Computerized scanning Auger microprobeSOMMERER, T. J; HALE, E. B.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1985, Vol 3, Num 4, pp 1874-1880, issn 0734-2101Article

Development of a reference material and reference method to provide a calibration of the instrument intensity scale for differential AESSEAH, M. P; HUNT, C. P; TOSA, M et al.Journal of electron spectroscopy and related phenomena. 1993, Vol 61, Num 2, pp 149-171, issn 0368-2048Article

Interlaboratory tests of a composite reference sample to calibrate Auger electron spectrometers in the differential modeSEAH, M. P; HUNT, C. P; SYKES, D et al.Journal of electron spectroscopy and related phenomena. 1993, Vol 61, Num 2, pp 173-182, issn 0368-2048Article

Effects of chemical state on quantitative AES of metal-sulfur compoundsGRIFFIS, D. P; LINTON, R. W.Surface and interface analysis. 1984, Vol 6, Num 1, pp 15-20, issn 0142-2421Article

Application of Auger electron spectrometry to trace analysis: determination of less than 10 ppm sulfur in copperHOFMANN, S; FRECH, R.Analytical chemistry (Washington, DC). 1985, Vol 57, Num 3, pp 716-719, issn 0003-2700Article

Instrumental effects in quantitative Auger electron spectroscopyPEACOCK, D. C; PRUTTON, M; ROBERTS, R et al.Vacuum. 1984, Vol 34, Num 5, pp 497-507, issn 0042-207XArticle

Etude par spectroscopie Auger, de la composition de la couche superficielle des catalyseurs du système rhodium-ruthéniumGRISHINA, T. M.Žurnal fizičeskoj himii. 1984, Vol 58, Num 8, pp 1984-1988, issn 0044-4537Article

Instrumental considerations for acquiring quantitative Auger electron spectraSMITH, M. A.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1991, Vol 9, Num 4, pp 2309-2314, issn 0734-2101Article

A modified sample introduction system for the Perkin-Elmer 545 scanning Auger microprobePOTTER, T. J; BAIRD, R. J.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1988, Vol 6, Num 4, pp 2574-2575, issn 0734-2101Article

Two-grid Auger-low energy electron diffraction systemNAMBA, Y; MORI, T.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1986, Vol 4, Num 4, pp 1884-1887, issn 0734-2101Article

Inexpensive and high-precision digital power supply and counting interface for UPS, XPS, and Auger spectrometersLICHTENBERGER, D. L; KELLOGG, G. E; KRISTOFZSKI, J. G et al.Review of scientific instruments. 1986, Vol 57, Num 9, issn 0034-6748, 2366Article

Beam brightness modulation (BBM) method as applied to Auger electron spectroscopyMOGAMI, A.Surface and interface analysis. 1985, Vol 7, Num 5, pp 241-251, issn 0142-2421Article

Origin of L-satellites in the rare earths = Origine des satellites L dans les lanthanidesSHRIVASTAVA, B. D; MISHRA, A.Acta physica Polonica. A. 1985, Vol 67, Num 6, pp 1153-1157, issn 0587-4246Article

Surface oxidation study of Fe₆₇Co₁₈B₁₄Si₁ metallic glass using Auger electron spectroscopy = Etude de l'oxydation superficielle de Fe₆₇Co₁₈B₁₄Si₁ (verre métallique) en utilisant la spectrométrie AugerKARVE, P. P; KULKARNI, S. K; NIGAVEKAR, A. S et al.Solid state communications. 1984, Vol 49, Num 7, pp 719-722, issn 0038-1098Article

Caractérisation de MOS par des techniques d'analyse de surface en ultra-vide au cours de leur élaboration in situ = MOS characterization by ultravacuum surface analysis techniques during their preparation in situDUPUY, J. C; VILOTITCH, B; SIBAI, A et al.Revue de physique appliquée. 1984, Vol 19, Num 12, pp 965-970, issn 0035-1687Article

Spectrométrie d'électrons secondaires lents à miroir cylindriqueKRACHINO, T. V; BELOV, V. D.Žurnal tehničeskoj fiziki. 1983, Vol 53, Num 10, pp 2067-2070, issn 0044-4642Article

Auger-electron spectra formation under solid surface bombardment by diatomic molecular beamsFERLEGER, V. K; MATVEEV, V. I.Vacuum. 1991, Vol 42, Num 14, pp 871-875, issn 0042-207XArticle

A matched filter technique for Auger depth profile sensitivity enhancementSCHWARZ, S. A; YOON, H. W.Applied surface science. 1988, Vol 31, Num 2, pp 189-196, issn 0169-4332Article

Auger analyzer translation using ball bushingsREUTER, M. C; TROMP, R. M.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1988, Vol 6, Num 4, pp 2575-2576, issn 0734-2101Article

An Auger electron spectroscopic study of the reaction of ammonia with Fe(110)BHATTACHARYA, A. K; CHESTERS, M. A.Journal of catalysis (Print). 1987, Vol 108, Num 2, pp 484-486, issn 0021-9517Article

Interpretation of the Auger Electron Spectra (AES) of sulfide minerals = Interprétation des spectres d'électrons Auger des minéraux sulfurésVAUGHAN, D. J; TOSSELL, J. A.Physics and chemistry of minerals. 1986, Vol 13, Num 5, pp 347-350, issn 0342-1791Article

Improved accuracy in concentration profile determination by means of Auger electron spectroscopySMITH, J. F; SOUTHWORTH, H. N.Surface technology. 1984, Vol 21, Num 1, pp 97-99, issn 0376-4583Article

Analyseur énergétique d'électrons Auger à base d'un miroir cylindrique à focalisation «anneau-axe»KRACHINO, T. V; BELOV, V. D.Žurnal tehničeskoj fiziki. 1983, Vol 53, Num 10, pp 2059-2066, issn 0044-4642Article

Quantitative analysis of iron nitrides (γ'-Fe₄N and ε-Fe_2-3N) using Auger electron spectroscopySTRYDOM, I. L. R; WELLS, A.Surface science. 1986, Vol 173, Num 1, pp 245-263, issn 0039-6028Article

Detection limits in Auger electron spectroscopyCAZAUX, J.Surface science. 1984, Vol 140, Num 1, pp 85-100, issn 0039-6028Article