and electron backscattering from elemental solids in the 1-10 keV energy rangeCHAOUI, Z; BOUARISSA, N.Journal of physics. Condensed matter (Print). 2004, Vol 16, Num 6, pp 799-808, issn 0953-8984, 10 p.Article

Studies of an Fe3O4(1 1 1) surface by low-energy ion scatteringKIM-NGAN, N.-T. H; SOSZKA, W; KOZŁOWSKI, A et al.Journal of magnetism and magnetic materials. 2004, Vol 279, Num 1, pp 125-133, issn 0304-8853, 9 p.Article

Interactions of fast ions with carbon nanotubes: Two-fluid modelMOWBRAY, D. J; MISKOVIC, Z. L; GOODMAN, F. O et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 19, pp 195418.1-195418.7, issn 1098-0121, 1Article

Backscattering of 8-28 keV electrons from a thick tungsten targetYADAV, R. K; SRIVASTAVA, Argala; MONDAL, S et al.Journal of physics. D, Applied physics (Print). 2003, Vol 36, Num 20, pp 2538-2542, issn 0022-3727, 5 p.Article

Solvation of CH3NH2, CD3OD, and D2O molecules studied by temperature-programmed TOF-SIMSSOUDA, Ryutaro.Surface science. 2003, Vol 547, Num 3, pp 403-409, issn 0039-6028, 7 p.Article

Enhancement of cluster yield under gold dimer oblique bombardment of the silicon surfaceMEDVEDEVA, M; WOJCIECHOWSKI, I; GARRISON, B. J et al.Applied surface science. 2003, Vol 203-04, pp 148-151, issn 0169-4332, 4 p.Conference Paper

A microscopic view of organic sample sputteringDELCORTE, A; BERTRAND, P; GARRISON, B. J et al.Applied surface science. 2003, Vol 203-04, pp 166-169, issn 0169-4332, 4 p.Conference Paper

The energy spectra of secondary ions sputtered from Si and SiGe by ultra-low-energy primary ionsBELLINGHAM, J; DOWSETT, M. G.Applied surface science. 2003, Vol 203-04, pp 130-133, issn 0169-4332, 4 p.Conference Paper

Modeling of life deterioration by ion bombardment of a dispenser cathode coated with an Ir/W filmHIGUCHI, Toshiharu; YAMAMOTO, Shigehiko; KUDO, Hiroshi et al.Applied surface science. 2002, Vol 200, Num 1-4, pp 125-137, issn 0169-4332, 13 p.Article

Measurement of (P, P) elastic cross-sections for 14N and 27Al at laboratory angles of 178° AND 140° in the range 0.5 2.5 MeVPAUL, A; RAMOS, A. R. L; RIJNIERS, L et al.Materials science forum. 2002, pp 191-196, issn 0255-5476, isbn 0-87849-887-7Conference Paper

Experimental investigations of multiple weak shock waves induced by intense heavy ion beams in solid matterCONSTANTIN, C; DEWALD, E; TAUSCHWITZ, A et al.Laser and particle beams (Print). 2002, Vol 20, Num 3, pp 521-526, issn 0263-0346, 6 p.Conference Paper

Error performance analysis of artificial neural networks applied to Rutherford backscatteringVIEIRA, A; BARRADAS, N. P; JEYNES, C et al.Surface and interface analysis. 2001, Vol 31, Num 1, pp 35-38, issn 0142-2421Article

Test of the interatomic potential in the eV-region by glancing-angle scattering of He-atoms from Fe(0 0 1)DANAILOV, D. M; PFANDZELTER, R; IGEL, T et al.Applied surface science. 2001, Vol 171, Num 1-2, pp 113-119, issn 0169-4332Article

Strongly enhanced secondary ion emission by molecular ion irradiationYAMAMOTO, Hiroyuki; SAITO, Takeru; ASAOKA, Hidehito et al.Journal of trace and microprobe techniques. 2001, Vol 19, Num 4, pp 571-579, issn 0733-4680Article

Spin-polarized metastable deexcitation spectroscopy study of iron filmsYAMAUCHI, Y; KURAHASHI, M.Applied surface science. 2001, Vol 169-70, pp 236-240, issn 0169-4332Conference Paper

A new approach for effecting surface-induced dissociation in an ion cyclotron resonance mass spectrometer : A modeling studyDANELL, Ryan M; GLISH, Gary L.Journal of the American Society for Mass Spectrometry. 2000, Vol 11, Num 12, pp 1107-1117, issn 1044-0305Article

Formation of autoionizing Ne** in grazing collisions with an Al (111) surfaceGRIZZI, O; SANCHEZ, E. A; GAYONE, J. E et al.Surface science. 2000, Vol 469, Num 1, pp 71-79, issn 0039-6028Article

Energy loss of highly charged ions in distant collisions with microcapillary surfacesTÖKESI, K; BURGDÖRFER, J.Surface science. 2000, Vol 454-56, pp 1038-1041, issn 0039-6028Conference Paper


Energy and yield distributions of calcium atoms and clusters undergoing 4 keV Ar + -ion bombardmentHANSEN, C. S; CALAWAY, W. F; KING, B. V et al.Surface science. 1998, Vol 398, Num 1-2, pp 211-220, issn 0039-6028Article

Electronic excitation during low-energy Ne scattering from Mg and MgO(001)SOUDA, R; YAMAMOTO, K; HAYAMI, W et al.Surface science. 1998, Vol 416, Num 1-2, pp 320-325, issn 0039-6028Article

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